Sample shape measuring method and sample shape measuring apparatus

1. A sample shape measuring method, comprising:

a step of preparing illumination light that is to be passed through a predetermined illumination region;

a step of irradiating the illumination light to a sample; and

a predetermined processing step, wherein

the predetermined illumination region is set such that an area of a region of the illumination light passing through a pupil of an observation optical system is smaller than an area of the pupil of the observation optical system, and

the illumination light is transmitted through the sample, and

light emerged from the sample is incident on the observation optical system, and

the predetermined processing step includes,

a step of receiving light emerged from the observation optical system,

a step of computing a position of an image of the predetermined illumination region from light received,

a step of computing a difference between the position of the image of the predetermined illumination region and a reference position, and

a step of calculating an amount of inclination at a surface of the sample, from the difference computed.

2. The sample shape measuring method according to claim 1 , wherein the light is received at a position of the pupil of the observation optical system.

3. The sample shape measuring method according to claim 1 , wherein the light is received at a position conjugate with the pupil of the observation optical system.

4. The sample shape measuring method according to claim 1 , wherein

the amounts of inclination are calculated based on a correspondence relationship obtained in advance,

the correspondence relationship is expressed in a lookup table having the position of the image of the predetermined illumination region and the amount of inclination as parameters, and

a correction coefficient is calculated from a ratio of a size of the image of the predetermined illumination region in a state in which the sample is not there and a size of the image of the predetermined illumination region in a state in which the sample is there, and

data of the lookup table is corrected by using the correction coefficient.

5. The sample shape measuring method according to claim 1 , wherein

the amounts of inclination are calculated based on a correspondence relationship obtained in advance,

the correspondence relationship is expressed by an expression having the position of the image of the predetermined illumination region and the amount of inclination as parameters, and

a correction coefficient is calculated from a ratio of a size of the image of the predetermined illumination region in a state in which the sample is not there and a size of the image of the predetermined illumination region in a state in which the sample is there, and

an expression having the position of the image of the predetermined illumination region and the amount of inclination as parameters is corrected by using the correction coefficient.

6. The sample shape measuring method according to claim 1 , wherein a position of the sample is adjusted along the optical axis such that the size of the image of the predetermined illumination region in the state in which the sample is there, coincides with the size of the image of the predetermined illumination region in the state in which the sample is not there.

7. The sample shape measuring method according to claim 6 , wherein

a boundary of the predetermined illumination region has either a convex portion or a concave portion, and

the convex portion or the concave portion has a boundary which is formed by two straight lines intersecting at an angle not more than 90 degrees.

8. The sample shape measuring method according to claim 1 , wherein the following conditional expression (1) is satisfied:

0<σ<0.9  (1)

where,

σ is expressed by σ=NA ill /NA ob , and here

NA ill denotes a numerical aperture of illumination light passed through the predetermined illumination region, and

NA ob denotes a numerical aperture on a sample side of the observation optical system.

9. The sample shape measuring method according to claim 1 , wherein the light quantity distribution of the illumination light is such that a quantity of light becomes gradually smaller in a direction away from the optical axis.

10. A sample shape measuring apparatus, comprising:

an illuminating optical system,

an observation optical system,

a holding member,

a detection element, and

a processing unit, wherein

the illuminating optical system includes a light source, a condenser lens, and an optical member which forms a predetermined illumination region, and

the observation optical system includes an objective lens, and

the holding member holds a sample and is disposed between the illuminating optical system and the observation optical system, and

the optical member is disposed on a light source side of the condenser lens, and

the predetermined illumination region is set such that an area of a region of the illumination light passing through a pupil of the observation optical system is smaller than an area of the pupil of the observation optical system, and

illumination light irradiated to the sample by the illuminating optical system is transmitted through the sample, and

light emerged from the sample is incident on the observation optical system, and

the detection element receives light emerged from the observation optical system, and

the processing unit

computes a position of an image of the predetermined illumination region from light received, and

computes a difference between the position of the image of the predetermined illumination region and a reference position, and

calculates an amount of inclination at a surface of the sample from the difference computed.

11. The sample shape measuring apparatus according to claim 10 , wherein the detection element is disposed at a pupil position of the observation optical system.

12. The sample shape measuring apparatus according to claim 10 , wherein the detection element is disposed at a position conjugate with a pupil of the observation optical system.

13. The sample shape measuring apparatus according to claim 10 , wherein

the amounts of inclination are calculated based on a correspondence relationship obtained in advance,

the processing unit has a lookup table having the position of the image of the predetermined illumination region and the amount of inclination as parameters,

calculates the amount of inclination by using the lookup table, and

a correction coefficient is calculated from a ratio of a size of the image of the predetermined illumination region in a state in which the sample is not there and a size of the image of the predetermined illumination region in a state in which the sample is there, and

data of the lookup table is corrected by using the correction coefficient.

14. The sample shape measuring apparatus according to claim 10 , wherein

the amounts of inclination are calculated based on a correspondence relationship obtained in advance,

the processing unit has an expression having the position of the image of the predetermined illumination region and the amount of inclination as parameters, and

a correction coefficient is calculated from a ratio of a size of the image of the predetermined illumination region in a state in which the sample is not there and a size of the image of the predetermined illumination region in a state in which the sample is there, and

an expression having the position of the image of the predetermined illumination region and the amount of inclination as parameters is corrected by using the correction coefficient.

15. The sample shape measuring apparatus according to claim 10 , wherein a position of the holding member is adjusted along the optical axis such that the size of the image of the predetermined illumination region in the state in which the sample is there, coincides with the size of the image of the predetermined illumination region in the state in which the sample is not there.

16. The sample shape measuring apparatus according to claim 15 , wherein

a boundary of the predetermined illumination region has either a convex portion or a concave portion, and

the convex portion or the concave portion has a boundary which is formed by two straight lines intersecting at an angle not more than 90 degrees.

17. The sample shape measuring apparatus according to claim 10 , wherein the following conditional expression (1) is satisfied:

0<σ<0.9  (1)

where,

σ is expressed by σ=NA ill /NA ob , and here

NA ill denotes a numerical aperture of illumination light passed through the predetermined illumination region, and

NA ob denotes a numerical aperture on a sample side of the observation optical system.

18. The sample shape measuring apparatus according to claim 10 , wherein the light quantity distribution of the illumination light is such that a quantity of light becomes gradually smaller in a direction away from the optical axis.

19. A sample shape measuring apparatus, comprising:

an illuminating optical system,

an observation optical system,

a holding member,

a detection element, and

a processing unit, wherein

the illuminating optical system includes a light source, a condenser lens, and an optical member which forms a predetermined illumination region, and

the observation optical system includes an objective lens, and

the holding member holds a sample and is disposed between the illuminating optical system and the observation optical system, and

the detection element is disposed at one of a pupil position of the observation optical system and a position conjugate with the pupil position of the observation optical system, and

the optical member is disposed on a light source side of the condenser lens, and

the predetermined illumination region is set not to include an optical axis at a pupil position of the illuminating optical system and is set such that illumination light is irradiated to a portion at an inner side of a pupil at the pupil position of the observation optical system and to an outer edge of the pupil of the observation optical system, at the pupil position of the observation optical system, and

the illumination light irradiated to the sample by the illuminating optical system is transmitted through the sample, and

light emerged from the sample is incident on the observation optical system, and

the detection element receives light emerged from the observation optical system, and

the processing unit

calculates a quantity of light based on light received, and

computes one of a difference between the quantity of light and a reference light quantity and a ratio of the quantity of light and a reference light quantity, and

calculates an amount of inclination at a surface of the sample, from one of the difference and the ratio.