Granted Patent B2

US 11,203,525 · App. 16/237,360 · Granted Dec 21, 2021

Inventors: Anne Plochowietz (Palo Alto, CA); Matthew Shreve (Mountain View, CA)

Assignee: Palo Alto Research Center Incorporated

B81C99/002H01L21/67271H01L21/67294H01L24/95H01L2224/95133H01L2224/95145H01L2924/1461Y10T29/49133

Abstract

Claims (74)

1. A method, comprising:

analyzing a set of micro-objects located on a surface of a micro-assembler, wherein the micro-assembler comprises an array of force generating pixels;

identifying one or more geometric properties of the set of micro-objects;

dividing the set of micro-objects into a first subset of micro-objects and a second subset of micro-objects based on the one or more geometric properties and one or more control patterns, wherein the one or more control patterns indicate one or more force patterns on one or more portions of the array of force generating pixels, wherein dividing the set of micro-objects comprises:

identifying a center for the set of micro-objects;

identifying a first line that pass through the center;

identifying one or more sets of force generating pixels along a second line that is parallel to the first line; and

applying the one or more control patterns to the one or more sets of force generating pixels.

2. The method of claim 1 , wherein analyzing the set of micro-objects comprises:

determining that the set of micro-objects comprises multiple micro-objects; and

determining that at least two micro-objects of the set of micro-objects in the set of micro-objects are within a threshold distance of each other.

3. The method of claim 1 , wherein the one or more control patterns are applied to force generating pixels that are disposed relative to the set of micro-objects.

4. The method of claim 1 , wherein dividing the set of micro-objects comprises:

identifying one or more sets of force generating pixels disposed around the set of micro-objects, wherein the one or more sets of force generating pixels are located at one or more non-deterministic locations around the set of micro-objects; and

applying the one or more control patterns to the one or more sets of force generating pixels.

5. The method of claim 1 , wherein identifying the one or more geometric properties of the set of micro-objects comprises:

identifying a geometric shape for the set of micro-objects.

6. The method of claim 5 , wherein dividing the set of micro-objects comprises:

identifying one or more edges of the geometric shape; and

applying the one or more control patterns to one or more sets of force generating pixels located at the one or more edges.

7. The method of claim 5 , wherein dividing the set of micro-objects comprises:

identifying one or more corners of the geometric shape; and

applying the one or more control patterns to one or more sets of force generating pixels located at the one or more corners.

8. The method of claim 1 , wherein dividing the set of micro-objects comprises:

identifying a boundary for the set of micro-objects;

identifying a line that is normal to a point in the boundary;

identifying one or more sets of force generating pixels along the line; and

applying the one or more control patterns to the one or more sets of force generating pixels.

9. The method of claim 1 , wherein dividing the set of micro-objects comprises:

identifying a boundary for the set of micro-objects;

identifying a plurality of force generating pixels that are evenly spaced along the boundary; and

applying the one or more control patterns to the plurality of force generating pixels.

10. The method of claim 1 , wherein dividing the set of micro-objects comprises:

identifying a boundary for the set of micro-objects;

identifying non-deterministic points on the boundary; and

applying the one or more control patterns to sets of force generating pixels located at the non-deterministic points.

11. The method of claim 1 , wherein dividing the set of micro-objects comprises:

identifying a boundary for the set of micro-objects;

identifying one or more points within the boundary;

identifying one or more sets of force generating pixels located at the one or more points; and

applying the one or more control patterns to the one or more sets of force generating pixels.

12. The method of claim 1 , wherein the array of force generating pixels comprises a two-dimensional array of electrodes.

13. A method, comprising:

analyzing a set of micro-objects located on a surface of a micro-assembler, wherein the micro-assembler comprises an array of force generating pixels;

identifying one or more geometric properties of the set of micro-objects;

dividing the set of micro-objects into a first subset of micro-objects and a second subset of micro-objects based on the one or more geometric properties and one or more control patterns, wherein the one or more control patterns indicate one or more force patterns on one or more portions of the array of force generating pixels, wherein dividing the set of micro-objects comprises:

identifying a center for the set of micro-objects;

identifying a first line that pass through the center;

identifying one or more sets of force generating pixels along a second line that is normal to the first line; and

applying the one or more control patterns to the one or more sets of force generating pixels.

14. An apparatus, comprising:

a memory configured to store control data;

a processing device, operatively coupled to the memory, the processing device configured to:

analyze a set of micro-objects located a surface of a micro-assembler, wherein the micro-assembler comprises an array of force generating pixels;

identify one or more geometric properties of the set of micro-objects;

divide the set of micro-objects into a first subset of micro-objects and a second-subset of micro-objects based on the one or more geometric properties and one or more control patterns, wherein the one or more control patterns indicate one or more force patterns on one or more portions of the array of force generating pixels, wherein dividing the set of micro-objects comprises:

identifying a center for the set of micro-objects;

identifying a first line that pass through the center;

identifying one or more sets of force generating pixels along a second line that is parallel to the first line; and

applying the one or more control patterns to the one or more sets of force generating pixels.

15. The apparatus of claim 14 , wherein to analyze the set of micro-objects the processing device is further configured to:

determine that the set of micro-objects comprises multiple micro-objects; and

determine that at least two of the set of micro-objects in the set of micro-objects are within a threshold distance of each other.

16. The apparatus of claim 14 , wherein the one or more control patterns are applied to force generating pixels that are disposed relative to the set of micro-objects.

17. The apparatus of claim 14 , wherein to identify the one or more geometric properties of the set of micro-objects, the processing device is further configured to:

identify a geometric shape for the set of micro-objects.

18. A non-transitory computer-readable medium having instruction stored thereon that, when executed by a computer processing device, cause the computer processing device to:

analyze a set of micro-objects located a surface of a micro-assembler, wherein the micro-assembler comprises an array of force generating pixels;

identify one or more geometric properties of the set of micro-objects;

divide the set of micro-objects into a first subset of micro-objects and a second-subset of micro-objects based on the one or more geometric properties and one or more control patterns, wherein the one or more control patterns indicate one or more voltage patterns on one or more portions of the array of force generating pixels, wherein to divide the set of micro-objects, the computer processor is further to:

identify a center for the set of micro-objects;

identify a first line that pass through the center;

identify one or more sets of force generating pixels along a second line that is parallel to the first line; and

apply the one or more control patterns to the one or more sets of force generating pixels.

Assignments (10)

Continuity (1)

Cited By (3)

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