Method and apparatus for identifying and reporting faults at an information handling system
A method includes invoking, by an embedded controller at an information handling system, a test procedure to evaluate functionality of motherboard resources at the information handling system. A result of the test procedure is displayed at a primary display device using a built in self test function incorporated at the primary display device.
1. An information handling system comprising:
a central processor;
a non-volatile firmware memory to store instructions executable by the central processor;
a video graphics array (VGA) device controller;
a primary display device coupled to an output of the VGA device controller; and
an embedded controller, the embedded controller to:
invoke a test procedure to evaluate functionality of motherboard resources at the information handling system; and
provide an indication of a result of the test procedure at the primary display device using a built in self test function incorporated at the primary display device, the embedded controller to:
initiate the built in self test;
enable a back light at the primary display device at a first time if the result of the test procedure indicates a failure; and
enable the back light at the primary display device at a second time if the result of the test procedure does not indicate the failure.
2. The information handling system of claim 1 , wherein the test procedure comprises measuring a temperature at the central processor.
3. The information handling system of claim 1 , wherein the test procedure includes validation of static firmware included at a non-volatile firmware memory device.
4. The information handling system of claim 3 , wherein validation of the static firmware comprises:
the embedded controller to determine a checksum of initial boot block instructions; and
compare the checksum with a predetermined value stored at the information handling system.
5. The information handling system of claim 4 , wherein the predetermined value is stored at the non-volatile firmware memory device.
6. The information handling system of claim 3 , wherein validation of the static firmware comprises:
the embedded controller to determine a checksum of primary basic input output system firmware instructions; and
compare the checksum with a predetermined value stored at the information handling system.
7. The information handling system of claim 1 , wherein the test procedure comprises:
the embedded controller to set a flag indicating that a next boot of the information handling system is to invoke a motherboard built in self test;
initiate a boot of the information handling system; and
receive an indication of a result of the motherboard built in self test.
8. The information handling system of claim 7 , where in the motherboard built in self test is configured to verify operation of devices permanently attached to the motherboard.
9. The information handling system of claim 1 , wherein:
enabling the back light at the first time is to display a first color; and
enabling the back light at the second time is to display a second color, the second color different than the first color.
10. A method comprising:
invoking, by an embedded controller at an information handling system, a test procedure to evaluate functionality of motherboard resources at the information handling system; and
providing, by the embedded controller, an indication of a result of the test procedure at a primary display device using a built in self test function incorporated at the primary display device, the primary display coupled to an output of a video graphics array device controller, the providing including:
initiating the built in self test;
enabling a back light at the display at a first time if the result of the test procedure indicates a failure; and
enabling the back light at the primary display device at a second time if the result of the test procedure does not indicate the failure.
11. The method of claim 10 , wherein the test procedure comprises measuring a temperature at a primary central processing unit included at the information handling system.
12. The method of claim 10 , wherein the test procedure includes validating static firmware included at a non-volatile firmware memory device.
13. The method of claim 12 , wherein validation of the static firmware comprises:
determining a checksum of initial boot block instructions; and
comparing the checksum with a predetermined value stored at the information handling system.
14. The method of claim 13 , wherein the predetermined value is stored at the non-volatile firmware memory device.
15. The method of claim 12 , wherein validation of the static firmware comprises:
determining a checksum of primary basic input output system firmware instructions; and
comparing the checksum with a predetermined value stored at the information handling system.
16. The method of claim 10 , wherein the test procedure includes:
setting, by the embedded controller, a flag indicating that a next boot of the information handling system is to invoke a motherboard built in self test;
initiating a boot of the information handling system; and
providing an indication of a result of the motherboard built in self test to the embedded controller.
17. The method of claim 16 , where in the motherboard built in self test is configured to verify operation of devices permanently attached to the motherboard.
18. The method of claim 10 , wherein:
enabling the back light at the first time is to display a first color; and
enabling the back light at the second time is to display a second color, the second color different than the first color.
19. A method comprising:
invoking, by an embedded controller at an information handling system, a test procedure to evaluate functionality of motherboard resources at the information handling system;
initiating a built in self test function at a primary display device at the information handling system, the primary display coupled to an output of a video graphics array device controller;
enabling a back light at the display at a first time if the result of the test procedure indicates a failure; and
enabling the back light at the display at a second time if the result of the test procedure does not indicate the failure.
20. The method of claim 19 , wherein the test procedure comprises:
measuring a temperature at a primary central processing unit included at the information handling system; and
validating static firmware included at a non-volatile firmware memory device.