IP Library › Granted Patent US 10,534,017

Granted Patent B2

US 10,534,017 · App. 15/852,219 · Granted Jan 14, 2020

Quick change small footprint testing system and method of use

Inventors: Lynwood Adams (Rockwall, TX); Jack Lewis (Royse City, TX)

Assignee: MODUS TEST, LLC

G01R1/07328 G01R1/0466 G01R1/07314 G01R31/2879 G01R31/2886 G01R31/2889 G01R31/2896

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Quick Facts

Patent No.: US 10,534,017
App. No.: 15/852,219
Granted: Jan 14, 2020
Kind: B2

External Links

USPTO Patent Center↗ Full Patent PDF↗

Abstract

A testing system for semiconductor chips having a removable device under test printed circuit board (DUT PCB) that electrically connects with the electrical testing components of the system. A removable top plate is placed on top of the DUT PCB and is locked in place by a plurality of locking posts that selectively connect to cam surfaces in the top plate that pull the top plate down sandwiching the DUT PCB between the top plate and the electrical testing components of the system. The DUT PCB is quickly and easily removed and replaced by moving the locking posts between an engaged position and a disengaged position. In this way, a single testing system can be used to test a great variety of semiconductor chips thereby reducing capital equipment costs and space needed in cleanrooms.

Claims (63)

1. A testing system, comprising:

a frame member;

the frame member extending a length from a first side to a second side;

the frame member extending a depth from first end to a second end;

a plurality of locking posts operably connected to the frame member;

wherein the plurality of locking posts are configured to rotate between a disengaged position and an engaged position;

a printed circuit board (PCB);

the PCB having an upper surface and a lower surface;

a plurality of electrical contacts positioned in the lower surface of the PCB;

a top plate;

the top plate having a plurality of cam members;

wherein the plurality of cam members are configured to receive the plurality of locking posts;

the cam members having a cam surface;

a plurality of electrical testing boards operably connected to the frame member;

wherein when the PCB is placed on top of the frame member and the top plate is placed on top of the PCB, and the locking posts are rotated from a disengaged position to an engaged position, operative electrical contact is made between the PCB and the plurality of electrical testing boards.

2. The system of claim 1 , wherein the frame is approximately square or rectangular in shape when viewed from above or below.

3. The system of claim 1 , wherein an upper end of the locking posts include at least one protrusion that fits within a key slot opening of the cam members.

4. The system of claim 1 , further comprising at least one floating plate connected to a bottom surface of the top plate by at least one compressible member.

5. The system of claim 1 , wherein when the PCB is installed the PCB is tested using the plurality of electrical testing boards.

6. The system of claim 1 , wherein the PCB is a device under test (DUT) PCB.

7. The system of claim 1 , wherein the PCB is a device under test (DUT) PCB and a test socket is attached to the DUT PCB.

8. The system of claim 1 , wherein the plurality of electrical testing boards are aligned in rows within a hollow interior of the frame, with one row of electrical testing boards positioned adjacent a first side of the frame member and a second row of electrical testing boards position adjacent a second side of the frame member so as to maximize density while minimizing space requirements.

9. A testing system, the system comprising:

a frame member;

a plurality of electrical testing boards operably connected to the frame member;

a plurality of locking posts operably connected to the frame member;

the plurality of locking posts configured to rotate between a disengaged position and an engaged position;

a printed circuit board (PCB) removably placed on top of the frame member;

the PCB having a generally planar shape having an upper surface and a lower surface;

the PCB having a plurality of electrical contacts positioned in its lower surface;

a top plate removably placed on top of the frame member and PCB;

the top plate having a plurality of cam members, the plurality of cam members having at least one cam surface;

wherein the plurality of cam members are configured to receive the locking posts of the frame member;

wherein when the top plate is placed on top of the PCB and the frame member and the locking posts are rotated from a disengaged position to an engaged position, the interaction of the plurality of locking posts with the plurality of cam members causes the plurality of electrical contacts to operably electrically connect with the plurality of electrical testing boards.

10. The system of claim 9 , wherein the plurality of electrical testing boards are vertically aligned and positioned in approximate parallel spaced relation with one another so as to maximize density while minimizing space requirements.

11. The system of claim 9 , wherein the plurality of electrical testing boards are vertically aligned in rows, with one row of electrical testing boards positioned adjacent a first side of the frame member and a second row of electrical testing boards position adjacent a second side of the frame member, wherein the second side is opposite the first side.

12. The system of claim 9 , wherein the plurality of electrical testing boards are vertically aligned in rows along a first side and a second side of the frame member.

13. The system of claim 9 , wherein the PCB is a device under test (DUT) PCB.

14. The system of claim 9 , wherein the PCB is a device under test (DUT) PCB and a test socket is attached to the DUT PCB.

15. The system of claim 9 , wherein the plurality of electrical contacts in the lower surface of the PCB connect to compressible electrical contacts in capsules operably held by the frame member, wherein the capsules electrically connect to the electrical testing boards.

16. The system of claim 9 further comprising a plurality of capsules operably held by the frame member, the capsules having a plurality of compressible electrical contacts, wherein the compressible electrical contacts in the capsules are configured to contact the electrical contacts positioned in the lower surface of the PCB.

17. The system of claim 9 , further comprising at least one floating plate connected to a bottom surface of the top plate by at least one compressible member.

18. A testing system, the system comprising:

a frame member;

at least one socket plate connected to the frame member, the at least one socket plate housing a plurality of capsules, the capsules having a plurality of compressible electrical contacts extending upward from the capsules;

a plurality of electrical testing boards operatively connected to the frame member;

the plurality of electrical testing boards electrically connected to the plurality of capsules;