IP Library › Patent Application 16020345
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App. No. 16/020,345 · Confirmation No. 3145

METHOD FOR PROCESSING A SEMICONDUCTOR WAFER USING NON-CONTACT ELECTRICAL MEASUREMENTS INDICATIVE OF AT LEAST ONE TIP-TO-SIDE SHORT OR LEAKAGE, AT LEAST ONE SIDE-TO-SIDE SHORT OR LEAKAGE, AND AT LEAST ONE VIA-CHAMFER SHORT OR LEAKAGE, WHERE SUCH MEASUREMENTS ARE OBT

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Abandoned -- Failure to Pay Issue Fee
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Quick Facts
App. No.
16/020,345
Filed
2018-06-27
Examiner
HA, NATHAN W
Art Unit
2814