Trench capacitor with warpage reduction
A trench capacitor includes a plurality of trenches in a doped semiconductor surface layer of a substrate. At least one dielectric layer lines a surface of the plurality of trenches. A second polysilicon layer that is doped is on a first polysilicon layer that is on the dielectric layer which fills the plurality of trenches. The second polysilicon layer has a higher doping level as compared to the first polysilicon layer.
1. A method for forming a trench capacitor, comprising:
forming a plurality of trenches in a doped semiconductor surface layer of a substrate;
forming a dielectric layer that lines a surface of the plurality of trenches;
depositing a first polysilicon layer that is undoped on the dielectric layer;
depositing a second polysilicon layer on the first undoped polysilicon layer to fill the plurality of deep trenches;
doping the second polysilicon layer;
top side polysilicon etching using a masking layer pattern to etch back the first polysilicon layer in regions lateral to the plurality of trenches; and
further comprising after the depositing the second polysilicon layer removing the first polysilicon layer and the second polysilicon layer from a back side of the substrate.
2. The method of claim 1 , wherein both the depositing the second polysilicon layer and the doping of the second polysilicon layer are provided in an in-situ doped polysilicon deposition process.
3. The method of claim 1 , wherein forming the dielectric layer comprises growing a thermal oxide layer.
4. The method of claim 1 , further comprising after the removing the first polysilicon layer and the second polysilicon layer from a back side of the substrate, depositing a dielectric capping layer over the back side of the substrate, annealing the first and second polysilicon layers at a temperature in a range between 900° C. and 1050° C., removing the dielectric capping layer, and partial top side etching of the second polysilicon layer on the first polysilicon layer before the top side polysilicon etching.
5. The method of claim 1 , wherein the doped semiconductor surface layer is part of a bulk substrate material that includes a plurality of the trench capacitors.
6. The method of claim 1 , further comprising depositing a back side metal layer on the back side of the substrate.
7. The method of claim 1 , wherein a depth of the plurality of trenches is 10 to 50 μm.
8. A method for forming a trench capacitor, comprising:
forming a plurality of trenches in a doped semiconductor surface layer of a substrate;
forming a dielectric layer that lines a surface of the plurality of trenches;
depositing a first polysilicon layer that is undoped on the dielectric layer;
depositing a second polysilicon layer over the first undoped polysilicon layer to fill the plurality of deep trenches;
doping the second polysilicon layer; and
top side polysilicon etching using a masking layer pattern to etch back the first polysilicon layer in regions lateral to the plurality of trenches.
9. The method of claim 8 , wherein both the depositing the second polysilicon layer and the doping of the second polysilicon layer are provided in an in-situ doped polysilicon deposition process.
10. The method of claim 8 , wherein forming the dielectric layer comprises growing a thermal oxide layer.
11. The method of claim 8 , further comprising after the depositing the second polysilicon layer removing the first polysilicon layer and the second polysilicon layer from a back side of the substrate.
12. The method of claim 11 , further comprising after the removing the first polysilicon layer and the second polysilicon layer from a back side of the substrate, depositing a dielectric capping layer over the back side of the substrate, annealing the first and second polysilicon layers at a temperature in a range between about 900° C. and about 1050° C., removing the dielectric capping layer, and partial top side etching of the second polysilicon layer on the first polysilicon layer before the top side polysilicon etching.
13. The method of claim 11 , further comprising depositing a back side metal layer on the back side of the substrate after the removing.
14. The method of claim 8 , wherein a depth of the plurality of trenches is within a range between about 10 μm and about 50 μm.
15. A method for forming a trench capacitor, comprising:
forming a plurality of trenches in a doped semiconductor surface layer of a substrate;
forming a dielectric layer that lines a surface of the plurality of trenches;
forming an undoped first polysilicon layer over the dielectric layer and over a back side of the substrate;
forming a doped second polysilicon layer over the undoped first polysilicon layer within the trenches and over the back side of the substrate;
removing the first and second polysilicon layers from over the surface layer, leaving a remaining portion of the second polysilicon layer within each trench and a remaining portion of the first polysilicon layer that electrically connects the remaining portions of the second polysilicon layer within the trenches; and
removing the first and second polysilicon layers from over the substrate back side.
16. The method of claim 15 , wherein the first polysilicon layer is undoped when the second polysilicon layer is formed, and further comprising doping the second polysilicon layer.
17. The method of claim 16 , wherein the second polysilicon layer is doped in-situ during formation.
18. The method of claim 15 , further comprising forming a silicon oxide cap layer over the back side after removing the first and second polysilicon layers from over the substrate back side.
19. The method of claim 18 , further comprising thermally annealing the first polysilicon layer and the second polysilicon layer after forming the cap layer.
20. The method of claim 18 , further comprising forming a first metallic connection to the remaining portion of the first polysilicon layer, and forming a second metallic connection to the doped semiconductor surface layer.