Spectrometer arrangement, method for producing a two-dimensional spectrum by means of such a spectrometer arrangement

1. A spectrometer arrangement comprising:

an entrance-slit group configured to enable introducing radiation into the spectrometer arrangement and limiting the optical field of the spectrometer arrangement, the entrance-slit group including a slit wheel and a slit mask;

a first dispersive element adapted to spectrally decompose the radiation in a main dispersion direction; and

a second dispersive element adapted to spectrally decompose the radiation in a transverse dispersion direction that forms an angle with the main dispersion direction such that a two-dimensional spectrum can be produced,

wherein the slit wheel is mounted rotatably about an axis of rotation and includes at least one falcate opening having a variable width depending on an angle of rotation of the slit wheel, wherein the width of the at least one falcate opening extends in the transverse dispersion direction,

wherein the slit mask includes a mask opening that is longer than a largest width of the at least one falcate opening, and

wherein radiation radiates through the at least one falcate opening of the slit wheel and the mask opening of the slit mask into the spectrometer arrangement.

2. The spectrometer arrangement of claim 1 , wherein a distance from the axis of rotation to a central axis of the at least one falcate opening is constant across a rotational angle.

3. The spectrometer arrangement of claim 1 , wherein the width of the at least one opening changes continuously across a rotational angle.

4. The spectrometer arrangement of claim 1 , wherein the width of the at least one opening changes linearly across a rotational angle.

5. The spectrometer arrangement of claim 1 , wherein the width of the at least one opening changes from 20 μm to 400 μm across a rotational angle.

6. The spectrometer arrangement of claim 1 , wherein the slit wheel includes a plurality of falcate openings of variable width.

7. The spectrometer arrangement of claim 1 , wherein the slit mask is rectangular, and the mask opening has a constant width in the main dispersion direction.

8. The spectrometer arrangement of claim 7 , wherein the slit mask is movably arranged with respect to the slit wheel.

9. The spectrometer arrangement of claim 1 , wherein the mask opening of the slit mask is a falcate opening, wherein the width of the mask opening changes depending on the angle of rotation, wherein the width of the mask opening is in the main dispersion direction.

10. The spectrometer arrangement of claim 9 , wherein a center of the slit mask, or a central axis of the falcate mask opening of the slit mask, lies on the central axis of the at least one falcate opening of the slit wheel.

11. The spectrometer arrangement of claim 1 , further comprising a collimator arranged downstream of the entrance slit group in an incident direction.

12. The spectrometer arrangement of claim 11 , wherein the collimator is a parabolic mirror or spherical mirror.

13. The spectrometer arrangement of claim 11 , wherein the spectrometer arrangement forms a Littrow spectrometer.

14. The spectrometer arrangement of claim 1 , wherein the first dispersive element is an echelle grating.

15. The spectrometer arrangement of claim 1 . wherein the second dispersive element is a prism.

16. The spectrometer arrangement of claim 15 , wherein the prism is mirrored on a rear surface.

17. The spectrometer arrangement of claim 15 , wherein the prism is rotatably mounted.

18. The spectrometer arrangement of claim 1 , further comprising a CCD array or a CMOS detector configured to receive a two-dimensional spectrum.

19. A method for generating a two-dimensional spectrum using a spectrometer arrangement, the method comprising:

directing radiation into a spectrometer arrangement via an entrance-slit group, wherein the spectrometer arrangement includes:

the entrance-slit group configured to enable introducing the radiation into the spectrometer arrangement and limiting the optical field of the spectrometer arrangement, the entrance-slit group including a slit wheel and a slit mask;

a first dispersive element adapted to spectrally decompose the radiation in a main dispersion direction; and

a second dispersive element adapted to spectrally decompose the radiation in a transverse dispersion direction that forms an angle with the main dispersion direction such that a two-dimensional spectrum can be produced, wherein the slit wheel is mounted rotatably about an axis of rotation and includes at least one falcate opening having a variable width depending on an angle of rotation of the slit wheel, wherein the width of the at least one falcate opening extends in the transverse dispersion direction, wherein the slit mask includes a mask opening that is longer than a largest width of the at least one falcate opening, and wherein radiation radiates through the at least one falcate opening of the slit wheel and the mask opening of the slit mask into the spectrometer arrangement;

spectrally decomposing the radiation in a main dispersion direction;

spectrally decomposing the radiation in a transverse dispersion direction, which forms an angle with the main dispersion direction such that a two-dimensional spectrum is generated; and

imaging the two-dimensional spectrum on a detector.

20. The method of claim 19 , further comprising:

rotating the slit wheel to a first position having a larger width of the at least one falcate opening such that short-wave diffraction orders are distinguished in the spectrum;

starting an exposure process of the detector;

waiting until a first saturation value of the detector for the short-wave diffraction orders is reached;

rotating the slit wheel to a second position having a smaller width of the at least one falcate opening compared to the first position;

deleting the values of the detector for long-wave diffraction orders;

waiting until a second saturation value of the detector for the long-wave diffraction orders is reached; and

concluding the exposure process and reading the detector.

21. The method of claim 20 , further comprising:

rotating an element for spectral decomposition of the radiation in a transverse dispersion direction to change the wavelength range of the spectrometer arrangement.

22. An optical component group for retrofitting a spectrometer, comprising:

a slit wheel mounted rotatably about an axis of rotation; and

a slit mask,

wherein the slit wheel has a falcate opening having a width in a transverse dispersion direction that changes depending on an angle of rotation of the slit wheel,

wherein the slit mask has a mask opening that is longer than a largest width of the falcate opening, and

wherein radiation radiates through the falcate opening of the slit wheel and the opening of the slit mask into the spectrometer.