Row redundancy with distributed sectors
View Patent ↗A semiconductor device comprises an embedded flash memory with row redundancy. The embedded flash memory comprises a memory bank that includes multiple physical sectors, where each physical sector comprises a plurality of erase sectors. In the memory bank, multiple portions of an additional erase sector are respectively distributed among the multiple physical sectors. The multiple portions of the additional erase sector are configured as a row-redundancy sector for the memory bank.
1. A semiconductor device comprising:
an embedded flash memory comprising a memory bank that includes multiple physical sectors, wherein each physical sector comprises a plurality of erase sectors, and wherein:
multiple portions of an additional erase sector are respectively distributed among the multiple physical sectors; and
the multiple portions of the additional erase sector are configured as a row-redundancy sector for the memory bank.
2. The semiconductor device of claim 1 , wherein:
the memory bank includes a defective erase sector; and
the multiple portions of the additional erase sector are configured to replace the defective erase sector within the memory bank.
3. The semiconductor device of claim 2 , wherein the embedded flash memory is configured to access the multiple portions of the additional erase sector, instead of the defective erase sector, during a memory operation on the memory bank.
4. The semiconductor device of claim 3 , wherein the memory operation is a read operation or a program operation.
5. The semiconductor device of claim 3 , wherein the memory operation is an erase operation that is performed serially on the multiple physical sectors to erase each of the multiple portions of the additional erase sector.
6. The semiconductor device of claim 3 , wherein the memory operation is an erase operation that is performed in parallel on the multiple physical sectors to erase each of the multiple portions of the additional erase sector.
7. THE semiconductor device of claim 2 , wherein the defective erase sector is determined during a sort flow operation on the embedded flash memory.
8. The semiconductor device of claim 1 , wherein the semiconductor device comprises:
first word lines (WLs) coupled to first memory cells in the multiple physical sectors; and
second WLs distributed among the multiple physical sectors in addition to the first WLs,
wherein the second WLs are coupled to second memory cells in the multiple portions of the additional erase sector.
9. The semiconductor device of claim 1 , wherein in addition to the multiple physical sectors, the memory bank comprises one or more physical sectors that do not include a portion of the additional erase sector.
10. A system comprising:
a microcontroller unit; and
a flash memory embedded within the microcontroller unit, the flash memory comprising
a memory bank that includes multiple physical sectors, wherein each physical sector comprises a plurality of erase sectors, and wherein:
multiple portions of an additional erase sector are respectively distributed among the multiple physical sectors; and
the multiple portions of the additional erase sector are configured as a row-redundancy sector for the memory bank.
11. The system of claim 10 , wherein:
the memory bank includes a defective erase sector; and
the multiple portions of the additional erase sector are configured to replace the defective erase sector within the memory bank.
12. The system of claim 11 , wherein the flash memory is configured to access the multiple portions of the additional erase sector, instead of the defective erase sector, during a memory operation on the memory bank.
13. The system of claim 12 , wherein the memory operation is a read operation or a program operation.
14. The system of claim 12 , wherein the memory operation is an erase operation that is performed serially on the multiple physical sectors to erase each of the multiple portions of the additional erase sector.
15. The system of claim 12 , wherein the memory operation is an erase operation that is performed in parallel on the multiple physical sectors to erase each of the multiple portions of the additional erase sector.
16. A method of configuring embedded flash memory with row redundancy, the method comprising:
providing first word lines (WLs) disposed in multiple physical sectors of a memory bank in the embedded flash memory, wherein each physical sector comprises a plurality of erase sectors; and
providing second WLs disposed within the multiple physical sectors in addition to the first WLs, wherein the second WLs are coupled to multiple portions of an additional erase sector that are respectively distributed among the multiple physical sectors, and wherein the additional erase sector is configured as a row-redundancy sector for the memory bank.
17. The method of claim 16 , further comprising:
determining that the memory bank includes a defective erase sector; and
configuring the embedded flash memory to replace the defective erase sector with the multiple portions of the additional erase sector in the memory bank.
18. The method of claim 17 , further comprising configuring the embedded flash memory for a memory operation that is to access the multiple portions of the additional erase sector instead of the defective erase sector.
19. The method of claim 18 , wherein the memory operation is a read operation or a program operation.
20. The method of claim 17 , further comprising configuring the embedded flash memory for an erase operation that is to be performed serially on the multiple physical sectors to erase each of the multiple portions of the additional erase sector.