Inspecting method, inspection system, and manufacturing method
View Patent ↗The inspecting method is for a product including a transparent substrate and a part placed at a predetermined position within a front surface of the transparent substrate, and includes an imaging step and an evaluating step. The imaging step is a step of taking an image of the front surface by an imaging device with the front surface being illuminated by an illuminating device. The evaluating step is a step of evaluating a degree of matching between an image which is derived from the image (P 10 ) taken by the imaging device and shows a position corresponding to the predetermined position and its vicinity, and a template. The template is indicative of a positional relationship between a real image and a virtual image, of the part in a case where the part is placed at the predetermined position correctly.
1. An inspecting method for a product including a transparent substrate and a part placed at a predetermined position within a front surface of the transparent substrate,
the method comprising:
an imaging step of taking an image of the front surface by an imaging device with the front surface being illuminated by an illuminating device; and
an evaluating step of evaluating a degree of matching between an image which is derived from the image taken by the imaging device and represents a position corresponding to the predetermined position and its vicinity, and a template, the template being indicative of a positional relationship between a real image and a virtual image, of the part in a case where the part is placed at the predetermined position correctly, and
a determining step of determining, when the degree of matching is equal to or larger than a predetermined threshold, that the part is placed at the predetermined position without being broken, and of determining, when the degree of matching is smaller than the predetermined threshold, that the part is not placed at the predetermined position or broken.
2. The inspecting method according to claim 1 , wherein the imaging step includes arranging the illuminating device and the imaging device to allow the imaging device to receive light which is part of light from the illuminating device and specularly reflected from the front surface.
3. The inspecting method according to claim 1 , wherein the imaging step includes removing, with one or more polarization filters, from light to be received by the imaging device, reflected light due to an object present on or over a rear surface of the transparent substrate.
4. An inspection system for a product including a transparent substrate and a part placed at a predetermined position within a front surface of the transparent substrate,
the system comprising:
an illuminating device configured to emit light to the front surface;
an imaging device configured to take an image of the front surface; and
a processing device configured to perform an inspecting method,
the method comprising:
an imaging step of taking an image of the front surface by an imaging device with the front surface being illuminated by an illuminating device; and
an evaluating step of evaluating a degree of matching between an image which is derived from the image taken by the imaging device and represents a position corresponding to the predetermined position and its vicinity, and a template,
the template being indicative of a positional relationship between a real image and a virtual image, of the part in a case where the part is placed at the predetermined position correctly,
wherein the processing device is configured to:
when the degree of matching is equal to or larger than a predetermined threshold, determine that the part is placed at the predetermined position without being broken; and
when the degree of matching is smaller than the predetermined threshold, determine that the part is not placed at the predetermined position or broken.
5. The inspection system according to claim 4 , wherein the illuminating device and the imaging device are arranged to allow the imaging device to receive light which is part of light from the illuminating device and specularly reflected from the front surface.
6. The inspection system according to claim 4 , further comprising one or more polarization filters for removing, from light to be received by the imaging device, reflected light due to an object present on or over a rear surface of the transparent substrate.
7. A manufacturing method for a product including a transparent substrate and a part placed at a predetermined position within a front surface of the transparent substrate,
the method comprising:
a step of performing a forming process of forming the part at the predetermined position within the front surface of the transparent substrate;
a step of performing inspection of the product by the inspecting method according to claim 1 ;
a step of performing the forming process again when a result of the inspection indicates failure.