Resistor network reduction for full-chip simulation of current density
Aspects of technology disclosed herein relate to techniques of a full-circuit simulation-based circuit design verification. A simulation is performed to determine current data of parasitic resistors in one or more parasitic resistance networks in power supply circuitry of a circuit design by injecting a current into each one of the one or more parasitic resistance networks. Based on the current data, non-current carrying parasitic resistors are removed from the one or more parasitic resistance network to generate one or more reduced parasitic resistance network. Using the one or more reduced parasitic resistance networks, a full-circuit simulation is performed to obtain current density information. A circuit design verification of the circuit design is then performed based on the current density information.
1. One or more non-transitory computer-readable media storing computer-executable instructions, the computer-executable instructions which, when executed by one or more processors, cause the one or more processors to perform a method, the method comprising:
performing a simulation to determine current data of parasitic resistors in one or more parasitic resistance networks in power supply circuitry of a circuit design by injecting a current into each one of the one or more parasitic resistance networks, the current being injected at one or more current source nodes and being drained at one or more current drain nodes, the one or more current source nodes and the one or more current drain nodes being selected from nodes of the power supply circuitry that are connected to said each one of the one or more parasitic resistance networks, the nodes of the power supply circuitry comprising pins of circuit devices in or connected to the power supply circuitry, power supply pads (power/ground), or both;
determining one or more reduced parasitic resistance networks for the one or more parasitic resistance networks by removing non-current carrying parasitic resistors from the one or more parasitic resistance networks, wherein the non-current carrying parasitic resistors are determined based on the current data and a predetermined threshold current value;
performing a full-circuit simulation using the one or more reduced parasitic resistance networks to obtain current density information;
performing a circuit design verification of the circuit design based on the current density information; and
reporting results of the circuit design verification.
2. The one or more non-transitory computer-readable media recited in claim 1 , wherein the circuit devices in the power supply circuitry comprise a voltage divider, an ESD (electrostatic discharge) protection device, or both.
3. The one or more non-transitory computer-readable media recited in claim 1 , wherein the circuit design verification comprises ESD (electrostatic discharge) protection checks, electromigration checks, or both.
4. The one or more non-transitory computer-readable media recited in claim 1 , wherein the injected current is between two and five times of an amount of current which the power supply circuitry is designed for.
5. The one or more non-transitory computer-readable media recited in claim 1 , wherein the predetermined threshold current value is on the order of 10 −5 Ampere.
6. A method executed by at least one processor of a computer, the method comprising:
performing a simulation to determine current data of parasitic resistors in one or more parasitic resistance networks in power supply circuitry of a circuit design by injecting a current into each one of the one or more parasitic resistance networks, the current being injected at one or more current source nodes and being drained at one or more current drain nodes, the one or more current source nodes and the one or more current drain nodes being selected from nodes of the power supply circuitry that are connected to said each one of the one or more parasitic resistance networks, the nodes of the power supply circuitry comprising pins of circuit devices in or connected to the power supply circuitry, power supply pads (power/ground), or both;
determining one or more reduced parasitic resistance networks for the one or more parasitic resistance networks by removing non-current carrying parasitic resistors from the one or more parasitic resistance networks, wherein the non-current carrying parasitic resistors are determined based on the current data and a predetermined threshold current value;
performing a full-circuit simulation using the one or more reduced parasitic resistance networks to obtain current density information;
performing a circuit design verification of the circuit design based on the current density information; and
reporting results of the circuit design verification.
7. The method recited in claim 6 , wherein the circuit devices in the power supply circuitry comprise a voltage divider, an ESD (electrostatic discharge) protection device, or both.
8. The method recited in claim 6 , wherein the circuit design verification comprises ESD (electrostatic discharge) protection checks, electromigration checks, or both.
9. The method recited in claim 6 , wherein the injected current is between two and five times of an amount of current which the power supply circuitry is designed for.
10. The method recited in claim 6 , wherein the predetermined threshold current value is on the order of 10 −5 Ampere.
11. A system comprising:
one or more processors, the one or more processors programmed to perform a method, the method comprising:
performing a simulation to determine current data of parasitic resistors in one or more parasitic resistance networks in power supply circuitry of a circuit design by injecting a current into each one of the one or more parasitic resistance networks, the current being injected at one or more current source nodes and being drained at one or more current drain nodes, the one or more current source nodes and the one or more current drain nodes being selected from nodes of the power supply circuitry that are connected to said each one of the one or more parasitic resistance networks, the nodes of the power supply circuitry comprising pins of circuit devices in or connected to the power supply circuitry, power supply pads (power/ground), or both;
determining one or more reduced parasitic resistance networks for the one or more parasitic resistance networks by removing non-current carrying parasitic resistors from the one or more parasitic resistance networks, wherein the non-current carrying parasitic resistors are determined based on the current data and a predetermined threshold current value;
performing a full-circuit simulation using the one or more reduced parasitic resistance networks to obtain current density information;
performing a circuit design verification of the circuit design based on the current density information; and
reporting results of the circuit design verification.
12. The system recited in claim 11 , wherein
the circuit devices in the power supply circuitry comprise a voltage divider, an ESD (electrostatic discharge) protection device, or both.
13. The system recited in claim 11 , wherein
the circuit design verification comprises ESD (electrostatic discharge) protection checks, electromigration checks, or both.
14. The system recited in claim 11 , wherein
the injected current is between two and five times of an amount of current which the power supply circuitry is designed for.
15. The system recited in claim 11 , wherein
the predetermined threshold current value is on the order of 10 −5 Ampere.