Camera subassembly dust and defect detection system and method
Systems and methods facilitate iteratively inspecting a high resolution image of a camera subassembly glass element, to determine whether dust is present, and cleaning of same. By examining the size, number, and location of the dust particles it can be determined whether the dust is likely to cause issues when the camera subassembly is integrated into a fully assembled document scanner. Other anomalies, contaminants, and defects which could affect camera image quality, such as scratches on the glass covering, can also be detected. Software may control the capturing of the high resolution images of the camera subassembly glass and can determine a fail state if the anomaly is above a predetermined threshold. The systems and method can be used as acceptance criteria of individual camera subassemblies from a manufacturer.
1. A system for inspecting and cleaning a camera subassembly, the system comprising:
a) a fixture for holding a camera subassembly having glass, in a position for the glass to be inspected for an anomaly which could affect image quality;
b) a high resolution camera held by the fixture and configured to capture high resolution images of the camera subassembly glass;
c) control circuitry configured to provide power to control illumination elements during the inspection for the anomaly;
d) a control device connected to the control circuitry and the high resolution camera, wherein the control device comprises a processor and memory, wherein the processor in the control device executes software modules stored in the memory to: control the high resolution camera, capture images of the camera subassembly glass taken by the high resolution camera, determine a fail state if the anomaly is above a predetermined threshold, and compare the anomaly against the predetermined threshold upon a cleaning of the camera subassembly glass.
2. The system of claim 1 , wherein the camera subassembly has an identifying serial number capable of entry into the system by at least one of: a scanned barcode, manual entry of the serial number, and detecting the serial number using the high resolution camera.
3. The system of claim 1 , wherein the predetermined threshold can be obtained automatically using preset values or by manual input.
4. The system of claim 1 , wherein the predetermined threshold is set at a maximum segment length and the anomaly which could affect image quality includes dust particles as small as 0.20 mm.
5. The system of claim 1 , wherein the control device comprises a particle detection and defect characterization software module configured to iteratively analyze a location of the anomaly and instruct the cleaning upon determination of the fail state.
6. The system of claim 1 , wherein the control device and software modules therein are configured to: determine a region of interest (ROI) on the camera subassembly glass by using at least one reference point on the camera subassembly glass; and apply predetermined particle characteristics to distinguish dust from scratches or other contaminants in the ROI.
7. The system of claim 5 , wherein the particle detection and defect characterization software module is configured to locate suitable areas of the camera subassembly glass to inspect for the anomaly.
8. The system of claim 1 , wherein the control device and software modules therein are configured to locate and tabulate characteristics of the anomaly.
9. The system of claim 6 , wherein the control device and software modules therein are configured to enhance the ROI to identify particles or other defects in the captured images.
10. A method of iteratively inspecting and cleaning a camera subassembly, the method comprising:
a) capturing an image, with a high resolution camera, of a glass element of the camera subassembly;
b) determining a region of interest (ROI) on the glass element by using at least one reference point on the glass element;
c) locating and measuring an anomaly, in the ROI, that could affect quality of the image;
d) determining, by a control device, a fail state if the anomaly is above a predetermined threshold;
e) cleaning, upon determination of the fail state, the glass element and re-measuring the anomaly; and
f) determining, by the control device, whether an additional re-measuring of the anomaly is needed.
11. The method of claim 10 , wherein the determining whether an additional re-measuring of the anomaly is needed is based on at least one of: a number of anomalies detected, a type or severity of anomalies detected, and comparison against a predetermined number of measuring and cleaning cycles.
12. The method of claim 10 , further comprising:
capturing an identifying serial number of the camera subassembly, wherein the capturing of the serial number comprises at least one of: scanning a barcode, manual entry of the serial number, and detecting the serial number using the camera.
13. The method of claim 10 , further comprising:
applying predetermined particle characteristics to distinguish dust from scratches or other contaminants in the ROI.
14. The method of claim 10 , further comprising:
obtaining the predetermined threshold, the obtaining performed automatically using preset values or by manual input.
15. The method of claim 10 , wherein the predetermined threshold is set at a maximum segment length and the anomaly which could affect image quality includes dust particles as small as 0.20 mm.
16. The method of claim 10 , wherein a particle detection and defect characterization software module iteratively determines a location of the anomaly and instructs the cleaning upon determination of the fail state.
17. The method of claim 10 , further comprising:
obtaining the number of camera subassembly cleaning cycles automatically using preset values or by manual input.
18. The method of claim 10 , wherein the ROI is defined by a coordinate system and determined automatically by the control device or by user input.
19. The method of claim 10 , further comprising:
enhancement of the ROI to identify particles or other defects in the captured images.
20. The method of claim 10 , further comprising:
reporting the fail state.