System and method for detecting a condition of a seal
A seal analysis system for measuring and analyzing a seal and a mating hardware configured to detect a defect and to analyze a condition of at least one of the seal and the mating hardware and includes a sensor and an electrical processing circuit. The sensor may be in a form of an optical inspection device, a laser scanner, a phone, or an ultrasound scanner. Additionally, the sensor may be provided to take a photo or video. The electrical processing circuit may be built in to the sensor or it may be a separate unit configured to communicate with the sensor. The electrical processing circuit may be configured to compare a condition of a seal and/or mating hardware against pre-set criteria.
1. A seal analysis system, comprising:
a seal analysis device having a scanning sensor configured for measuring and analyzing at least one of a seal and a mating hardware, a surface of the seal being in contact with a surface of the mating hardware, the seal being movable relative to the mating hardware, the scanning sensor being configured to capture at least one of a photo or a video of the seal; and
an electrical processing circuit configured to operably communicate with the sensor, the sensor and the electrical processing circuit being configured to detect and analyze at least one undesirable characteristic of at least one of the seal or the mating hardware.
2. The seal analysis system of claim 1 , wherein the undesirable characteristic includes at least one of a crack, a scratch, a chip, an expansion, a depression, and a flaw.
3. The seal analysis system of claim 1 , wherein the undesirable characteristic includes at least one of a bar code, a QR code, and a mark.
4. The seal analysis system of claim 1 , wherein the undesirable characteristic is located at least one of on a surface and at an internal location.
5. The seal analysis system of claim 1 , wherein the seal analysis device is at least one of an optical inspection device, a laser scanner, a phone, and an ultrasound scanner.
6. The seal analysis system of claim 1 , wherein the seal analysis device is a portable device or a stationary device.
7. The seal analysis system of claim 6 , wherein the portable device is a three-dimensional laser scanner.
8. The seal analysis system of claim 1 , wherein the electrical processing circuit operably communicates with the seal analysis device via a wired connection or a wireless connection.
9. The seal analysis system of claim 1 , wherein the electrical processing circuit is configured to compare an undesirable characteristic against a pre-set criteria.
10. The seal analysis system of claim 9 , wherein the pre-set criteria includes tolerance levels regarding a shape, a color or a sheen of a surface, a depth of a defect, or a perimeter of the defect of at least one of the seal and the mounting hardware.
11. The seal analysis system of claim 9 , wherein the electrical processing circuit is integral to the seal analysis device.
12. A seal analysis device, comprising:
a scanning sensor configured for measuring and analyzing a seal and a mating hardware, a surface of the seal being in movable contact with a surface of the mating hardware, the scanning sensor being configured to capture at least one of a photo or a video of the seal; and
an electrical processing circuit configured to operably communicate with the scanning sensor, the scanning sensor and the electrical processing circuit in a configuration to detect a undesirable characteristic and to analyze a condition of at least one of the seal or the mating hardware.
13. A method for analyzing a seal and a mating hardware, comprising:
providing the seal and the mating hardware, a surface of the seal being mated to a surface of the mating hardware;
performing a visual inspection of the seal and the mating hardware;
providing a seal analysis device configured for capturing information;
providing an electrical processing circuit configured to communicate with the seal analysis device;
capturing at least one of a photo or a video of the seal;
capturing at least one undesirable characteristic about at least one of the seal or the mating hardware with the seal analysis device; and
communicating the at least one undesirable characteristic about the at least one of the seal and the mating hardware from the seal analysis device to the electrical processing circuit.
14. The method of claim 13 , wherein the at least undesirable characteristic is at least one of a defect and a condition.
15. The method of claim 13 , wherein the electrical processing circuit is configured to determine a condition by comparing the at least undesirable characteristic against at least one pre-set criteria point.
16. The method of claim 15 , wherein the pre-set criteria includes tolerance levels regarding a shape, a color or a sheen of a surface, a depth of the defect, or a perimeter of the defect of at least one of the seal and the mounting hardware.
17. The method of claim 13 , wherein the sensor is configured to capture a three-dimensional model of the seal.
18. The method of claim 13 , provided further with the step of an offsite individual conducting an analysis of the seal.