IP Library Granted Patent US 10,656,124
Granted Patent B2
US 10,656,124 · App. 16/185,544 · Granted May 19, 2020

Container screening system and method

Inventors: Wesley C. Pirkle (New Albany, OH); Richard L. Shoaf (Westerville, OH)
Assignee: Battelle Memorial Institute
G01N29/44G01N29/02G01N2291/044G01N2291/048G01N2291/102
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Quick Facts
Patent No.
US 10,656,124
App. No.
16/185,544
Granted
May 19, 2020
Kind
B2
Abstract

A system and method are disclosed for interrogating a liquid in a container. In one embodiment, methods are provided to interrogate and identify a container material type and a liquid within a container.

Claims (14)

1. A method for detecting metal in a sample in a screening system used to analyze contents of liquid-filled containers, the method comprising:

detecting a reflected signal waveform;

conducting a Fast Fourier Transformation (FFT) of the reflected signal waveform to generate a signal transform;

conducting a FFT of a baseline reflected signal to generate a baseline transform;

calculating ratios of the signal transform to the baseline transform at different frequencies; and

analyzing the reflected signal waveform to determine if the reflected signal waveform has a first peak saturation and a first minimum change that is greater than a preset voltage, and by applying a partial least squares algorithm to the ratios to determine if PLS<−0.05 and R8>0.75.

2. A method for detecting metal in a sample, the method comprising:

detecting a reflected signal waveform;

conducting a Fast Fourier Transformation (FFT) of the reflected signal waveform to generate a signal transform;

conducting a FFT of a baseline reflected signal to generate a baseline transform;

calculating ratios of the signal transform to the baseline transform at different frequencies; and

determining based on one or more results generated by a partial least square algorithm based on one or more o ratios whether the sample includes the metal.

3. The method of claim 2 , wherein the determining comprises analyzing the reflected signal waveform to determine if the reflected signal waveform has a first peak saturation and a first minimum change that is greater than a preset voltage.

4. The method of claim 3 , wherein the analyzing further comprises applying the partial least squares algorithm to the ratios to determine if PLS<−0.05 and R8>0.75 corresponding to determining that the sample includes the metal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2019
From: PIRKLE, WESLEY C.; SHOAF, RICHARD L.
To: BATTELLE MEMORIAL INSTITUTE
Reel/Frame 048290/0885 →