IP Library Granted Patent US 10,684,457
Granted Patent B2
US 10,684,457 · App. 15/871,368 · Granted Jun 16, 2020

Microscope apparatus

Inventors: Masahito Dohi (Tokyo, JP); Yoshihiro Shimada (Sagamihara, JP)
Assignee: OLYMPUS CORPORATION
G02B21/0032G02B15/04G02B21/0048G02B21/0076G02B21/16G02B21/367G02B27/0911G02B27/0966
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Quick Facts
Patent No.
US 10,684,457
App. No.
15/871,368
Granted
Jun 16, 2020
Kind
B2
Abstract

A microscope apparatus 10 includes a detection optical system 12 that captures light from a sample S and an illumination optical system 11 that radiates an illumination light onto the sample S. The illumination optical system 11 includes a cylindrical lens 5 that has a power in a first-axis direction and does not have a power in a second-axis direction that is perpendicular to the first-axis direction, a cylindrical lens 6 that has a power in the second-axis direction and does not have a power in the first-axis direction, and a scanner 4 that scans the illumination light in a width direction. The illumination optical system 11 is configured such that the first-axis direction is the width direction described above, and the cylindrical lenses 5 and 6 are arranged posterior to the scanner 4.

Claims (38)

1. A microscope apparatus comprising:

a detection optical system that captures light from a sample; and

an illumination optical system that has an optical axis oriented in a direction different from an optical axis of the detection optical system and that radiates an illumination light onto the sample,

wherein:

the illumination optical system includes:

a first optical-axis-asymmetric optical system that has a power in a first-axis direction and does not have a power in a second-axis direction that is perpendicular to the first-axis direction,

a second optical-axis-asymmetric optical system that has a power in the second-axis direction and does not have a power in the first-axis direction, and

a scanning unit that scans the illumination light in a width direction that is perpendicular to the optical axis of the detection optical system and the optical axis of the illumination optical system;

the illumination optical system is configured such that the first-axis direction is the width direction;

the first optical-axis-asymmetric optical system and the second optical-axis-asymmetric optical system are arranged between the sample and the scanning unit; and

the illumination optical system concentrates the illumination light onto a substantially same position in the optical axis of the illumination optical system by each of the first optical-axis-asymmetric optical system and the second optical-axis-asymmetric optical system so as to form an optical spot within a field of view of the detection optical system, and scans the optical spot so as to form a sheet light.

2. The microscope apparatus according to claim 1 , wherein the scanning unit comprises a scanner that is arranged in one of a front focal plane of the first optical-axis-asymmetric optical system and a plane conjugate to the front focal plane.

3. The microscope apparatus according to claim 1 , wherein the illumination optical system includes an optical system that converts a beam that enters the scanning unit into a collimated beam.

4. The microscope apparatus according to claim 1 , wherein an emission-side light concentration numerical aperture of the illumination optical system in the first-axis direction is not less than 0.04.

5. The microscope apparatus according to claim 1 , wherein one of the first optical-axis-asymmetric optical system and the second optical-axis-asymmetric optical system includes an aspherical lens.

6. The microscope apparatus according to claim 1 , wherein the optical axis of the detection optical system and the optical axis of the illumination optical system are perpendicular to each other.

7. The microscope apparatus according to claim 1 , further comprising a first numerical-aperture-changing unit that changes an emission-side light concentration numerical aperture of the illumination optical system in the first-axis direction.

8. The microscope apparatus according to claim 7 , wherein:

the illumination optical system includes a third optical-axis-asymmetric optical system that is placed in an optical path of the illumination optical system by switching being performed from the first optical-axis-asymmetric optical system placed in the optical path of the illumination optical system and that provides an emission-side light concentration numerical aperture that is different from an emission-side light concentration numerical aperture of the first optical-axis-asymmetric optical system; and

the first numerical-aperture-changing unit comprises a switching mechanism that performs switching between the first optical-axis-asymmetric optical system and the third optical-axis-asymmetric optical system so as to place one of the first optical-axis-asymmetric optical system and the third optical-axis-asymmetric optical system in the optical path of the illumination optical system.

9. The microscope apparatus according to claim 7 , wherein the first numerical-aperture-changing unit comprises a zoom lens that changes an emission-side light concentration numerical aperture of the first optical-axis-asymmetric optical system.

10. The microscope apparatus according to claim 1 , further comprising a second numerical-aperture-changing unit that changes an emission-side light concentration numerical aperture of the illumination optical system in the second-axis direction.

11. The microscope apparatus according to claim 10 , wherein:

the illumination optical system includes a fourth optical-axis-asymmetric optical system that is placed in an optical path of the illumination optical system by switching being performed from the second optical-axis-asymmetric optical system placed in the optical path of the illumination optical system and that provides an emission-side light concentration numerical aperture that is different from an emission-side light concentration numerical aperture of the second optical-axis-asymmetric optical system; and

the second numerical-aperture-changing unit comprises a switching mechanism that performs switching between the second optical-axis-asymmetric optical system and the fourth optical-axis-asymmetric optical system so as to place one of the second optical-axis-asymmetric optical system and the fourth optical-axis-asymmetric optical system in the optical path of the illumination optical system.

12. The microscope apparatus according to claim 10 , wherein the second numerical-aperture-changing unit comprises a zoom lens that changes an emission-side light concentration numerical aperture of the second optical-axis-asymmetric optical system.

13. The microscope apparatus according to claim 10 , wherein:

the illumination optical system includes a light-blocking member that blocks a portion of the illumination light in the second-axis direction, and

the second numerical-aperture-changing unit comprises a light blocking device that changes a range in which the light-blocking member blocks the portion of the illumination light.

14. An illumination device comprising:

an illumination optical system that includes:

a first optical-axis-asymmetric optical system that has a power in a first-axis direction and does not have a power in a second-axis direction that is perpendicular to the first-axis direction;

a second optical-axis-asymmetric optical system that has a power in the second-axis direction and does not have a power in the first-axis direction; and

a scanning unit that scans an illumination light in a width direction that is perpendicular to an optical axis of the illumination optical system,

wherein:

the illumination optical system is configured such that the first-axis direction is the width direction,

the first optical-axis-asymmetric optical system and the second optical-axis-asymmetric optical system are arranged between the sample and the scanning unit, and

the illumination optical system concentrates the illumination light onto a substantially same position in the optical axis of the illumination optical system by each of the first optical-axis-asymmetric optical system and the second optical-axis-asymmetric optical system so as to form an optical spot within a field of view of a detection optical system, and scans the optical spot so as to form a light sheet.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2023
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 062492/0267 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2018
From: DOHI, MASAHITO; SHIMADA, YOSHIHIRO
To: OLYMPUS CORPORATION
Reel/Frame 044621/0468 →
Priority Claims (1)
JP 2017-066797 · Mar 30, 2017 · national
Continuity (1)
Related Publication 20180284411A1 · Oct 4, 2018
Cited By (1)
US 12,443,021