Varying an illumination path of a selective plane illumination microscopy

1. A system for illuminating a microscopy specimen, comprising:

an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope; and

optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen;

wherein the optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen; and

wherein the optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes; and

wherein the optical detection path includes a second electronically tunable lens configured to automatically vary a focal distance of the second electronically tunable lens.

2. The system of claim 1 , wherein the deflector includes an oscillating mirror that oscillates about a central rotational axis.

3. The system of claim 1 , wherein the focal distance of the electronically tunable lens is automatically swept across a range of focal distance values.

4. The system of claim 1 , wherein the electronically tunable lens is adjustable in a range that includes both positive and negative diopter values.

5. The system of claim 1 , wherein the optical elements include a second deflector configured to horizontally move a direction with which beam components extending within the light sheet are directed to the microscopy specimen.

6. The system of claim 5 , wherein the second deflector includes an oscillating mirror that vibrates about a central rotational axis.

7. The system of claim 1 , wherein the optical elements include a collimator and one or more diaphragms configured to adjust field and/or or angular aperture stops associated with the light sheet.

8. The system of claim 1 , wherein the optical elements include an aspherical optical element configured to at least in part generate a light bundle with an elliptic cross section.

9. The system of claim 1 , wherein the optical detection path includes a detector configured to detect a fluorescent light emitted by the microscopy specimen.

10. The system of claim 1 , wherein the focal distance of the second electronically tunable lens is automatically synchronized with automatically varying a vertical location of the light sheet illuminating the microscopy specimen.

11. The system of claim 1 , wherein the optical elements include a group of optical relay lenses and an optical objective that directs the light sheet to the microscopy specimen, and the electronically tunable lens is positioned in the illumination path between the group of optical relay lenses and the optical objective.

12. The system of claim 1 , wherein the optical elements include a group of optical relay lenses, and the electronically tunable lens is positioned in the illumination path between the group of optical relay lenses and the deflector.

13. The system of claim 1 , wherein the optical elements include an aspherical optical element, and the electronically tunable lens is positioned in the illumination path between the aspherical optical element and the deflector.

14. The system of claim 1 , further comprising a motorized stage configured to move and rotate the microscopy specimen with respect to the light sheet.

15. The system of claim 1 , wherein scanning lines of a rolling shutter of a detector in the optical detection path are synchronized with a varying position of the waist of the light sheet.

16. The system of claim 1 , further comprising a second illumination source configured to emit a different light that travels along a second illumination path to illuminate the microscopy specimen placed on the optical detection path of the optical microscope.

17. A system for illuminating a microscopy specimen, comprising:

an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope; and

optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen;

wherein the optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen; and

wherein the optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes; and

wherein the optical elements include an aspherical optical element, and the electronically tunable lens is positioned in the illumination path between the aspherical optical element and the deflector.

18. The system of claim 17 , wherein the optical elements include a second deflector configured to horizontally move a direction with which beam components extending within the light sheet are directed to the microscopy specimen.

19. The system of claim 18 , wherein the second deflector includes an oscillating mirror that vibrates about a central rotational axis.

20. The system of claim 17 , wherein scanning lines of a rolling shutter of a detector in the optical detection path are synchronized with a varying position of the waist of the light sheet.