IP Library Granted Patent US 10,825,882
Granted Patent B2
US 10,825,882 · App. 16/234,564 · Granted Nov 3, 2020

Semiconductor device and display unit

Inventor: Yuichiro Ishiyama (Tokyo, JP)
Assignee: JOLED INC.
H01L27/3272H01L25/167H01L51/0097H01L51/56
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Quick Facts
Patent No.
US 10,825,882
App. No.
16/234,564
Granted
Nov 3, 2020
Kind
B2
Abstract

A display unit includes a substrate that includes an organic insulating material and a plurality of micro conductors dispersed in the organic insulating material; a semiconductor element provided on the substrate; and a display element layer that is provided on a side opposite to the substrate with respect to the semiconductor element. The display element layer includes a display surface and a plurality of display element that is driven to perform image displaying on the display surface by the semiconductor element.

Claims (33)

1. A display unit comprising:

a substrate that includes an organic insulating material and a plurality of micro conductors dispersed in the organic insulating material;

a semiconductor element provided on the substrate; and

a display element layer that is provided on a side opposite to the substrate with respect to the semiconductor element, and includes a display surface and a plurality of display element that is driven to perform image displaying on the display surface by the semiconductor element wherein

the substrate has a first surface on which the semiconductor element is provided, and a second surface that faces the first surface, and

a density of the micro conductors in an internal portion adjacent to the second surface of the substrate is higher than a density of the micro conductors in an internal portion adjacent to the first surface of the substrate.

2. An imaging unit comprising:

a substrate that includes an organic insulating material and a plurality of micro conductors dispersed in the organic insulating material;

a semiconductor element provided on the substrate; and

an imaging element layer that is provided on a side opposite to the substrate with respect to the semiconductor element, and includes a plurality of imaging element that is driven to read signals from the imaging element by the semiconductor element, wherein

the substrate has a first surface on which the semiconductor element is provided, and a second surface that faces the first surface, and

a density of the micro conductors in an internal portion adjacent to the second surface of the substrate is higher than a density of the micro conductors in an internal portion adjacent to the first surface of the substrate.

3. A semiconductor device comprising:

a substrate that includes an organic insulating material and a plurality of micro conductors dispersed in the organic insulating material; and

a semiconductor element provided on the substrate, wherein

the substrate has a first surface on which the semiconductor element is provided, and a second surface that faces the first surface, and

a density of the micro conductors in an internal portion adjacent to the second surface of the substrate is higher than a density of the micro conductors in an internal portion adjacent to the first surface of the substrate.

4. The semiconductor device according to claim 3 , further comprising an inorganic insulating film between the substrate and the semiconductor element.

5. The semiconductor device according to claim 3 , wherein the organic insulating material includes polyimide.

6. The semiconductor device according to claim 3 , wherein the substrate has a surface resistivity of 10 9 Ω/sq. or less.

7. The semiconductor device according to claim 3 , wherein each of the micro conductors has a diameter of 2 μm or smaller.

8. The semiconductor device according to claim 3 , wherein

the substrate includes a laminate of a first layer and a second layer, and

the micro conductors are included in one or both of the first layer and the second layer.

9. The semiconductor device according to claim 8 , further comprising an insulating layer between the first layer and the second layer.

10. The semiconductor device according to claim 3 , wherein the substrate has a high-density region having a predetermined density of the micro conductors, and a low-density region having a density of the micro conductors lower than the predetermined density of the micro conductors in the high-density region.

11. The semiconductor device according to claim 10 , further comprising a wiring line that is provided on the substrate and is opposed to the low-density region, out of the high-density region and the low-density region.

12. The semiconductor device according to claim 3 , wherein the substrate is coupled to a ground potential.

13. The semiconductor device according to claim 3 , wherein the semiconductor element comprises a thin-film transistor.

14. The semiconductor device according to claim 3 , wherein the substrate comprises a flexible substrate.

15. The semiconductor device according to claim 3 , wherein the micro conductors include metal or carbon.

16. The semiconductor device according to claim 3 , further comprising:

a metal film on a side opposite to the semiconductor element with respect to the substrate and configured to couple the plurality of micro conductors to a ground potential.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2025
From: JDI DESIGN AND DEVELOPMENT G.K.
To: MAGNOLIA BLUE CORPORATION
Reel/Frame 072039/0656 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2024
From: JOLED, INC.
To: JDI DESIGN AND DEVELOPMENT G.K.
Reel/Frame 066382/0619 →
CORRECTION BY AFFIDAVIT FILED AGAINST REEL/FRAME 063396/0671 Recorded Jun 12, 2023
From: JOLED, INC.
To: JOLED, INC.
Reel/Frame 064067/0723 →
SECURITY INTEREST Recorded Apr 20, 2023
From: JOLED, INC.
To: INCJ, LTD.
Reel/Frame 063396/0671 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2018
From: ISHIYAMA, YUICHIRO
To: JOLED INC.
Reel/Frame 047864/0189 →