Systems and methods for controlling semiconductor device wear

1. An electrical system, comprising:

toggling circuitry configured to generate a first negative-bias temperature instability (NBTI) control signal configured to be transmitted through a first circuit path;

a delay element configured to generate a second NBTI control signal based at least in part on the first NBTI control signal and configured to be transmitted through a second circuit path;

a latch, wherein toggling of the latch is based at least in part on the first NBTI control signal and the second NBTI control signal to propagate an NBTI state of the electrical system; and

an OR gate of the first circuit path that is configured to transmit an output that is an OR of the first NBTI control signal and a clock signal.

2. The electrical system of claim 1 , wherein the electrical system comprises a controller configured to cause the generation of the first NBTI control signal in response to at least a portion of the electrical system entering an NBTI toggling mode.

3. The electrical system of claim 1 , comprising a semiconductor memory device that comprises the toggling circuitry and the latch.

4. The electrical system of claim 1 , wherein the latch comprises a clock input pin and a data input pin.

5. The electrical system of claim 4 , wherein the latch is configured to receive the first NBTI control signal at the clock input pin.

6. The electrical system of claim 4 , wherein the latch is configured to receive the second NBTI control signal at the data input pin.

7. The electrical system of claim 4 , wherein exiting an NBTI toggling mode comprises simultaneously removing the first NBTI control signal at the clock input pin and removing the second NBTI control signal at the data input pin.

8. The electrical system of claim 1 , wherein generation of the second NBTI control signal comprises delaying the first NBTI control signal using the delay element after the first NBTI control signal has passed through the first circuit path.

9. The electrical system of claim 1 , wherein the latch comprises a set pin and a reset pin.

10. The electrical system of claim 1 , comprising an OR gate of the second circuit path that is configured to transmit an output that is an OR of the second NBTI control signal and a data signal.

11. The electrical system of claim 1 , comprising a downstream latch configured to propagate an NBTI state of the electrical system by receiving a control signal based at least in part on the second NBTI control signal at a set pin of the downstream latch, at a reset pin of the downstream latch, or a combination thereof.

12. A method for operating a negative-bias temperature instability (NBTI) toggling mode, comprising:

receiving a first NBTI control signal to increase uniformity of wear of an electrical device in a default low-power state during NBTI toggling mode;

receiving a second NBTI control signal based at least in part on the first NBTI control signal;

asserting the first NBTI control signal at a clock input pin of a latch;

asserting the second NBTI control signal at a data input pin of the latch; and

toggling electrical elements downstream of the latch based at least in part on an output of the latch based on the first and second NBTI control signals.

13. The method of claim 12 , wherein receiving the second NBTI control signal comprises:

delaying the first NBTI control signal using a delay element of the electrical device in response to the first NBTI control signal traversing a portion of the electrical device.

14. The method of claim 12 , wherein toggling electrical elements downstream of the latch comprises asserting a set signal at a set pin of the electrical elements downstream of the latch, a reset signal at a reset pin of the electrical elements downstream of the latch, or a combination thereof.

15. The method of claim 12 comprising, exiting the NBTI toggling mode by:

de-asserting a set signal at a set pin of the latch or a reset signal at a reset pin of the latch;

after de-asserting the set signal or the reset signal, de-asserting the second NBTI control signal from the data input pin; and

after de-asserting the second NBTI control signal, de-asserting the first NBTI control signal from the clock input pin.

16. An electronic device, comprising:

a first circuit path;

a second circuit path; and

a latch configured to:

receive a first negative-bias temperature instability (NBTI) control signal at a clock pin of the latch via the first circuit path; and

receive a second NBTI control signal at a data pin of the latch via the second circuit path, wherein the second NBTI control signal is based at least in part on the first NBTI control signal, wherein the first NBTI control signal and the second NBTI control signal are configured to toggle an output of the latch.

17. The electronic device of claim 16 , comprising a delay element, wherein generating the second NBTI control signal comprises delaying the first NBTI control signal using the delay element after the first NBTI control signal passing through the circuit path.

18. The electronic device of claim 16 , comprising a delay element, wherein generating the second NBTI control signal comprises delaying the first NBTI control signal using the delay element before the first NBTI control signal passing through the circuit path.

19. The electronic device of claim 16 , comprising a controller configured to generate the first NBTI control signal and the second NBTI control signal.