System and method for binning at final test
Systems and methods for sorting an electronic device undergoing a final test operation in accordance with a test program, into one of a plurality of bins. In one embodiment, an evaluator defines the binning of the electronic device while the device is still socketed, and the defined binning may or may not concur with the binning assigned by the test program.
1. A system for sorting an electronic device, comprising:
memory configured to store a provisional binning assignment for the electronic device determined from first data generated by a test tool that is performing a test operation on the electronic device according to a test program;
an interface coupled to the memory and more than one data source external to the test tool; and
an evaluator coupled to the memory and the interface, the evaluator is configured to:
receive the first data and the provisional binning assignment for the electronic device generated by the test program;
receive second data from the more than one data source external to the test tool through the interface;
combine the second data from the more than one data source external to the test tool;
define a permanent binning assignment for the electronic device based at least in part on the first data and combined second data from the more than one data source external to the test tool; and
output the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
2. The system of claim 1 , wherein the test tool is located in a facility and the more than one data source is located outside of the facility.
3. The system of claim 2 , wherein the more than one data source includes a manufacturing database server at a manufacturing site.
4. The system of claim 3 , further comprising a manufacturing database interface to provide access to the second data from the manufacturing database server for use by the evaluator in defining the permanent binning assignment.
5. The system of claim 1 , wherein the second data includes data relating to at least one other electronic device being tested in parallel with the electronic device.
6. The system of claim 1 , wherein the second data includes data from a manufacturing operation which precedes the test operation.
7. The system of claim 1 , wherein the second data includes data from a manufacturing operation which follows the test operation.
8. The system of claim 1 , wherein the permanent binning assignment defined by the evaluator results from processing that includes execution of an algorithm that excludes at least one of: product specific requirements, tester specific requirements, or test operation specific requirements.
9. The system of claim 1 , further comprising a handler to insert the electronic device into a test socket of the test tool prior to the test operation, and after the test operation to remove the electronic device from the test socket and place the electronic device in one of the plurality of bins in accordance with the permanent binning assignment defined by the evaluator.
10. The system of claim 9 , further comprising a handler interface to transfer the permanent binning assignment defined by said evaluator to said handler.
11. A method of sorting an electronic device, comprising:
receiving first data generated by a test tool that is performing a test operation on the electronic device according to a test program, and a provisional binning assignment for the electronic device determined from the first data;
receiving second data from more than one data source external to the test tool;
combining the second data from the more than one data source external to the test tool;
defining a permanent binning assignment for the electronic device based at least in part on the first data and combined second data from the more than one data source external to the test tool; and
outputting the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
12. The method of claim 11 , wherein the test tool is located in a facility and the more than one data source is located outside of the facility.
13. The method of claim 12 , wherein the more than one data source includes a manufacturing database server at a manufacturing site.
14. The method of claim 13 , further comprising a manufacturing database interface to provide access to the second data from the manufacturing database server for use in defining the permanent binning assignment.
15. The method of claim 11 , wherein the second data includes data relating to at least one other electronic device being tested in parallel with the electronic device.
16. The method of claim 11 , wherein the second data includes data from a manufacturing operation which precedes the test operation.
17. The method of claim 11 , wherein the second data includes data from a manufacturing operation which follows the test operation.
18. A non-transitory computer program product comprising a computer useable medium having computer readable program code embodied therein for sorting an electronic device, the non-transitory computer program product further comprising:
computer readable program code for causing a computer to:
receive first data generated by a test tool that is performing a test operation on the electronic device according to a test program, and a provisional binning assignment for the electronic device determined from the first data;
receive second data from more than one data source external to the test tool;
combine the second data from the more than one data source external to the test tool;
define a permanent binning assignment for the electronic device based at least in part on the first data and combined second data from the more than one data source external to the test tool; and
output the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
19. The non-transitory computer program product of claim 18 , wherein the test tool is located in a facility and the more than one data source is located outside of the facility.
20. The non-transitory computer program product of claim 19 , wherein the more than one data source includes a manufacturing database at a manufacturing site.