Protection circuit against short circuits of switching device for SiC or GaN MOSFET transistor and associated method
The invention relates to a power switching device having at least one transistor of the SiC or GaN MOSFET type able to be traveled by a main current. The power switching device has at least one measuring module configured to indirectly measure the main current of the transistor from the electromagnetic field produced by the transistor and at least one protection circuit configured to detect a short-circuit based on the sign of the temporal drift of the main current.
1. A power switching device comprising at least one transistor of the SiC or GaN MOSFET type traveled by a main current;
wherein the switching device comprises at least one measuring module configured to indirectly measure the main current of the transistor from an electromagnetic field produced by the transistor and at least one protection circuit configured to detect a short-circuit based on a sign of a temporal drift of the main current;
wherein the measuring module comprises an antenna galvanically isolated from the transistor; and
wherein the antenna is located in a circuit, the center of which is the transistor and the radius of which is comprised between 1 mm and 10 cm.
2. The switching device according to claim 1 , wherein the switching device comprises multiple transistors.
3. The switching device according to claim 2 , wherein the switching device comprises as many measuring modules as transistors, each transistor being associated with a separate measuring module, each measuring module being configured to measure the main current traveling the transistor with which it is associated.
4. The switching device according to claim 3 , wherein each measuring module is electromagnetically isolated from at least one electromagnetic field other than that produced by the transistor with which it is associated.
5. The switching device according to claim 4 , wherein each measuring module and its associated transistor are arranged in a Faraday cage.
6. The switching device according to claim 2 , wherein each transistor is associated with an observation window for the sign of the temporal drift of the main current traveling it, the observation window triggered simultaneously with switching of the transistor from an off state to an on state, the observation windows being separate from one another.
7. The switching device according to claim 2 , wherein the switching device comprises a single measuring module configured to measure the main current traveling each transistor.
8. The switching device according to claim 7 , wherein each transistor is associated with an observation window for the sign of the temporal drift of the main current traveling it, the observation window triggered simultaneously with switching of the transistor from an off state to an on state, the observation windows being separate from one another.