IP Library Granted Patent US 10,971,541
Granted Patent B2
US 10,971,541 · App. 15/851,528 · Granted Apr 6, 2021

Detector architecture using photodetector arrays on thinned substrates

Inventors: Rick E. Colbeth (San Jose, CA); Ivan P. Mollov (San Jose, CA)
Assignee: Varex Imaging Corporation
H01L27/14663G01T1/2018H01L24/16H01L24/48H01L24/73H01L27/1469H01L27/14634H01L27/14636H01L27/14687H01L31/1892H01L27/14661H01L2224/16145H01L2224/48091H01L2224/48137H01L2224/73207H01L2224/73257H01L2924/00014
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,971,541
App. No.
15/851,528
Granted
Apr 6, 2021
Kind
B2
Abstract

Some embodiments include a method, comprising: attaching a carrier substrate to a side of at least one semiconductor substrate, the at least one semiconductor substrate including photodetectors on the side; thinning the at least one semiconductor substrate while the at least one semiconductor substrate is attached to the carrier substrate; attaching an optical substrate to the at least one semiconductor substrate while the at least one semiconductor substrate is attached to the carrier substrate; and removing the carrier substrate from the at least one semiconductor substrate.

Claims (43)

1. A method, comprising:

attaching a carrier substrate to a side of at least one semiconductor substrate, the at least one semiconductor substrate including photodetectors on the side;

thinning the at least one semiconductor substrate while the at least one semiconductor substrate is attached to the carrier substrate;

attaching an optical substrate to the at least one semiconductor substrate while the at least one semiconductor substrate is attached to the carrier substrate;

removing the carrier substrate from the at least one semiconductor substrate; and

attaching at least one semiconductor device to the side of the at least one semiconductor substrate after removing the carrier substrate from the at least one semiconductor substrate.

2. The method of claim 1 , wherein the optical substrate includes a fiber optic plate.

3. The method of claim 1 , further comprising removing one of the at least one semiconductor device from the side of the at least one semiconductor substrate.

4. The method of claim 1 , wherein the semiconductor device includes a circuit configured to receive a signal from at least one of the photodetectors.

5. The method of claim 1 , wherein attaching the at least one semiconductor device to the side of the at least one semiconductor substrate comprises attaching a plurality of separate semiconductor chips to the at least one semiconductor substrate after removing the carrier substrate from the semiconductor substrate.

6. The method of claim 1 , further comprising attaching a scintillator to the optical substrate.

7. The method of claim 1 , wherein thinning the at least one semiconductor substrate comprises thinning the at least one semiconductor substrate to a thickness less than 30 μm.

8. The method of claim 1 , wherein:

the at least one semiconductor substrate comprises a plurality of semiconductor substrates;

attaching the carrier substrate comprises attaching the carrier substrate to a side of each of the semiconductor substrates; and

attaching an optical substrate comprises attaching the optical substrate to the semiconductor substrates while the semiconductor substrates are attached to the carrier substrate.

9. A computer readable medium having instructions stored thereon adapted to perform the method of claim 1 .

10. A system, comprising:

a semiconductor substrate including a plurality of pads and a plurality of photodetectors coupled to the pads on a first side of the semiconductor substrate;

an optical substrate attached to a second side of the semiconductor substrate opposite to the first side; and

a plurality of separate semiconductor chips separately attached to the pads of the semiconductor substrate.

11. The system of claim 10 , wherein the optical substrate includes a fiber optic plate.

12. The system of claim 10 , further comprising a scintillator attached to the optical substrate.

13. The system of claim 10 , wherein at least one of the separate semiconductor chips includes circuitry configured to receive a signal from at least one of the photodetectors.

14. The system of claim 10 , wherein the semiconductor substrate has a thickness less than 30 μm.

15. The system of claim 10 , wherein an optical transmittance through the semiconductor substrate to the photodetectors is greater than 50%.

16. The system of claim 10 , wherein:

the semiconductor substrate is a first semiconductor substrate of a plurality of semiconductor substrates;

a second semiconductor substrate of the plurality of semiconductor substrates includes a plurality of pads and a plurality of photodetectors coupled to the pads on a first side of the second semiconductor substrate; and

the optical substrate is attached to a second side of the second semiconductor substrate opposite to the first side of the second semiconductor substrate.

17. The system of claim 10 , wherein the second side of the semiconductor substrate is planar.

18. The system of claim 10 , wherein:

the semiconductor chips are referred to as first semiconductor chips; and

the system further comprises a second semiconductor chip attached to the optical substrate and electrically connected to at least one of the semiconductor substrate and the first semiconductor chips.

19. A system, comprising:

means for detecting incident illumination;

means for supporting the means for detecting incident illumination and for optically affecting the incident illumination;

a plurality of means for processing the detected incident illumination; and

a plurality of means for electrically connecting the means for detecting incident illumination to the plurality of means for processing the detected incident illumination;

wherein each of the plurality of means for processing the detected incident illumination is separately attached to the means for detecting the incident illumination.

20. The system of claim 10 , further comprising:

a plurality of vias formed in the semiconductor substrate;

wherein the photodetectors are coupled to the pads of the semiconductor substrate and to the separate semiconductor chips through the vias.

Assignments (7)
SECURITY INTEREST Recorded Mar 13, 2026
From: VAREX IMAGING CORPORATION
To: ZIONS BANCORPORATION, N.A. DBA ZIONS FIRST NATIONAL BANK
Reel/Frame 075080/0934 →
RELEASE OF SECURITY INTEREST Recorded Mar 13, 2026
From: ZIONS BANCORPORATION, N.A. DBA ZIONS FIRST NATIONAL BANK
To: VAREX IMAGING CORPORATION
Reel/Frame 075081/0623 →
RELEASE OF SECURITY INTEREST Recorded Mar 29, 2024
From: BANK OF AMERICA, N.A.
To: VAREX IMAGING CORPORATION
Reel/Frame 066950/0001 →
SECURITY INTEREST Recorded Mar 29, 2024
From: VAREX IMAGING CORPORATION
To: ZIONS BANCORPORATION, N.A. DBA ZIONS FIRST NATIONAL BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 066949/0657 →
SECURITY INTEREST Recorded Oct 1, 2020
From: VAREX IMAGING CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS AGENT
Reel/Frame 054240/0123 →
SECURITY INTEREST Recorded Sep 30, 2020
From: VAREX IMAGING CORPORATION
To: BANK OF AMERICA, N.A., AS AGENT
Reel/Frame 053945/0137 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2018
From: COLBETH, RICK E, MR.; MOLLOV, IVAN P, MR.
To: VAREX IMAGING CORPORATION
Reel/Frame 044552/0752 →
Continuity (1)
Related Publication 20190198556A1 · Jun 27, 2019