IP Library Granted Patent US 11,035,937
Granted Patent B2
US 11,035,937 · App. 16/066,404 · Granted Jun 15, 2021

Intrinsic static noise characterization and removal

Inventors: Samuel Gidel (Quebec, CA); Vincent Simard-Bilodeau (Quebec, CA)
Assignee: LEDDARTECH INC.
G01S7/497G01C3/08G01S7/4876G01S7/4913G01S17/04G01S17/10
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Quick Facts
Patent No.
US 11,035,937
App. No.
16/066,404
Granted
Jun 15, 2021
Kind
B2
Abstract

A computer-implemented method and a system for at least partially removing intrinsic static noise from data obtained by an optical time-of-flight sensor using full-waveform analysis. The method includes receiving a plurality of calibration traces, the calibration traces being obtained in a controlled environment wherein no object is present in a field of view of the optical time-of-flight sensor; determining a noise template using the calibration traces by performing a statistical analysis on the calibration traces to determine a shape and an amplitude of the intrinsic static noise in the calibration traces; receiving a normal operation trace, the normal operation trace being obtained in an uncontrolled environment wherein a presence of the object in the field of view is unknown; subtracting the noise template from the normal operation trace, obtaining and outputting a denoised signal.

Claims (47)

1. A computer-implemented method for at least partially removing intrinsic static noise from data obtained by an optical time-of-flight sensor using full-waveform analysis, said intrinsic static noise being caused by electrical and/or optical interference produced by components of the optical time-of-flight sensor, said computer-implemented method comprising use of at least one processing unit for:

receiving a plurality of calibration full-waveform traces from the optical time-of-flight sensor, the calibration full-waveform traces being obtained in a controlled environment wherein no object is present in a field of view of the optical time-of-flight sensor;

determining a noise template using the calibration full-waveform traces by performing a statistical analysis on the calibration full-waveform traces to determine a shape and an amplitude of said intrinsic static noise in said calibration full-waveform traces;

receiving a normal operation full-waveform trace from the optical time-of-flight sensor, the normal operation full-waveform trace being obtained in an uncontrolled environment wherein a presence of said object in said field of view is unknown;

subtracting the noise template from the normal operation full-waveform trace, thereby obtaining a denoised signal; and

outputting the denoised signal.

2. The computer-implemented method of claim 1 , wherein in said controlled environment, the field of view of the optical time-of-flight sensor is obstructed to prevent light from being incident on the optical time-of-flight sensor.

3. The computer-implemented method of claim 1 , wherein said statistical analysis includes modeling said intrinsic static noise by a series of Gaussian functions representing a mean and a variance of each sample of the calibration full-waveform traces.

4. The computer-implemented method of claim 1 , further comprising determining a base of said noise template and adjusting said denoised signal using said base.

5. The computer-implemented method of claim 1 , further comprising:

comparing said normal operation full-waveform trace to said noise template to determine that no object is present in said uncontrolled environment during a reference time period; and

updating the noise template using said normal operation full-waveform trace.

6. The computer-implemented method of claim 1 , wherein said intrinsic static noise varies according to an operation mode of said optical time-of-flight sensor, said method further comprising:

receiving a plurality of alternate calibration full-waveform traces, said alternate calibration full-waveform traces being obtained in an alternate environment, wherein said optical time-of-flight sensor is in an alternate operation mode and wherein no object is present in said field of view of the optical time-of-flight sensor;

carrying out said step of determining said noise template to determine an alternate noise template using said alternate calibration full-waveform traces;

receiving an indication that said sensor is in said alternate operation mode in said uncontrolled environment; and

subtracting the alternate noise template from the normal operation full-waveform trace, thereby obtaining a denoised alternate signal.

7. A system for at least partially removing intrinsic static noise from data obtained by an optical time-of-flight sensor using full-waveform analysis, said intrinsic static noise being caused by electrical and/or optical interference produced by components of the optical time-of-flight sensor, said system comprising:

a template generator for:

receiving a plurality of calibration full-waveform traces from the optical time-of-flight sensor, the calibration full-waveform traces being obtained in a controlled environment wherein no object is present in a field of view of the optical time-of-flight sensor; and

determining a noise template using the calibration full-waveform traces by performing a statistical analysis on the calibration full-waveform traces to determine a shape and an amplitude of said intrinsic static noise in said calibration full-waveform traces; and

a denoising unit for

receiving a normal operation full-waveform trace from the optical time-of-flight sensor, the normal operation full-waveform trace being obtained in an uncontrolled environment wherein a presence of said object in said field of view is unknown;

subtracting the noise template from the normal operation full-waveform trace, thereby obtaining a denoised signal; and

outputting the denoised signal;

wherein said template generator and said denoising unit are provided by at least one processing unit.

8. The system of claim 7 , wherein in said controlled environment, the field of view of the optical time-of-flight sensor is obstructed to prevent light from being incident on the optical time-of-flight sensor.

9. The system of claim 7 , wherein said template generator is further adapted to model said intrinsic static noise by a series of Gaussian functions representing a mean and a variance of each sample of the calibration full-waveform traces.

10. The system of claim 7 , wherein said template generator is further adapted to determine a base of said noise template and wherein said denoising unit is further adapted to adjust said denoised signal using said base.

11. The system of claim 7 , wherein said template generator is further adapted to

compare said normal operation full-waveform trace to said noise template to determine that no object is present in said uncontrolled environment during a reference time period; and

update the noise template using said normal operation full-waveform trace.

12. The system of claim 7 , wherein said intrinsic static noise varies according to an operation mode of said optical time-of-flight sensor;

further comprising an operation mode identifier for

providing operation mode identifier data, said operation mode identifier data including an indication that said sensor is in said alternate operation mode in said uncontrolled environment;

wherein said template generator is adapted for

receiving a plurality of alternate calibration full-waveform traces, said alternate calibration full-waveform traces being obtained in an alternate environment, wherein said optical time-of-flight sensor is in said alternate operation mode and wherein no object is present in said field of view of the optical time-of-flight sensor; and

carrying out said step of determining said noise template to determine an alternate noise template using said alternate calibration full-waveform traces; and

wherein said denoising unit is adapted for

receiving said indication that said sensor is in said alternate operation mode in said uncontrolled environment; and

subtracting the alternate noise template from the normal operation full-waveform trace, thereby obtaining a denoised alternate signal.

13. A computer program product for at least partially removing intrinsic static noise from data obtained by an optical time-of-flight sensor using full-waveform analysis, said intrinsic static noise being caused by electrical and/or optical interference produced by components of the optical time-of-flight sensor, the computer program product comprising a computer readable memory storing computer executable instructions thereon that when executed by a processor perform the method steps of:

receiving a plurality of calibration full-waveform traces from the optical time-of-flight sensor, the calibration full-waveform traces being obtained in a controlled environment wherein no object is present in a field of view of the optical time-of-flight sensor;

determining a noise template using the calibration full-waveform traces by performing a statistical analysis on the calibration full-waveform traces to determine a shape and an amplitude of said intrinsic static noise in said calibration full-waveform traces;

receiving a normal operation full-waveform trace from the optical time-of-flight sensor, the normal operation full-waveform trace being obtained in an uncontrolled environment wherein a presence of said object in said field of view is unknown;

subtracting the noise template from the normal operation full-waveform trace, thereby obtaining a denoised signal; and

outputting the denoised signal.

Assignments (6)
SECURITY INTEREST Recorded Jun 15, 2023
From: LEDDARTECH INC.
To: TSX TRUST COMPANY
Reel/Frame 063965/0233 →
SECURITY INTEREST Recorded Apr 13, 2023
From: LEDDARTECH INC.
To: FÉDÉRATION DES CAISSES DESJARDINS DU QUÉBEC
Reel/Frame 063316/0716 →
SECURITY INTEREST Recorded Feb 12, 2021
From: LEDDARTECH INC.
To: INVESTISSEMENT QUÉBEC
Reel/Frame 055244/0208 →
SECURITY CONFIRMATION AGREEMENT Recorded Oct 5, 2020
From: LEDDARTECH INC.
To: FEDERATION DES CAISSES DESJARDINS DU QUEBEC
Reel/Frame 053980/0942 →
SECURITY INTEREST Recorded Feb 4, 2020
From: LEDDARTECH INC.
To: INVESTISSEMENT QUÉBEC
Reel/Frame 051713/0622 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 3, 2018
From: GIDEL, SAMUEL; SIMARD-BILODEAU, VINCENT
To: LEDDARTECH INC.
Reel/Frame 046262/0334 →
Continuity (2)
Provisional Application 62271727 · Dec 28, 2015
Related Publication 20190011543A1 · Jan 10, 2019