Glitch characterization in digital-to-analog conversion

1. A method for characterizing transient behavior associated with a digital-to-analog converter (DAC) circuit, the method comprising:

receiving, at an input of the DAC circuit, a first input event followed by a second input event resulting in a first transient followed by a second transient at an output of the DAC circuit; and

summing a first contribution from the first transient that resulted from the first input event with a second contribution from the second transient that resulted from the second input event to determine a DAC circuit output offset value representative of the first and second transients.

2. The method of claim 1 , further comprising generating the first and second input events at a specified repetition rate; and

wherein the DAC circuit output offset value corresponds to the specified repetition rate.

3. The method of claim 2 , comprising estimating a representative transient glitch area value using the output offset value.

4. The method of claim 2 , wherein the first and second input events comprise first and second DAC circuit register writes.

5. The method of claim 4 , wherein the DAC circuit register writes comprise a DAC circuit output update lacking an output level shift.

6. The method of claim 4 , wherein the DAC circuit register writes comprise a DAC circuit output update including a direct-current (DC) value step-change in the DAC circuit output.

7. The method of claim 6 , wherein the DAC circuit register writes comprise output updates including a first-polarity DC value step-change during a first period and a second, opposite-polarity DC value step-change during a second period.

8. The method of claim 7 , wherein the first and second contributions are summed using an integrator circuit, further comprising swapping an input polarity to the integrator circuit such that a first input polarity is used during the first period and a second, opposite input polarity is used during the second period.

9. The method of claim 1 , wherein the first and second input events comprises first and second DAC circuit register writes including a first portion of register writes associated with DAC circuit output update commands and a second portion of register writes without associated DAC circuit output update commands; and

wherein the method comprises removing a baseline contribution to the output offset value corresponding to the DAC circuit register writes without associated output update commands, to determine an output offset value corresponding to DAC circuit output update events.

10. The method of claim 1 , wherein the first and second contributions are summed using an integrator circuit,

wherein the integrator circuit is located within a commonly-shared integrated circuit comprising the DAC circuit; and

wherein the method comprises comparing the output offset value representative of the first and second transients to a specified threshold to determine an output offset value in terms of a count of least-significant bit (LSB) contributions; further comprising

applying an offset compensation corresponding to the count.

11. The method of claim 10 , wherein the offset compensation is applied using at least one fractional LSB contribution.

12. A digital-to-analog converter (DAC) circuit, comprising:

an input configured to receive a first digital input followed by a second digital input configured to trigger a first transient followed by a second transient at an analog output of the DAC;

a circuit configured to sum a first contribution from the first transient that was triggered from the first digital input with a second contribution from the second transient that was triggered from the second digital input to determine a DAC circuit output offset value representative of the first and second transients; and

an offset compensation circuit configured to apply an offset compensation to the analog output corresponding to the determined DAC circuit output offset value.

13. The DAC circuit of claim 12 , wherein the circuit configured to sum the first and second contributions comprises an integrator circuit, wherein the integrator circuit comprises a capacitor; and

wherein the offset compensation circuit comprises a comparator circuit including an input coupled to the capacitor, the comparator circuit arranged to compare the DAC circuit output offset value as represented by a voltage on the capacitor to a specified threshold to determine the output offset value; and

wherein the DAC circuit is configured to apply the offset compensation in response to an output of the comparator circuit.

14. The DAC circuit of claim 13 , wherein an output circuit configuration of the DAC circuit comprises a redundant architecture; and

wherein the DAC circuit is configured to apply offset compensation using an output contribution provided by a redundant element in the redundant architecture.

15. The DAC circuit of claim 14 , wherein the redundant element comprises a fractional LSB contribution.

16. The DAC circuit of claim 12 , wherein the first and second digital inputs are received at a specified repetition rate; and

wherein the DAC circuit output offset value corresponds to the specified repetition rate.

17. The DAC circuit of claim 13 , wherein the first and second digital inputs comprise first and second DAC circuit register writes.

18. The DAC circuit of claim 13 , wherein the DAC circuit register writes comprise output updates including a first-polarity DC value step-change during a first period and a second, opposite-polarity DC value step-change during a second period.

19. The DAC circuit of claim 13 , comprising a switching circuit to swap an input polarity to the integrator circuit such that a first input polarity is used during the first period and a second, opposite input polarity is used during the second period.

20. An apparatus for characterizing transient behavior associated with a digital-to-analog converter (DAC) circuit, the apparatus including:

circuitry for generating a series of DAC circuit input events resulting in respective transients at an output of the DAC circuit; and

circuitry for summing contributions from the respective transients to determine a DAC circuit output offset value representative of the transients;

wherein the circuitry for generating the series of events is configured to generate such events at a specified repetition rate; and

wherein the DAC circuit output offset value corresponds to the specified repetition rate.

21. A method for characterizing transient behavior associated with a digital-to-analog converter (DAC) circuit, the method including:

generating a series of DAC circuit input events resulting in respective transients at an output of the DAC circuit; and

summing contributions from the respective transients to determine a DAC circuit output offset value representative of the transients;

wherein the series of events are generated at a specified repetition rate; and

wherein the DAC circuit output offset value corresponds to the specified repetition rate.

22. The method of claim 1 , wherein the first transient comprises a rising glitch and the second transient comprises a falling glitch, further comprising:

coupling the rising glitch to a first input of a comparator;

coupling the falling glitch to a second input of the comparator; and

computing, using the comparator, the DAC circuit output offset value based on a difference between the first and second inputs of the comparator, the difference representing a sum of absolute values of the rising and falling glitches.

23. The method of claim 1 , wherein the first and second contributions are summed using an integrator circuit.

24. The method of claim 1 , wherein the second input event is received sequentially after the first input event.

25. The DAC circuit of claim 12 , wherein the first transient comprises a rising glitch and the second transient comprises a falling glitch, further comprising a comparator configured to:

receive the rising glitch at a first input of the comparator;

receive the falling glitch at a second input of the comparator; and

compute the DAC circuit output offset value based on a difference between the first and second inputs of the comparator, the difference representing a sum of absolute values of the rising and falling glitches.

26. The DAC circuit of claim 12 , wherein the circuit configured to sum the first and. second contributions comprises an integrator circuit.

27. The DAC circuit of claim 12 , wherein the second digital input is received sequentially after the first digital input.

28. The apparatus of claim 20 , wherein the circuitry for summing the contributions comprises an integrator circuit.

29. The method of claim 21 , wherein the contributions are summed using an integrator circuit.