Calibration for an optical device

1. A device, comprising:

a plurality of interferometers,

the plurality of interferometers including:

a parent interferometer,

a first child interferometer coupled to a first branch of the parent interferometer, and

a second child interferometer coupled to a second branch of the parent interferometer; and

wherein at least one of the plurality of interferometers is calibrated by causing phase output of the first branch to be collinear with phase output of the second branch and using perturbation signals, and

wherein a first interferometer, of the plurality of interferometers, and a second interferometer, of the plurality of interferometers, are configured to be calibrated using a first error function and a second error function generated based on a common measurement of the plurality of interferometers.

2. The device of claim 1 , wherein the phase output of the first branch is collinear with the phase output of the second branch when an optical field vector of the phase output of the first branch is associated with a same phase angle as an optical field vector of the phase output of the second branch.

3. The device of claim 1 , wherein the first interferometer and the second interferometer are configured to be calibrated concurrently.

4. The device of claim 1 , wherein the perturbation signals include at least one of: an analog dithering signal or a digital dithering signal.

5. The device of claim 1 , wherein the perturbation signals include at least one of: a time-domain varying dithering signal, a phase-domain varying dithering signal, or a voltage-domain varying dithering signal.

6. The device of claim 1 , wherein the at least one of the plurality of interferometers is calibrated using a plurality of measurements of the perturbation signals, and

wherein the plurality of measurements are associated with a configured voltage spacing.

7. A combined interferometer, comprising:

a parent interferometer, a first child interferometer, and a second child interferometer forming a combined interferometer structure; and

one or more components to:

apply, concurrently, a first perturbation signal to the first child interferometer and a second perturbation signal to the second child interferometer,

wherein the first perturbation signal is orthogonal to the second perturbation signal;

determine values for an error function based on a third output of the combined interferometer structure based on applying the first perturbation signal and the second perturbation signal; and

selectively adjust a phase of the combined interferometer based on the values for the error function to align a phase output of the first child interferometer with a phase output of the second child interferometer to achieve collinearity of phase to calibrate the combined interferometer.

8. The combined interferometer of claim 7 , wherein the first child interferometer includes a first arm and a second arm and the first arm includes a third child interferometer and the second arm includes a fourth child interferometer, and

wherein the second child interferometer includes another first arm and another second arm and the other first arm includes a fifth child interferometer and the other second arm includes a sixth child interferometer.

9. The combined interferometer of claim 7 , wherein an optical power of the combined interferometer is greater than a threshold optical power.

10. The combined interferometer of claim 7 , wherein the one or more components are configured to determine a null or a maximum for the combined interferometer to calibrate the combined interferometer.

11. The combined interferometer of claim 7 , wherein the first perturbation signal and the second perturbation signal are offline dither tones.

12. The combined interferometer of claim 7 , wherein the values for the error function correspond to one or more measurements of the third output of the combined interferometer.

13. The combined interferometer of claim 7 , wherein the values for the error function correspond to a particular quantity of measurements of the third output of the combined interferometer,

wherein the particular quantity is a plurality of measurements.

14. The combined interferometer of claim 7 , wherein the first child interferometer and the second child interferometer have a relative phase applied, and

wherein the relative phase is calibrated for the combined interferometer.

15. The combined interferometer of claim 7 , wherein the first child interferometer and the second child interferometer have a relative voltage applied, and

wherein the relative voltage is calibrated for the combined interferometer.

16. The combined interferometer of claim 7 , wherein the one or more components adjust a parent interferometer voltage differential concurrently with adjusting at least one of a first child interferometer voltage differential or a second child interferometer voltage differential to maintain the collinearity.

17. A method comprising:

applying, by a device, a first perturbation signal to an in-phase (I) child interferometer and a second perturbation signal to a quadrature (Q) child interferometer while maintaining collinearity of phase of a phase output of the I child interferometer and a phase output of the Q child interferometer,

wherein the I child interferometer forms a first branch of a parent interferometer and the Q child interferometer forms a second branch of the parent interferometer;

wherein the first perturbation signal is orthogonal to the second perturbation signal;

determining, by the device, values for an error function based on a phase output of the parent interferometer and based on applying the first perturbation signal and the second perturbation signal; and

selectively adjusting, by the device, a characteristic relating to at least one perturbation signal of the first perturbation signal, the second perturbation signal, or a third perturbation signal for the parent interferometer based on the values for the error function to calibrate the I child interferometer and the Q child interferometer.

18. The method of claim 17 , wherein the first perturbation signal and the second perturbation signal are applied offline.

19. The method of claim 17 , further comprising:

adjusting a voltage of at least one parent electrode of the parent interferometer to maintain collinearity of phase of the phase output of the I child interferometer and the phase output of the Q child interferometer.

20. The method of claim 17 , wherein the parent interferometer is coupled to more than two child interferometers, and

wherein the characteristic is selectively adjusted to calibrate the more than two child interferometers.