IP Library Patent Application 16237538
Patent Application
App. No. 16/237,538

SYSTEMS AND METHODS FOR DATA COLLECTION AND PREDICTION OF FUTURE STATES OF COMPONENTS

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Patent No.
US None
App. No.
16/237,538
Abstract

Systems and methods for data collection and predication of future states of components are disclosed. A system can include a data acquisition circuit structured to interpret a plurality of detection values, each of the plurality of detection values corresponding to input received from a detection package, the detection package comprising at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system. The system can also include a data analysis circuit to predict a future state of the component based, at least in part, upon the plurality of detection values and data received from data collection band circuit.

Claims (28)

1 . A system for data collection, the system comprising:

a data acquisition circuit structured to interpret a plurality of detection values, each of the plurality of detection values corresponding to input received from a detection package, the detection package comprising at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system; and

a data analysis circuit structured to predict a future state of the component based, at least in part, upon the plurality of detection values and data received from data collection band circuit.

2 . The system of claim 1 , wherein the data collection band circuit is adapted to alter at least one collection parameter for at least one of the plurality of input sensors.

3 . The system of claim 2 , wherein the at least one collection parameter is a bandwidth parameter.

4 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a multiplexing a plurality of the plurality of input sensors.

5 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a timing parameter of at least one of the plurality of input sensors.

6 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a granularity of data collection of at least one of the plurality of input sensors.

7 . The system of claim 2 , wherein the at least one collection parameter is utilized to control a storage parameter for at least one of the plurality of input sensors.

8 . The system of claim 1 , wherein the future state corresponds to at least one state selected from a list consisting of: a specified time, a state of a process, a state of a parameter of interest, a state at peak energy consumption, a state at highest temperature value, a state at maximum noise value, and a state when an aspect of system redundancy is at a lowest point.

9 . A method comprising:

interpreting a plurality of detection values, each of the plurality of detection values corresponding to input received from a detection package, the detection package comprising at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system; and

predicting a future state of at least one component based, at least in part, upon the plurality of detection values.

10 . The method of claim 9 , further comprising at least one collection parameter for at least one of the plurality of input sensors.

11 . The method of claim 10 , wherein the at least one collection parameter is a bandwidth parameter.

12 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a multiplexing of a plurality of the plurality of input sensors.

13 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a timing parameter of at least one of the plurality of input sensors.

14 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a granularity of data collection of at least one of the plurality of input sensors.

15 . The method of claim 10 , wherein the at least one collection parameter is utilized to control a storage parameter for at least one of the plurality of input sensors.

16 . A system for data collection, the system comprising:

a data acquisition circuit structured to interpret a plurality of detection values, each of the plurality of detection values corresponding to at least one of a plurality of input sensors, each of the plurality of input sensors operatively coupled to a component of an industrial system; and

a data analysis circuit structured to predict a future state of the component based, at least in part, upon the plurality of detection values and data received from data collection band circuit.

17 . The system of claim 16 , wherein the data collection band circuit is structured to alter at least one collection parameter for at least one of the plurality of input sensors.

18 . The system of claim 17 , wherein the at least one collection parameter is a bandwidth parameter.

19 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a multiplexing of plurality of the plurality of input sensors.

20 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a timing parameter of at least one of the plurality of input sensors.

21 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a granularity of data collection of at least one of the plurality of input sensors.

22 . The system of claim 17 , wherein the at least one collection parameter is utilized to control a storage parameter for at least one of the plurality of input sensors.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2020
From: CELLA, CHARLES HOWARD; DUFFY, GERALD WILLIAM, JR; MCGUCKIN, JEFFREY P.; DESAI, MEHUL
To: STRONG FORCE IOT PORTFOLIO 2016, LLC
Reel/Frame 052486/0898 →