IP Library Granted Patent US 10,371,580
Granted Patent B2
US 10,371,580 · App. 15/903,489 · Granted Aug 6, 2019

Method and apparatus for wavefront sensing

Inventor: Seung-Whan Bahk (Rochester, NY)
Assignee: RAM PHOTONICS, LLC
G01J9/0215G01B9/02G01J9/02G03F7/706G01J2009/002
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Quick Facts
Patent No.
US 10,371,580
App. No.
15/903,489
Granted
Aug 6, 2019
Kind
B2
Abstract

A method for performing optical wavefront sensing includes providing an amplitude transmission mask having a light input side, a light output side, and an optical transmission axis passing from the light input side to the light output side. The amplitude transmission mask is characterized by a checkerboard pattern having a square unit cell of size Λ. The method also includes directing an incident light field having a wavelength λ to be incident on the light input side and propagating the incident light field through the amplitude transmission mask. The method further includes producing a plurality of diffracted light fields on the light output side and detecting, at a detector disposed a distance L from the amplitude transmission mask, an interferogram associated with the plurality of diffracted light fields. The relation 0 < L < 1 8 ⁢ Λ 2 λ ⁢ ⁢ or ⁢ ⁢ 1 4 ⁢ Λ 2 λ ⁢ ( 2 ⁢ n - 1 ) < L < 1 4 ⁢ Λ 2 λ ⁢ ( 2 ⁢ n + 1 ) is satisfied, where n is an integer greater than zero.

Claims (69)

1. A wavefront sensor comprising:

an amplitude-only transmission mask characterized by a checkerboard pattern having a unit square cell of size Λ;

a detector disposed at a distance, L, from the amplitude-only transmission mask and optically downstream of the amplitude-only transmission mask,

wherein

0

<

L

<

1

8

Λ

2

λ

or

1

4

Λ

2

λ

(

2

n

-

1

)

<

L

<

1

4

Λ

2

λ

(

2

n

+

1

)

,

where λ is a wavelength of an incident field and n is a positive integer; and

a computer coupled to the detector.

2. The wavefront sensor of claim 1 wherein the computer includes a non-transitory computer-readable storage medium comprising a plurality of computer-readable instructions tangibly embodied on the computer-readable storage medium, which, when executed by a data processor, provide a measurement of characteristics of a wavefront of an incident beam, the plurality of instructions comprising:

instructions that cause the data processor to obtain an interferogram associated with the incident beam passing through a transmission mask;

instructions that cause the data processor to Fourier transform the interferogram to provide a frequency domain interferogram;

instructions that cause the data processor to select a subset of harmonics from the frequency domain interferogram;

instructions that cause the data processor to individually inverse Fourier transform each of the subset of harmonics to provide a set of spatial domain harmonics;

instructions that cause the data processor to extract a phase profile from each of the set of spatial domain harmonics;

instructions that cause the data processor to remove phase discontinuities in the phase profile;

instructions that cause the data processor to rotate the phase profile; and instructions that cause the data processor to reconstruct a phase front of the wavefront of the incident beam.

3. The wavefront sensor of claim 1 , wherein the detector is characterized by a pixel size and Λ is about 10 times larger than the pixel size.

4. The wavefront sensor of claim 1 , wherein 10 nm<λ<2,000 nm.

5. The wavefront sensor of claim 1 , wherein 1 mm≤L≤10 mm.

6. The wavefront sensor of claim 1 , wherein the amplitude-only transmission mask comprises a chrome layer.

7. The wavefront sensor of claim 6 , wherein the amplitude-only transmission mask further comprises a silica substrate.

8. The wavefront sensor of claim 1 , further comprising a 12-bit camera, wherein the amplitude-only transmission mask is directly attached to the 12-bit camera.

9. The wavefront sensor of claim 1 , wherein the computer includes a non-transitory computer-readable storage medium comprising a plurality of computer-readable instructions tangibly embodied on the computer-readable storage medium, which, when executed by a data processor, provide a measurement of characteristics of a wavefront of an incident beam, the plurality of instructions comprising instructions that cause the data processor to obtain an interferogram associated with the incident beam passing through a transmission mask.

10. The wavefront sensor of claim 9 , wherein the computer-readable instructions, when executed by the data processor, further provide instructions comprising instructions that cause the data processor to Fourier transform the interferogram to provide a frequency domain interferogram.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2022
From: RAM PHOTONICS LLC
To: RAM PHOTONICS INDUSTRIAL, LLC
Reel/Frame 061840/0510 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED AT REEL: 045018 FRAME: 0687. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Recorded Jul 15, 2022
From: BAHK, SEUNG-WHAN
To: RAM PHOTONICS LLC
Reel/Frame 060669/0987 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2018
From: BAHK, SEUNG-WHAN
To: RAM PHOTONICS, LLC
Reel/Frame 045018/0687 →
Continuity (4)
Continuation 15209535 · Jul 13, 2016
Division 14587392 · Dec 31, 2014
Provisional Application 61923362 · Jan 3, 2014
Related Publication 20180292268A1 · Oct 11, 2018
Cited By (1)
US 12,282,147