Solid state storage device using state prediction method
A solid state storage device includes a non-volatile memory and a control circuit. The non-volatile memory includes a specified region. The control circuit is connected with the non-volatile memory, and includes a function storage circuit. A state prediction function for a first failure mode and a state prediction function for a second failure mode are stored in the function storage circuit. If the control circuit confirms that the specified region is changed from the first failure mode to the second failure mode, the control circuit predicts the specified region according to current state parameters of the specified region and the state prediction function for the second failure mode.
1. A solid state storage device, comprising:
a non-volatile memory comprising a specified region; and
a control circuit connected with the non-volatile memory, and comprising a function storage circuit, wherein a state prediction function for a first failure mode and a state prediction function for a second failure mode are stored in the function storage circuit,
wherein if the control circuit confirms that the specified region is changed from the first failure mode to the second failure mode, the control circuit predicts the specified region according to current state parameters of the specified region and the state prediction function for the second failure mode.
2. The solid state storage device as claimed in claim 1 , wherein the specified region includes a block of the non-volatile memory, plural blocks of the non-volatile memory or a page of the non-volatile memory.
3. The solid state storage device as claimed in claim 1 , wherein the control circuit judges whether the specified region is changed from the first failure mode to the second failure mode according to previous state parameters and the current state parameters of the specified region.
4. The solid state storage device as claimed in claim 3 , wherein the function storage circuit further stores a failure mode prediction function, and the control circuit inputs the previous state parameters and the current state parameters into the failure mode prediction function, wherein if the failure mode prediction function outputs the second failure mode, the control circuit confirms that the specified region is changed from the first failure mode to the second failure mode.
5. A state prediction method for the solid state storage device according to claim 1 , the state prediction method comprising steps:
collecting state parameters of the specified region and storing the state parameters of the specified region as the current state parameters at a specified time interval;
judging whether the specified region is changed from the first failure mode to the second failure mode; and
if the specified region is changed from the first failure mode to the second failure mode, predicting the specified region according to the current state parameters of the specified region and the state prediction function for the second failure mode.
6. The state prediction method as claimed in claim 5 , further comprising steps of:
inputting previous state parameters and the current state parameters into a failure mode prediction function; and
if the failure mode prediction function outputs the second failure mode, confirming that the specified region is changed from the first failure mode to the second failure mode.
7. The state prediction method as claimed in claim 5 , further comprising steps of:
collecting state parameters of an additional region as the current state parameters of the additional region; and
inputting the current state parameters of the additional region into the state prediction function for the second failure mode so as to predict the additional region.