IP Library Granted Patent US 10,742,970
Granted Patent B2
US 10,742,970 · App. 16/198,304 · Granted Aug 11, 2020

Device and method for measuring spatial color and resolution

Inventors: Ossi Pirinen (Shenzhen, CN); Tuomas Punta (Shenzhen, CN); Ville Nummela (Shenzhen, CN); Xingbo Wang (Shenzhen, CN)
Assignee: AAC Optics Solutions Pte. Ltd.
H04N17/02G01J3/501G06T7/80G06T7/90
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Quick Facts
Patent No.
US 10,742,970
App. No.
16/198,304
Granted
Aug 11, 2020
Kind
B2
Abstract

A device and a method for measuring spatial color characteristic and resolution are provided. The measuring device includes: a light source, a measuring dial plate and a camera under test, wherein the light source has at least two different spectral power distribution characteristics, the measuring dial plate is provided with a through hole penetrating a thickness direction of the measuring dial plate, the light emitted from the light source passes through the through hole, and the surface of the measuring dial plate is set in black color; the measuring dial plate can also be provided with a measuring pattern, the light emitted from the light source passes through a region other than the measuring pattern. With the device provided in the present disclosure, the spatial color and resolution of the camera can be measured simultaneously, which shortens the manufacture cycle of the camera and reduces measurement cost.

Claims (33)

1. A device for measuring spatial color characteristic and resolution, comprising: a light source, a measuring dial plate and a camera under test, wherein the light source has at least two different spectral power distribution characteristics, the measuring dial plate is provided with a through hole penetrating a thickness direction of the measuring dial plate, light emitted from the light source passes through the through hole, and a surface of the measuring dial plate is set in black color; and the resolution of the camera is obtained by means of a marginal diffusion function of an image of the measuring dial plate captured by the camera, contrast measurement of stripe or sinusoidal black and white patterns or spatial frequency response of white noise; wherein, the light source and the camera under test are placed on a same side of the measuring dial plate,

wherein the through hole is a circular hole or a square hole,

wherein a plurality of through holes is provided, and the plurality of through holes has a same structure and are arranged in a determinant array,

wherein each of the plurality of through holes is a circular hole, and a row distance and a column distance between the through holes are larger than a diameter of the through hole.

2. The device according to claim 1 , wherein the light source is a light-emitting diode (LED), an LED array, or a tunable laser diode array having different spectral power distribution characteristics, and the light source is configured to emit an optical wave having a uniform intensity.

3. The device according to claim 2 , wherein a row distance between the through holes is equal to a column distance between the through holes.

4. The device according to claim 3 , wherein each of the plurality of through holes is a square hole, and a row distance and a column distance between the through holes are larger than a maximum edge length of the through hole.

5. A method for measuring spatial color and resolution using the device according to claim 1 , comprising:

turning on the light source arranged toward the measuring dial plate;

controlling the camera under test to photograph the measuring dial plate so as to obtain a measured image;

calculating a resolution of the camera under test according to the measured image, wherein the resolution of the camera is obtained by means of a marginal diffusion function of the measured image, contrast measurement of stripe or sinusoidal black and white patterns or spatial frequency response of white noise; and

comparing the light source with the measured image so as to obtain a spatial color characteristic of the camera under test,

wherein the through hole is a circular hole or a square hole,

wherein a plurality of through holes is provided, and the plurality of through holes has a same structure and are arranged in a determinant array,

wherein each of the plurality of through holes is a circular hole, and a row distance and a column distance between the through holes are larger than a diameter of the through hole.

6. A device for measuring spatial color characteristic and resolution, comprising: a light source, a measuring dial plate and a camera under test, wherein the light source has at least two different spectral power distribution characteristics, the measuring dial plate is provided with a measuring pattern, and light emitted from the light source passes through a region other than the measuring pattern; the measuring dial plate is a transparent printing plate, while the measuring pattern is opaque; and the resolution of the camera is obtained by means of a marginal diffusion function of an image of the measuring dial plate captured by the camera, contrast measurement of stripe or sinusoidal black and white patterns or spatial frequency response of white noise; wherein, the light source and the camera under test are placed on a same side of the measuring dial plate,

wherein the through hole is a circular hole or a square hole,

wherein a plurality of through holes is provided, and the plurality of through holes has a same structure and are arranged in a determinant array,

wherein each of the plurality of through holes is a circular hole, and a row distance and a column distance between the through holes are larger than a diameter of the through hole.

7. The device according to claim 6 , wherein the light source is a light-emitting diode (LED), an LED array, or a tunable laser diode array having different spectral power distribution characteristics, and the light source is configured to emit an optical wave having a uniform intensity.

8. The device according to claim 6 , wherein the measuring pattern is a circular pattern or a square pattern.

9. The device according to claim 8 , wherein a plurality of measuring patterns is provided, and the plurality of measuring patterns has a same structure and is arranged in a determinant array.

10. The device according to claim 9 , wherein a row distance between the measuring patterns is equal to a column distance between the measuring patterns.

11. The device according to claim 9 , wherein each of the measuring patterns is a circular pattern, and a row distance and a column distance between the measuring patterns are larger than a diameter of the measuring pattern.

12. The device according to claim 9 , wherein each of the measuring patterns is a square pattern, and a row distance and a column distance between the measuring patterns are larger than a maximum edge length of the measuring pattern.

13. A method for measuring spatial color and resolution applied to the device according to claim 6 , comprising:

turning on the light source arranged toward the measuring dial plate;

controlling the camera under test to photograph the measuring dial plate so as to obtain a measured image;

calculating a resolution of the camera under test according to the measured image, wherein the resolution of the camera is obtained by means of a marginal diffusion function of measured image, contrast measurement of stripe or sinusoidal black and white patterns or spatial frequency response of white noise; and

comparing the light source with the measured image so as to obtain a spatial color characteristic of the camera under test,

wherein the through hole is a circular hole or a square hole,

wherein a plurality of through holes is provided, and the plurality of through holes has a same structure and are arranged in a determinant array,

wherein each of the plurality of through holes is a circular hole, and a row distance and a column distance between the through holes are larger than a diameter of the through hole.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 17, 2020
From: AAC TECHNOLOGIES PTE. LTD.
To: AAC OPTICS SOLUTIONS PTE. LTD.
Reel/Frame 052430/0799 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2018
From: PIRINEN, OSSI; PUNTA, TUOMAS; NUMMELA, VILLE; WANG, XINGBO
To: AAC TECHNOLOGIES PTE. LTD.
Reel/Frame 047567/0602 →
Priority Claims (1)
CN 2018 1 0926216 · Aug 15, 2018 · national
Continuity (1)
Related Publication 20200059641A1 · Feb 20, 2020