IP Library Granted Patent US 10,649,888
Granted Patent B2
US 10,649,888 · App. 15/884,568 · Granted May 12, 2020

Parallelizable data-driven testing

Inventor: Mykhailo Makarov (Ballybrack, IE)
Assignee: Dell Products L.P.
G06F11/3684G06F11/3688
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Quick Facts
Patent No.
US 10,649,888
App. No.
15/884,568
Granted
May 12, 2020
Kind
B2
Abstract

Disclosed herein are methods, systems, and processes to generate and perform parallelizable data-driven single instruction multiple data (SIMD) tests. A base abstract class that defines shared testing parameters for tests to be performed on an application is designated. Inheriting classes of the base abstract class are defined and a data source key is derived from the inhering classes. A test data source is accessed to perform the tests on the application and a result of tests is generated based on the data source key.

Claims (85)

1. A computer-implemented method, comprising:

designating a base abstract class that defines a plurality of shared testing parameters for a plurality of tests to be performed on an application;

defining a plurality of inheriting classes of the base abstract class;

deriving a data source key from the plurality of inhering classes, wherein the data source key comprises a country code;

accessing a test data source to perform the plurality of tests on the application, wherein the test data source is generated based on the data source key, and wherein the test data source comprises a plurality of data sources including at least:

a credentials data source; and

a validation data source; and

generating a result of the plurality of tests based on the data source key.

2. The computer-implemented method of claim 1 , wherein

the plurality of tests comprise a plurality of single instruction multiple data (SIMD) tests.

3. The computer-implemented method of claim 2 , further comprising:

creating the plurality of SIMD tests by combining:

an inheritance mechanism for code duplication operations;

at least one of: a unit test methodology, an integration testing methodology, a user interface (UI) testing methodology, or an end-to-end testing methodology for long run time operations; and

the test data source for test data duplication operations.

4. The computer-implemented method of claim 1 , further comprising:

executing each inheriting class of the plurality of inheriting classes in parallel.

5. The computer-implemented method of claim 1 , further comprising:

determining that a new test has been added to the plurality of tests;

applying the new test to each inheriting class of the plurality of inheriting classes; and

performing the plurality of tests comprising the new test on the application.

6. The computer-implemented method of claim 1 , further comprising:

adding a new inheriting class to the plurality of inheriting classes to permit the new inheriting class to inherit the plurality of tests in the base abstract class; and

performing the plurality of tests comprising the new inheriting class on the application.

7. A non-transitory computer readable storage medium comprising program instructions executable to:

designate a base abstract class that defines a plurality of shared testing parameters for a plurality of tests to be performed on an application;

define a plurality of inheriting classes of the base abstract class;

derive a data source key from the plurality of inhering classes, wherein the data source key comprises a country code;

access a test data source to perform the plurality of tests on the application, wherein the test data source is generated based on the data source key, and wherein the test data source comprises a plurality of data sources including at least:

a credentials data source; and

a validation data source; and

generate a result of the plurality of tests based on the data source key.

8. The non-transitory computer readable storage medium of claim 7 , wherein

the plurality of tests comprise a plurality of single instruction multiple data (SIMD) tests.

9. The non-transitory computer readable storage medium of claim 8 , further comprising:

creating the plurality of SIMD tests by combining:

an inheritance mechanism for code duplication operations;

at least one of: a unit test methodology, an integration testing methodology, a user interface (UI) testing methodology, or an end-to-end testing methodology for long run time operations; and

the test data source for test data duplication operations.

10. The non-transitory computer readable storage medium of claim 7 , further comprising:

executing each inheriting class of the plurality of inheriting classes in parallel.

11. The non-transitory computer readable storage medium of claim 7 , further comprising:

determining that a new test has been added to the plurality of tests;

applying the new test to each inheriting class of the plurality of inheriting classes; and

performing the plurality of tests comprising the new test on the application.

12. The non-transitory computer readable storage medium of claim 7 , further comprising:

adding a new inheriting class to the plurality of inheriting classes to permit the new inheriting class to inherit the plurality of tests in the base abstract class; and

performing the plurality of tests comprising the new inheriting class on the application.

13. A system comprising: one or more processors; and

a memory coupled to the one or more processors, wherein the memory stores program instructions executable by the one or more processors to:

designate a base abstract class that defines a plurality of shared testing parameters for a plurality of tests to be performed on an application;

define a plurality of inheriting classes of the base abstract class;

derive a data source key from the plurality of inhering classes, wherein the data source key comprises a country code;

access a test data source to perform the plurality of tests on the application, wherein the test data source is generated based on the data source key, and wherein the test data source comprises a plurality of data sources including at least:

a credentials data source; and

a validation data source; and

generate a result of the plurality of tests based on the data source key.

14. The system of claim 13 , wherein

the plurality of tests comprise a plurality of single instruction multiple data (SIMD) tests.

15. The system of claim 14 , further comprising:

creating the plurality of SIMD tests by combining:

an inheritance mechanism for code duplication operations;

at least one of: a unit test methodology, an integration testing methodology, a user interface (UI) testing methodology, or an end-to-end testing methodology for long run time operations; and

the test data source for test data duplication operations.

16. The system of claim 13 , further comprising:

executing each inheriting class of the plurality of inheriting classes in parallel.

17. The system of claim 13 , further comprising:

determining that a new test has been added to the plurality of tests;

applying the new test to each inheriting class of the plurality of inheriting classes;

adding a new inheriting class to the plurality of inheriting classes, wherein

the adding permits the new inheriting class to inherit the plurality of tests in the base abstract class; and

performing the plurality of tests comprising the new test and the new inheriting class on the application.

18. The system of claim 13 , further comprising:

adding a new inheriting class to the plurality of inheriting classes to permit the new inheriting class to inherit the plurality of tests in the base abstract class; and

performing the plurality of tests comprising the new inheriting class on the application.

19. The system of claim 14 , further comprising:

creating the plurality of SIMD tests by combining:

a base abstract class manager;

an inheriting class manager; and

a test data source manager.

20. The computer-implemented method of claim 2 , further comprising:

creating the plurality of SIMD tests by combining:

an inheritance principle from object-oriented programming;

unit testing run parallelization; and

a data-driven testing approach.

Assignments (8)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (053546/0001) Recorded Jun 23, 2022
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
To: DELL MARKETING L.P. (ON BEHALF OF ITSELF AND AS SUCCESSOR-IN-INTEREST TO CREDANT TECHNOLOGIES, INC.); DELL INTERNATIONAL L.L.C.; DELL PRODUCTS L.P.; DELL USA L.P.; EMC CORPORATION; DELL MARKETING CORPORATION (SUCCESSOR-IN-INTEREST TO FORCE10 NETWORKS, INC. AND WYSE TECHNOLOGY L.L.C.); EMC IP HOLDING COMPANY LLC
Reel/Frame 071642/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (045482/0131) Recorded May 20, 2022
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
To: DELL PRODUCTS L.P.; EMC CORPORATION; EMC IP HOLDING COMPANY LLC; DELL MARKETING CORPORATION (SUCCESSOR-IN-INTEREST TO WYSE TECHNOLOGY L.L.C.)
Reel/Frame 061749/0924 →
RELEASE OF SECURITY INTEREST AT REEL 045482 FRAME 0395 Recorded Nov 2, 2021
From: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
To: DELL PRODUCTS L.P.; EMC CORPORATION; EMC IP HOLDING COMPANY LLC; WYSE TECHNOLOGY L.L.C.
Reel/Frame 058298/0314 →
SECURITY AGREEMENT Recorded Apr 22, 2020
From: CREDANT TECHNOLOGIES INC.; DELL INTERNATIONAL L.L.C.; DELL MARKETING L.P.; DELL PRODUCTS L.P.; DELL USA L.P.; EMC CORPORATION; FORCE10 NETWORKS, INC.; WYSE TECHNOLOGY L.L.C.; EMC IP HOLDING COMPANY LLC
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A.
Reel/Frame 053546/0001 →
SECURITY AGREEMENT Recorded Mar 21, 2019
From: CREDANT TECHNOLOGIES, INC.; DELL INTERNATIONAL L.L.C.; DELL MARKETING L.P.; DELL PRODUCTS L.P.; DELL USA L.P.; EMC CORPORATION; FORCE10 NETWORKS, INC.; WYSE TECHNOLOGY L.L.C.; EMC IP HOLDING COMPANY LLC
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A.
Reel/Frame 049452/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2018
From: MAKAROV, MYKHAILO
To: DELL PRODUCTS L.P.
Reel/Frame 045716/0926 →
PATENT SECURITY AGREEMENT (NOTES) Recorded Mar 1, 2018
From: DELL PRODUCTS L.P.; EMC CORPORATION; EMC IP HOLDING COMPANY LLC; WYSE TECHNOLOGY L.L.C.
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS COLLATERAL AGENT
Reel/Frame 045482/0131 →
PATENT SECURITY AGREEMENT (CREDIT) Recorded Mar 1, 2018
From: DELL PRODUCTS L.P.; EMC CORPORATION; EMC IP HOLDING COMPANY LLC; WYSE TECHNOLOGY L.L.C.
To: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH, AS COLLATERAL AGENT
Reel/Frame 045482/0395 →
Continuity (1)
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