Projection system
View Patent ↗A projection system includes an invisible light projector, a background member, an imaging unit, an image generator, and a visible light projector. The invisible light projector projects a predetermined invisible light image onto the object via invisible light. The background member is disposed behind the object in a direction of the invisible light emitted from the invisible light projector. The imaging unit captures an image of the invisible light projected from the invisible light projector. The image generator measures a shape of the object based on the image captured by the imaging unit to generate image data showing image content for projection onto the object in accordance with the measured shape. The visible light projector projects the image content shown by the image data onto the object via visible light. The background member has a light shielding surface that does not diffusely reflect the invisible light incident thereon.
1. A projection system comprising:
a first projector that projects a light of a first wavelength onto a first object;
a second object that is different from the first object;
an imaging device that captures an image formed by the light of the first wavelength projected by the first projector;
an image generator that measures a position of the first object based on the image captured by the imaging device to generate image data indicating a projection image depending on the measured position; and
a second projector that projects the projection image indicated by the image data by using a light of a second wavelength that is different from the first wavelength,
wherein the second object comprises a light shielding surface that prevent the light of first wavelength incident on the light shielding surface from diffusely reflecting.
2. The projection system of claim 1 , wherein
the second object implements either one of specular reflection, retroreflection, and absorption of the light of the first wavelength at the light shielding surface.
3. The projection system of claim 1 , wherein
the second object diffusely reflects the light of the second wavelength.
4. The projection system of claim 3 , wherein the second object comprises:
a light shielding member constructing the light shielding surface with the light of the second wavelength transmitting; and
a diffusion member covered with the light shielding member, the diffusion member diffusely reflecting the light of the second wavelength.
5. The projection system of claim 1 , wherein
the second object absorbs the light of second wavelength, or transmits the light of the second wave length.
6. The projection system of claim 1 , wherein
the imaging device comprises:
an image sensor that receives a light; and
a wavelength selector that transmits the light of the first wavelength, and absorbs or reflects the light of the second wavelength.
7. The projection system of claim 6 , wherein
the wavelength selector is any one of a filter attached to a lens system the imaging device and a filter built into the image sensor.
8. The projection system of claim 6 , wherein
the wavelength selector is formed at a lens of the lens system.
9. The projection system of claim 1 , wherein
the light of the first wavelength is infrared light.
10. The projection system of claim 1 , wherein
the light of second wavelength is visible light.
11. The projection system of claim 1 , wherein
an image formed by the light of the first wavelength projected onto the first object is a measurement pattern in accordance with a space coding method.
12. The projection system of claim 1 , wherein
the measured position is a position in three-dimensional space.
13. The projection system of claim 1 , wherein
an optical axis of the first projector and an optical axis of the imaging device are parallel with each other.
14. The projection system of claim 1 , wherein
the measured position is obtained based on a distance from the first projector to the first object.
15. A projection method comprising:
projecting a light of a first wavelength onto a first object by a first projector;
providing a second object comprising a light shielding surface that prevent the light of the first wavelength incident on the light shielding surface from diffusely reflecting;
capturing an image formed by the light of first wavelength projected from the first projector by an imaging device;
measuring a position of the first object based on the image captured by the imaging device;
generating image data indicating a projection image depending on the measured position; and
projecting the projection image indicated by the image data by using a light of a second wave length different wavelength from the light of the first wavelength.
16. The projection method of claim 15 , wherein
the second object implements either one of specular reflection, retroreflection, and absorption of the light of the first wavelength at the light shielding surface.
17. The projection method of claim 15 , wherein
the second object diffusely reflects the light of the second wavelength.
18. The projection method of claim 17 , wherein
the second object comprises:
a light shielding member constructing the light shielding surface with the light of the second wavelength transmitting; and
a diffusion member covered with the light shielding member, the diffusion member diffusely reflecting the light of the second wavelength.
19. The projection method of claim 15 , wherein
the second object absorbs the light of the second wavelength, or transmits the light of the second wave length.
20. The projection method of claim 15 , wherein
the imaging devise comprises:
an image sensor that receive a light; and
a wavelength selector that transmit the light of the first wavelength, and absorbs or reflects the light of the second wavelength.
21. The projection method of claim 15 , wherein
the first light is infrared light.
22. The projection method of claim 15 , wherein
the light of the second wavelength is visible light.
23. The projection method of claim 15 , wherein
an image formed by the light of the first wavelength, projected onto the first object is a measurement pattern in accordance with a space coding method.
24. The projection method of claim 15 , wherein
the measured position is a position in three-dimensional space.
25. The projection method of claim 15 , wherein
an optical axis of the first projector and an optical axis of the imaging device are parallel with each other.
26. The projection method of claim 15 , wherein
the measured position is obtained based on a distance from the first projector to the first object.