Inverse T-shaped contact structures having air gap spacers
A method of fabricating air gap spacers is provided. The method includes forming gate structures to extend upwardly from a substrate with source or drain (S/D) regions disposed between the gate structures and with contact trenches defined above the S/D regions and between the gate structures. The method further includes disposing contacts in the contact trenches. The method also includes configuring the contacts to define open-ended air gap spacer trenches with the gate structures. In addition, the method includes forming a cap over the open-ended air gap spacer trenches to define the open-ended air gap spacer trenches as air gap spacers. The gate structures have an initial structure prior to and following the disposing and the configuring of the contacts and prior to and following the forming of the cap.
1. A method of fabricating air gap spacers, the method comprising:
forming gate structures to extend upwardly from a substrate with source or drain (S/D) regions disposed between the gate structures and with contact trenches defined above the S/D regions and between the gate structures;
disposing contacts in the contact trenches;
configuring the contacts to define open-ended air gap spacer trenches with the gate structures; and
forming a cap over the open-ended air gap spacer trenches to define the open-ended air gap spacer trenches as air gap spacers,
the gate structures having an initial structure prior to and following the disposing and the configuring of the contacts and prior to and following the forming of the cap,
wherein the configuring of the contacts comprises:
depositing an oxide, which is non-resistant to a liquid, over the gate structures and the S/D regions;
converting portions of the oxide at upper sections of the gate structures into a material, which is resistant to the liquid;
removing unconverted remainders of the oxide by exposure thereof to the liquid such that lower sections of the gate structures and the S/D regions are exposed and the portions of the oxide at the upper sections of the gate structures remain; and
lining the lower sections of the gate structures and the S/D regions and the portions of the oxide with a diffusion barrier, which serves as a barrier against diffusion of a conductive material.
2. A wafer fabrication method, comprising:
depositing an oxide, which is non-resistant to a liquid, over gate structures and source or drain (S/D) regions of a wafer;
converting portions of the oxide at upper sections of the gate structures into a material, which is resistant to the liquid;
removing unconverted remainders of the oxide by exposure thereof to the liquid such that lower sections of the gate structures and the S/D regions are exposed and the portions of the oxide at the upper sections of the gate structures remain; and
lining the lower sections of the gate structures and the S/D regions and the portions of the oxide with a diffusion barrier, which serves as a barrier against diffusion of a conductive material.
3. The wafer fabrication method according to claim 2 , further comprising:
executing a replacement metal gate process to form the gate structures to extend upwardly from a substrate; and
executing S/D epitaxy to form the S/D regions between the gate structures.
4. The wafer fabrication method according to claim 2 , wherein the oxide comprises germanium oxide (GeO 2 ) and the liquid comprises water.
5. The wafer fabrication method according to claim 4 , wherein the converting comprises angled ion implantation.
6. The wafer fabrication method according to claim 4 , wherein the removing comprises flushing the unconverted remainders with water.
7. The wafer fabrication method according to claim 2 , wherein the lining comprises diffusion barrier deposition.
8. The wafer fabrication method according to claim 2 , further comprising:
filling contact trenches partially bound by the diffusion barrier with the conductive material;
planarizing an upper surface of the conductive material, the diffusion barrier, the material, which is resistant to the liquid, and the gate structures;
removing the material, which is resistant to the liquid, without damaging the gate structures to define open-ended air gap spacer trenches; and
forming a cap over the upper surface of the conductive material, the diffusion barrier, the open-ended air gap spacer trenches and the gate structures to define the open-ended air gap spacer regions as air gap spacers.
9. The wafer fabrication method according to claim 8 , wherein the removing comprises at least one of an ultrasonic liquid wash and exposure to an acidic solution.
10. The wafer fabrication method according to claim 8 , wherein the air gap spacers are between the diffusion barrier and the gate structures in a horizontal dimension and between the diffusion barrier and the cap in a vertical dimension.