IP Library Patent Application 15952168
Patent Application
App. No. 15/952,168

TOROIDAL PLASMA ABATEMENT APPARATUS AND METHOD

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Quick Facts
Patent No.
US None
App. No.
15/952,168
Abstract

An apparatus for abatement of gases is provided. The apparatus includes a toroidal plasma chamber having a plurality of inlets and an outlet, and at least one chamber wall. One or more magnetic cores are disposed relative to the toroidal plasma chamber. The plasma chamber confines a toroidal plasma. A second gas inlet is positioned on the toroidal plasma chamber between a first gas inlet and the gas outlet at a distance d from the gas outlet, such that a toroidal plasma channel volume between the first gas inlet and the second gas inlet in the is substantially filled by the inert gas, the distance d based on a desired residence time of the gas to be abated.

Claims (19)

1 . A method for abating process gas within a plasma source, the method comprising:

flowing via a first gas inlet, a first gas for ignition into a plasma into a toroidal plasma chamber having a primary winding coupled to the plasma chamber and a plurality of magnetic cores oriented such that the plasma chamber passes through each of the plurality of magnetic cores;

generating a toroidal plasma in the toroidal plasma chamber along a plane extending through the toroidal plasma chamber;

positioning a second gas inlet between the first gas inlet and a gas outlet at a distance d from the gas outlet along the plane, the distance d based on a desired residence time of a gas to be abated; and

flowing via the second gas inlet, the gas to be abated into the toroidal plasma chamber such that the gas to be abated reacts with the toroidal plasma.

2 . The method of claim 1 , further comprising adjusting the position of the second gas inlet to control the desired residence time of the gas to be abated.

3 . The method of claim 1 , further comprising adjusting a flow rate of the first gas flowing into the plasma chamber such that a first toroidal plasma channel volume between the first gas inlet and the second gas inlet in the toroidal plasma chamber is substantially filled by the first gas and a second toroidal plasma channel volume between the second gas inlet and the gas outlet is substantially filed with the gas to be abated.

4 . The method of claim 1 , further comprising providing a reactant gas to mix with the gas to be abated before flowing into the plasma chamber via the second gas inlet.

5 . The method of claim 1 , further comprising providing a water vapor to mix with the gas to be abated before flowing into the plasma chamber via the second gas inlet.

6 . The method of claim 1 , further comprising monitoring an emission from the plasma chamber via an optical and/or an infrared sensor and adjusting a flow rate of the reactant gas in response to the emission from the plasma chamber such that a concentration of the reactant gas is at a desired level to react with the gas to be abated.

7 . The method of claim 1 further comprising coupling the gas outlet to a subsequent treatment device.

8 . The method of claim 1 wherein generating the toroidal plasma further comprises:

coupling an RF power supply to the primary winding; and

delivering power to the toroidal plasma.

9 . The method of claim 3 , further comprising coupling an RF power supply to the primary winding.

10 . The method of claim 9 further comprising delivering a constant plasma current through the first toroidal plasma channel volume and the second toroidal plasma channel volume.

11 . The method of claim 1 wherein positioning the second gas inlet further comprises orienting the second gas inlet at an acute angle to the plane.

12 . The method of claim 1 wherein positioning the second gas inlet further comprises positioning the second gas inlet between the first gas inlet and the gas outlet at a distance approximately 2 to 5 inches from the gas outlet along the plane.

13 . The method of claim 1 further comprising selecting the second gas inlet from a series of selectable gas inlet ports positioned along the toroidal plasma chamber.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE U.S. PATENT NO.7,919,646 PREVIOUSLY RECORDED ON REEL 048211 FRAME 0312. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT (ABL). Recorded Jan 14, 2021
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 055668/0687 →
PATENT SECURITY AGREEMENT (ABL) Recorded Feb 1, 2019
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048211/0312 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.
Reel/Frame 048222/0397 →
PATENT SECURITY AGREEMENT Recorded Jul 27, 2018
From: MKS INSTRUMENTS, INC.
To: BARCLAYS BANK PLC
Reel/Frame 047254/0731 →
PATENT SECURITY AGREEMENT Recorded Jul 27, 2018
From: MKS INSTRUMENTS, INC.
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 046641/0772 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2018
From: CHEN, XING; POKIDOV, ILYA; TIAN, FENG; TRAN, KEN; LAM, DAVID; WENZEL, KEVIN W.
To: MKS INSTRUMENTS, INC.
Reel/Frame 045807/0061 →