IP Library Granted Patent US 10,886,411
Granted Patent B2
US 10,886,411 · App. 16/174,284 · Granted Jan 5, 2021

Semiconductor device and display unit

Inventor: Yasuhiro Terai (Tokyo, JP)
Assignee: JOLED INC.
H01L29/78648H01L27/1255H01L27/3276H01L29/7869H01L51/0097H01L27/3262H01L27/3265
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Quick Facts
Patent No.
US 10,886,411
App. No.
16/174,284
Granted
Jan 5, 2021
Kind
B2
Abstract

A semiconductor device includes a substrate, a transistor, a storage capacitor, a first insulating layer, and a second insulating layer. The transistor includes a semiconductor film, a gate insulating film, a first gate electrode, and a second gate electrode. The semiconductor film, the gate insulating film, and the first gate electrode are provided in this order from the substrate. The second gate electrode faces the first gate electrode across the semiconductor film. The storage capacitor includes a lower electrode and an upper electrode that are provided in this order from the substrate. The upper electrode faces the lower electrode and includes the same material as the semiconductor film. The first insulating layer is provided between the second gate electrode and the semiconductor film. The second insulating layer is provided between the lower electrode and the upper electrode and has a smaller thickness than the first insulating layer.

Claims (34)

1. A semiconductor device comprising:

a substrate;

a transistor including a semiconductor film, a gate insulating film, a first gate electrode, and a second gate electrode, the semiconductor film, the gate insulating film, and the first gate electrode being provided in this order from the substrate, the second gate electrode facing the first gate electrode across the semiconductor film;

a storage capacitor including a lower electrode and an upper electrode, the lower electrode and the upper electrode being provided in this order from the substrate, the upper electrode facing the lower electrode and including a material a same as a material of the semiconductor film;

a first insulating layer provided between the second gate electrode and the semiconductor film; and

a second insulating layer provided between the lower electrode and the upper electrode and having a thickness smaller than a thickness of the first insulating layer, wherein

the first insulating layer has a contact-hole, and

the transistor further includes a source-drain electrode that is electrically coupled to the semiconductor film via the contact-hole of the first insulating layer.

2. The semiconductor device according to claim 1 , wherein

the first insulating layer includes an organic insulating film and an inorganic insulating film, and

the second insulating film includes the inorganic insulating film.

3. The semiconductor device according to claim 2 , wherein

the thickness of the first insulating layer comprises a total thickness of the organic insulating film and the inorganic insulating film, and

the thickness of the second insulating layer comprises the thickness of the inorganic insulating film.

4. The semiconductor device according to claim 1 , wherein the source-drain electrode includes a material a same as a material of the second gate electrode.

5. The semiconductor device according to claim 1 , wherein the second gate electrode is held at a fixed potential.

6. The semiconductor device according to claim 1 , wherein the semiconductor film includes an oxide semiconductor material.

7. The semiconductor device according to claim 1 , wherein the first gate electrode has an end face that is aligned with an end face of the gate insulating film.

8. The semiconductor device according to claim 1 , wherein the second gate electrode has a planar shape a same as a planar shape of the first gate electrode.

9. A display unit provided with a semiconductor device and a display element layer that is configured to be driven by the semiconductor device, the semiconductor device comprising:

a substrate;

a transistor including a semiconductor film, a gate insulating film, a first gate electrode, and a second gate electrode, the semiconductor film, the gate insulating film, and the first gate electrode being provided in this order from the substrate, the second gate electrode facing the first gate electrode across the semiconductor film;

a storage capacitor including a lower electrode and an upper electrode, the lower electrode and the upper electrode being provided in this order from the substrate, the upper electrode facing the lower electrode and including a material a same as a material of the semiconductor film;

a first insulating layer provided between the second gate electrode and the semiconductor film; and

a second insulating layer provided between the lower electrode and the upper electrode and having a thickness smaller than a thickness of the first insulating layer, wherein

the first insulating layer has a contact-hole, and

the transistor further includes a source-drain electrode that is electrically coupled to the semiconductor film via the contact-hole of the first insulating layer.

10. The display unit according to claim 9 wherein the source-drain electrode includes a material a same as a material of the second gate electrode.

11. A semiconductor device comprising:

a substrate;

a transistor including a semiconductor film, a gate insulating film, a first gate electrode, a second gate electrode, and a source-drain electrode, wherein the source-drain electrode electrically coupled to the semiconductor film;

the second gate electrode facing the first gate electrode across the semiconductor film; and

the semiconductor film, the gate insulating film and the first gate electrode being provided in this order from the substrate;

a first insulating layer provided between the second gate electrode and the semiconductor film, wherein the first insulating layer has a contact-hole, and the source-drain electrode extends through the contact-hole.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2025
From: JDI DESIGN AND DEVELOPMENT G.K.
To: MAGNOLIA BLUE CORPORATION
Reel/Frame 072039/0656 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2024
From: JOLED, INC.
To: JDI DESIGN AND DEVELOPMENT G.K.
Reel/Frame 066382/0619 →
CORRECTION BY AFFIDAVIT FILED AGAINST REEL/FRAME 063396/0671 Recorded Jun 12, 2023
From: JOLED, INC.
To: JOLED, INC.
Reel/Frame 064067/0723 →
SECURITY INTEREST Recorded Apr 20, 2023
From: JOLED, INC.
To: INCJ, LTD.
Reel/Frame 063396/0671 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2018
From: TERAI, YASUHIRO
To: JOLED INC.
Reel/Frame 047352/0424 →