Systems and methods for controlling MOSFETs

1. An electronic device, comprising:

line voltage measuring circuitry configured to measure a line voltage to produce a line voltage measurement;

load voltage measuring circuitry configured to measure a load voltage to produce a load voltage measurement; and

a processor coupled to the line voltage measuring circuitry and the load voltage measuring circuitry, wherein the processor is configured to adjust a voltage ramp waveform for a transition of a first metal-oxide-semiconductor field-effect transistor (MOSFET) and a second MOSFET based on the line voltage measurement and the load voltage measurement to minimize heat generation and electromagnetic interference creation by the MOSFETs, wherein the first MOSFET and the second MOSFET control a current to a load in an alternating current configuration, wherein the processor adjusts the voltage ramp waveform based on a difference between the line voltage measurement and the load voltage measurement.

2. The electronic device of claim 1 , wherein the processor provides the voltage ramp waveform to an amplification and filtering block coupled to a gate input of the first MOSFET and a gate input of the second MOSFET.

3. The electronic device of claim 1 , wherein the processor adjusts the voltage ramp waveform in real time based on the line voltage measurement and the load voltage measurement.

4. The electronic device of claim 1 , wherein the processor adjusts the voltage ramp waveform to round final stages of an off/on transition or an on/off transition of the MOSFETs.

5. The electronic device of claim 4 , wherein the voltage ramp waveform comprises a fast transition during initial stages of an off/on transition to minimize heat generation by the MOSFETs and a rounded transition in the final stages of the off/on transition to reduce electromagnetic interference.

6. The electronic device of claim 1 , wherein the processor adjusts the voltage ramp waveform using the equation log(time) X , where X is based on a size of the load.

7. The electronic device of claim 6 , wherein X varies between 0.1 and 1.

8. The electronic device of claim 6 , wherein the voltage ramp waveform comprises a duration between 100 microseconds and 1000 microseconds.

9. The electronic device of claim 6 , wherein a voltage scale of the voltage ramp waveform is based on a size of the load.

10. The electronic device of claim 1 , wherein the processor adjusts the voltage ramp waveform lower when the load voltage measurement develops a sharp edge at the beginning of the voltage ramp waveform.

11. The electronic device of claim 1 , wherein the processor adjusts the voltage ramp waveform higher when the load voltage measurement develops a notch at the end of the voltage ramp waveform.

12. The electronic device of claim 1 , wherein the processor adjusts a starting voltage of the voltage ramp waveform until a difference between the line voltage measurement and the load voltage measurement is within a threshold at a number of points during the transition of the MOSFETs.

13. A method, comprising:

measuring a line voltage to produce a line voltage measurement;

measuring a load voltage to produce a load voltage measurement; and

adjusting a voltage ramp waveform for a transition of a first metal-oxide-semiconductor field-effect transistor (MOSFET) and a second MOSFET based on the line voltage measurement and the load voltage measurement to minimize heat generation and electromagnetic interference creation by the MOSFETs, wherein the first MOSFET and the second MOSFET control a current to a load in an alternating current configuration, wherein the voltage ramp waveform is adjusted lower when the load voltage measurement develops a sharp edge at the beginning of the voltage ramp waveform.

14. The method of claim 13 , wherein the voltage ramp waveform is adjusted to round final stages of an off/on transition or an on/off transition of the MOSFETs.

15. The method of claim 13 , wherein the voltage ramp waveform is adjusted using the equation log(time) X , where X is based on a size of the load.

16. The method of claim 13 , wherein the voltage ramp waveform is adjusted higher when the load voltage measurement develops a notch at the end of the voltage ramp waveform.

17. The method of claim 13 , wherein the voltage ramp waveform is adjusted based on a difference between the line voltage measurement and the load voltage measurement at a number of points during the transition of the MOSFETs.

18. A non-transitory computer-readable medium, the computer-readable medium comprising executable instructions for:

measuring a line voltage to produce a line voltage measurement;

measuring a load voltage to produce a load voltage measurement; and

adjusting a voltage ramp waveform for a transition of a first metal-oxide-semiconductor field-effect transistor (MOSFET) and a second MOSFET based on the line voltage measurement and the load voltage measurement to minimize heat generation and electromagnetic interference creation by the MOSFETs, wherein the first MOSFET and the second MOSFET control a current to a load in an alternating current configuration, wherein the voltage ramp waveform is adjusted higher when the load voltage measurement develops a notch at the end of the voltage ramp waveform.