IP Library Granted Patent US 10,348,459
Granted Patent B2
US 10,348,459 · App. 15/962,829 · Granted Jul 9, 2019

Method and system for an optoelectronic built-in self-test system for silicon photonics optical transceivers

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Quick Facts
Patent No.
US 10,348,459
App. No.
15/962,829
Granted
Jul 9, 2019
Kind
B2
Abstract

Methods and systems for an optoelectronic built-in self-test (BIST) system for silicon photonics optical transceivers are disclosed and may include, in an optoelectronic transceiver having a transmit (Tx) path and a receive (Rx) path, where the Rx path includes a main Rx path and a BIST loopback path: generating a pseudo-random bit sequence (PRBS) signal, generating an optical signal in the Tx path by applying the PRBS signal to a modulator, communicating the optical signal to the BIST loopback path and converting to an electrical signal utilizing a photodetector, the photodetector being a replica of a photodetector in the main Rx path, and assessing the performance of the Tx and Rx paths by extracting a PRBS signal from the electrical signal. The transceiver may be a single complementary-metal oxide semiconductor (CMOS) die or in two CMOS die, where a first comprises electronic devices and a second comprises optical devices.

Claims (57)

1. A method for optical communication, the method comprising:

in an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path, the Rx path comprising a main Rx path and a built-in self-test loopback path:

generating a pseudo-random bit sequence (PRBS) signal in at least one of the one or more electronics die;

multiplexing the PRBS signal with an input electrical signal;

generating an optical signal in the Tx path by applying the multiplexed input electrical signal and PRBS signal to an optical modulator in the optoelectronics die;

communicating the optical signal to a portion of the built-in self-test loopback path in the optoelectronics die;

converting the optical signal to an electrical signal in the Rx path utilizing a loopback photodetector in the built-in self-test loopback path, the loopback photodetector being a replica of a photodetector in the main Rx path;

extracting, in the electronics die, the PRBS signal and the input electrical signal from the electrical signal; and

assessing performance of the Tx and Rx paths by reducing an input power of the optical signal in the Tx path while monitoring a bit error rate.

2. The method according to claim 1 , wherein the optoelectronics die comprises a silicon photonic interposer.

3. The method according to claim 1 , wherein the one or more electronics die comprises one or more complementary-metal oxide semiconductor (CMOS) die.

4. The method according to claim 1 , wherein the one or more electronics die is bonded directly to the optoelectronics die.

5. The method according to claim 4 , wherein the one or more electronics die is coupled to the optoelectronics die using copper pillars.

6. The method according to claim 1 , wherein the optical modulator comprises a Mach-Zehnder Interferometer.

7. The method according to claim 1 , wherein a transimpedance amplifier coupled to an output of the loopback photodetector in the self-test loopback path is a replica of a transimpedance amplifier coupled to an output of a photodetector in the main Rx path.

8. The method according to claim 1 , comprising extracting the PRBS signal and the input electrical signal from the electrical signal utilizing a demultiplexer in the Rx path.

9. The method according to claim 1 , comprising receiving a second optical signal in the main Rx path.

10. The method according to claim 9 , comprising generating a second electrical signal from the received second optical signal utilizing the photodetector in the main Rx path.

11. The method according to claim 10 , comprising multiplexing the electrical signal in the Rx path with the second electrical signal.

12. A system for communication, the system comprising:

an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path, the Rx path comprising a main Rx path and a built-in self-test loopback path, the optoelectronic transceiver being operable to:

generate a pseudo-random bit sequence (PRBS) signal in at least one of the one or more electronics die;

multiplexing the PRBS signal with an input electrical signal;

generate an optical signal in the Tx path by applying the multiplexed PRBS signal and input electrical signal to an optical modulator in the optoelectronics die;

communicate the optical signal to the built-in self-test loopback path in the optoelectronics die;

convert the optical signal to an electrical signal in the Rx path utilizing a loopback photodetector in the built-in self-test loopback path, the loopback photodetector being a replica of a photodetector in the main Rx path, wherein both photodetectors comprise SiGe and are integrated into the optoelectronics die; and

extract, in the electronics die, the PRBS signal and the input electrical signal from the electrical signal.

13. The system according to claim 12 , wherein the optoelectronic transceiver is in a silicon photonically-enabled integrated circuit.

14. The system according to claim 13 , wherein the silicon photonically-enabled integrated circuit is in a single complementary-metal oxide semiconductor (CMOS) die.

15. The system according to claim 13 , wherein the silicon photonically-enabled integrated circuit is in two die, a first die comprising electronic devices and a second die comprising optical devices.

16. The system according to claim 15 , wherein the two die comprise CMOS die.

17. The system according to claim 12 , wherein the optical modulator comprises a Mach-Zehnder Interferometer.

18. The system according to claim 12 , wherein a transimpedance amplifier coupled to an output of the loopback photodetector in the self-test loopback path is a replica of a transimpedance amplifier coupled to an output of a photodetector in the main Rx path.

19. The system according to claim 12 , wherein the optoelectronic transceiver is operable to extract the PRBS signal and the input electrical signal from the electrical signal utilizing a demultiplexer in the Rx path.

20. The system according to claim 12 , wherein the optoelectronic transceiver is operable to receive a second optical signal in the main Rx path.

21. The system according to claim 20 , wherein the optoelectronic transceiver is operable to generate a second electrical signal from the received second optical signal utilizing the photodetector in the main Rx path and multiplex the electrical with the second electrical signal.

22. A method for communication, the method comprising:

in an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path, the Rx path comprising a main Rx path and a built-in self-test loopback path:

generating a first electrical signal in the Tx path in at least one of the one or more electronics die;

generating a pseudo-random bit sequence (PRBS) signal in the at least one of the one or more electronics die;

multiplexing the first electrical signal with the PRBS signal in the at least one of the one or more electronics die;

generating a first optical signal in the Tx path by applying the multiplexed electrical and PRBS signals to an optical modulator in the optoelectronics die;

receiving a second optical signal in the Rx path and converting to a second electrical signal utilizing a photodetector in the main Rx path;

communicating the first optical signal to a portion of the built-in self-test loopback path in the optoelectronics die;

converting the first optical signal to a third electrical signal in the Rx path utilizing a loopback photodetector in the built-in self-test loopback path, the loopback photodetector being a replica of a photodetector in the main Rx path;

multiplexing the second and third electrical signals in the Rx path in the at least one of the one or more electronics die;

extracting, in the electronics die, the PRBS signal and the first electrical signal from the multiplexed second and third electrical signals; and

assessing performance of the Tx and Rx paths by reducing an input power of the optical signal in the Tx path while monitoring a bit error rate.

23. A method for communication, the method comprising:

in an optoelectronic transceiver on an optoelectronics die and one or more electronics die, the transceiver having a transmit (Tx) path and a receive (Rx) path:

generating a pseudo-random bit sequence (PRBS) signal in at least one of the one or more electronics die;

multiplexing the PRBS signal with an input electrical signal;

generating an optical signal in the Tx path by applying the multiplexed PRBS signal and input electrical signal to an optical modulator in the optoelectronics die;

communicating the optical signal to a portion of the Rx path in the optoelectronics die;

converting the optical signal to an electrical signal in the Rx path utilizing a photodetector in the optoelectronics die;

extracting, in the electronics die, the PRBS signal and the input electrical signal from the electrical signal; and

assessing performance of the Tx and Rx paths by reducing an input power of the optical signal in the Tx path while monitoring a bit error rate.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ASSIGNOR'S NAME PREVIOUSLY RECORDED AT REEL: 058979 FRAME: 0027. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 24, 2022
From: LUXTERA LLC
To: CISCO TECHNOLOGY, INC.
Reel/Frame 059496/0803 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2022
From: CISCO SYSTEMS, INC.
To: CISCO TECHNOLOGY, INC.
Reel/Frame 058979/0027 →
CHANGE OF NAME Recorded Feb 6, 2020
From: LUXTERA, INC.
To: LUXTERA LLC
Reel/Frame 052019/0811 →