X-ray tomography inspection systems and methods
An X-ray inspection system for scanning items is provided. The system includes: a stationary X-ray source extending around a rectangular scanning volume, and defining multiple source points from which X-rays can be directed through the scanning volume; an X-ray detector array also extending around the rectangular scanning volume and arranged to detect X-rays from the source points which have passed through the scanning volume; a conveyor arranged to convey the items through the scanning volume; and at least one processor for processing the detected X-rays to produce scanning images of the items.
1. An X-ray inspection system configured to scan an object, comprising:
a housing enclosing a scanning volume;
a conveyor to transport the object through the scanning volume for inspection;
a multi-focus X-ray source having a plurality of X-ray source points arranged in a non-circular geometry around the scanning volume, wherein field of views of each of said plurality of X-ray source points vary across said plurality of X-ray source points;
a first detector array positioned between the multi-focus X-ray source and the scanning volume, wherein said first detector array has a plurality of multi-energy detector modules arranged in a non-circular geometry around the scanning volume to detect X-rays transmitted through the object during scanning;
a second detector array positioned between the X-ray source and the scanning volume to detect X-rays diffracted from the object during scanning, wherein said second detector array comprises a plurality of energy dispersive detector modules located behind a plurality of associated collimators that are angled relative to the X-rays; and
at least one processor configured to simultaneously generate a tomographic transmission image using said X-rays transmitted through the object and a tomographic diffraction image using said X-rays diffracted from the object in order to identify a threat.
2. The X-ray inspection system of claim 1 , wherein said field of views range from approximately 60 degrees to 120 degrees.
3. The X-ray inspection system of claim 1 , wherein said collimators are angled at an angle ranging from 3 degrees to 10 degrees relative to a direction of the X-rays.
4. The X-ray inspection system of claim 1 , wherein a portion of at least one of said first and second detector arrays detect X-rays backscattered from the object, and wherein said at least one processor is further configured to generate a backscatter image of the object.
5. The X-ray inspection system of claim 4 , wherein at least one of said tomographic diffraction image or said backscatter image is used to clear or confirm the identified threat.
6. The X-ray inspection system of claim 1 , wherein the housing is substantially rectangular, and wherein the housing has a width ranging from 800 mm to 1400 mm and a height ranging from 600 mm to 1500 mm.
7. The X-ray inspection system of claim 1 , wherein the non-circular geometry of the plurality of X-ray source points is rectangular.
8. The X-ray inspection system of claim 1 , wherein the non-circular geometry of the plurality of multi-energy detector modules is rectangular.
9. The X-ray inspection system of claim 1 , wherein the scanning volume has a width ranging from 500 mm to 1050 mm and a height ranging from 300 mm to 1050 mm.
10. The X-ray inspection system of claim 1 , wherein each of the plurality of multi-energy detector modules is configured to allocate detected photons into one of 2 to 64 energy bins.
11. The X-ray inspection system of claim 1 , wherein the plurality of X-ray source points ranges from 64 to 2048 X-ray source points, wherein the plurality of X-ray source points are configured in a plurality of groups, and wherein each of the plurality of groups has 4 to 32 X-ray source points.
12. The X-ray inspection system of claim 11 , wherein each of the plurality of groups comprises eight X-ray source points.
13. The X-ray inspection system of claim 11 , further comprising a common insulating substrate configured to support each of the group of the plurality of groups.
14. The X-ray inspection system of claim 1 , wherein the conveyor is configured to have a speed ranging from 0.1 m/s to 1.0 m/s.
15. The X-ray inspection system of claim 1 , wherein each source point of the plurality of X-ray source points is configured to emit X-rays having a different beam angle.
16. The X-ray inspection system of claim 1 , wherein each source point of the plurality of X-ray source points is enclosed in one of a glass, metal, and ceramic envelope.
17. The X-ray inspection system of claim 1 , wherein each source point of the plurality of X-ray source points comprises an anode assembly comprising:
a target coupled with a high voltage power source;
one or more coupling blocks configured to account for a thermal expansion of the target; and
a shield electrode configured to protect the target and a power source from the X-rays.
18. The X-ray inspection system of claim 1 , wherein each source point of the plurality of X-ray source points comprises a cathode assembly comprising:
at least a grid;
a dispenser cathode;
a filament;
a primary focus electrode, wherein the at least a grid, dispenser electrode, filament, and primary focus electrode are in electrical communication with a printed circuit board; and
a secondary focus electrode configured to protect the cathode assembly from a flash of energy.