Method of making a carbon filament for thermal ionization
A method for modifying a carbon thermal ionization filament is disclosed. In particular, the method requires a step of reacting a fluorine-containing compound with the carbon thermal ionization filament to provide a fluorinated carbon thermal ionization filament. Such method can result in a fluorinated carbon thermal ionization filament that can be employed in a system, such as a thermal ionization mass spectrometer, for ionizing a sample.
1. A method for modifying a carbon thermal ionization filament, the method comprising:
reacting a fluorine-containing compound with the carbon thermal ionization filament to provide a fluorinated carbon thermal ionization filament.
2. The method of claim 1 , wherein the carbon thermal ionization filament comprises graphene, graphene oxide, reduced graphene oxide, graphite, graphite oxide, reduced graphite oxide, or combinations thereof.
3. The method of claim 1 , wherein the carbon thermal ionization filament comprises graphene oxide, reduced graphene oxide, or combinations thereof.
4. The method of claim 1 , wherein the carbon thermal ionization filament comprises reduced graphene oxide.
5. The method of claim 1 , wherein the fluorine-containing compound comprises an inorganic compound.
6. The method of claim 1 , wherein the fluorine-containing compound comprises an organic compound.
7. The method of claim 1 , wherein the fluorine-containing compound comprises a fluoropolymer.
8. The method of claim 7 , wherein the fluoropolymer comprises polytetrafluoroethylene, perfluoroalkoxy polymer, fluorinated ethylene propylene polymer, ethylene tetrafluoroethylene copolymer, polyvinylidene fluoride, polyvinylfluoride, ethylene chlorotrifluoroethylene copolymer, polychlorotrifluoroethylene, perfluoropolyether, perfluorinated elastomer, tetrafluoroethylene propylene, polyhexafluoropropylene, or a mixture thereof.
9. The method of claim 7 , wherein the fluoropolymer comprises polytetrafluoroethylene.
10. The method of claim 1 , wherein the carbon thermal ionization filament is connected to a filament assembly.
11. The method of claim 10 , wherein the reacting step is conducted prior to connecting the carbon thermal ionization filament to the filament assembly.
12. The method of claim 10 , wherein the reacting step is conducted after connecting the carbon thermal ionization filament to the filament assembly.
13. The method of claim 10 , wherein the carbon thermal ionization filament is connected to the filament assembly using a refractory metal.
14. The method of claim 1 , wherein the reacting step occurs at a temperature of from 100° C. to 2500° C.
15. The method of claim 1 , wherein the reacting step occurs by heating the fluorine-containing compound on the carbon thermal ionization filament and wherein the heating is provided by passing a current through a filament assembly and the carbon thermal ionization filament.
16. A fluorinated carbon thermal ionization filament made according to the method of claim 1 .
17. A system for ionizing a sample comprising:
the fluorinated carbon thermal ionization filament of claim 16 ,
a power source in electrical communication with the fluorinated carbon thermal ionization filament, the power source being configured to resistively heat the fluorinated carbon thermal ionization filament; and
an ion collector in communication with the fluorinated carbon thermal ionization filament such that ions emitted from a sample located on the fluorinated carbon thermal ionization filament pass through the ion collector, the ion collector being configured to form an ion beam comprising the ions.
18. The system of claim 17 , further comprising a mass spectrometer in communication with the ion collector such that the ions that pass through the ion collector enter a magnetic field of the mass spectrometer.
19. A method for forming an ion beam, the method comprising:
contacting the fluorinated carbon thermal ionization filament of claim 16 with a solid sample;
heating the fluorinated carbon thermal ionization filament to a temperature at which atoms of the solid sample are desorbed and ionized; and
collecting and focusing the desorbed ions to form the ion beam.
20. The method of claim 19 , further comprising passing the ion beam through a magnetic field and thereby separating the ions of the ion beam according to their mass:charge ratio.
21. The method of claim 19 , further comprising bombarding a target with the ion beam.