Solid state storage device and read retry method thereof

1. A solid state storage device, comprising:

a control circuit comprising a retry table, wherein plural retry read-voltage sets are recorded in the retry table, and the retry table is divided into plural retry sub-tables, wherein the plural retry read-voltage sets are classified into plural groups, and the plural retry read-voltage sets are recorded into the corresponding retry sub-tables; and

a non-volatile memory connected with the control circuit,

wherein during a read retry process of a read cycle, the control circuit performs a hard decoding process according to a retry sub-table of the plural retry sub-tables, wherein if the hard decoding process fails, the control circuit performs a soft decoding process according to another retry sub-table of the plural retry sub-tables.

2. The solid state storage device as claimed in claim 1 , wherein the plural retry read-voltage sets are classified into a first group and a second group according to the hard decoding process and the soft decoding process, wherein the retry read-voltage sets of the first group and the retry read-voltage sets of the second group are respectively recorded into a first retry sub-table and a second retry sub-table of the plural retry sub-tables, wherein the control circuit performs the hard decoding process according to the first retry sub-table, and the control circuit performs the soft decoding process according to the second retry sub-table.

3. The solid state storage device as claimed in claim 1 , wherein the plural retry read-voltage sets are classified into plural groups according to plural failure modes, the hard decoding process and the soft decoding process, and the plural retry read-voltage sets are recorded into the corresponding retry sub-tables.

4. The solid state storage device as claimed in claim 1 , wherein the plural retry read-voltage sets are classified into a first group, a second group, a third group and a fourth group according to a successful decoding probability, the hard decoding process and the soft decoding process, wherein the retry read-voltage sets of the first group, the retry read-voltage sets of the second group, the retry read-voltage sets of the third group and the retry read-voltage sets of the fourth group are respectively recorded into a first retry sub-table, a second retry sub-table, a third retry sub-table and a fourth retry sub-table of the plural retry sub-tables, wherein the control circuit performs the hard decoding process according to the first retry sub-table or the second retry sub-table, and the control circuit performs the soft decoding process according to the third retry sub-table or the fourth retry sub-table.

5. A read retry method for a memory cell array of the solid state storage device according to claim 1 , the read retry method comprising steps of:

entering the read retry process;

performing the hard decoding process according to a first retry sub-table of the plural retry sub-tables; and

if the hard decoding process fails, performing the soft decoding process according to a second retry sub-table of the plural retry sub-tables.

6. A read retry method for a memory cell array of the solid state storage device according to claim 1 , the read retry method comprising steps of:

entering the read retry process;

predicting a failure mode;

performing the hard decoding process according to a first retry sub-table of the plural retry sub-tables corresponding to the failure mode; and

if the hard decoding process fails, performing the soft decoding process according to a second retry sub-table of the plural retry sub-tables corresponding to the failure mode.

7. A read retry method for a memory cell array of the solid state storage device according to claim 1 , the read retry method comprising steps of:

entering the read retry process;

performing the hard decoding process according to a first retry sub-table of the plural retry sub-tables;

if a read data is generated according to the first retry sub-table, predicting a failure mode;

if the read data is not generated according to the first retry sub-table, performing the hard decoding process according to a second retry sub-table of the plural retry sub-tables;

if the hard decoding process fails, performing the soft decoding process according to a third retry sub-table of the plural retry sub-tables;

if the read data is generated according to the third retry sub-table, predicting the failure mode; and

if the read data is not generated according to the third retry sub-table, performing the soft decoding process according to a fourth retry sub-table of the plural retry sub-tables.

8. The read retry method as claimed in claim 7 , wherein the read retry method further comprises steps of:

entering another read retry process;

performing the hard decoding process according to a fifth retry sub-table of the plural retry sub-tables corresponding to the failure mode; and

if the hard decoding process fails, performing the soft decoding process according to a sixth retry sub-table of the plural retry sub-tables corresponding to the failure mode.

9. A read retry method for a memory cell array of the solid state storage device according to claim 1 , the read retry method comprising steps of:

entering the read retry process;

performing the hard decoding process according to a first retry sub-table of the plural retry sub-tables;

if a read data is generated according to the first retry sub-table, predicting a failure mode;

if the read data is not generated according to the first retry sub-table, performing the hard decoding process according to a second retry sub-table of the plural retry sub-tables;

if the hard decoding process fails, predicting the failure mode; and

performing the soft decoding process according to a third retry sub-table of the plural retry sub-tables corresponding to the failure mode.