IP Library Granted Patent US 11,695,085
Granted Patent B2
US 11,695,085 · App. 16/245,613 · Granted Jul 4, 2023

Photovoltaic devices including nitrogen-containing metal contact

Inventors: Upali Jayamaha (Toledo, OH); Michael T. Steele (Sylvania, OH); Syed Zafar (Perrsyburg, OH)
Assignee: First Solar, Inc.
H01L31/022425H01L31/0749H01L31/1828H01L31/1884Y02E10/50
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Quick Facts
Patent No.
US 11,695,085
App. No.
16/245,613
Granted
Jul 4, 2023
Kind
B2
Abstract

A photovoltaic cell can include a nitrogen-containing metal layer in contact with a semiconductor layer.

Claims (27)

1. A method of manufacturing a photovoltaic cell comprising:

forming a first semiconductor layer over a substrate, wherein the first semiconductor layer comprises CdTe, CdSe, or mixtures thereof;

forming a second semiconductor layer over the first semiconductor layer, wherein the second semiconductor layer comprises ZnTe;

depositing a metal layer over the second semiconductor layer in the presence of nitrogen to form a nitrogen-containing metal layer in contact with the second semiconductor layer, wherein the nitrogen-containing metal layer includes an aluminum nitride, a molybdenum nitride, a nickel nitride, a titanium nitride, a tungsten nitride, a selenium nitride, a tantalum nitride, or a vanadium nitride;

depositing an aluminum layer over the nitrogen-containing metal layer; and

depositing a chromium layer over the aluminum layer.

2. The method of claim 1 , further comprising:

placing a transparent conductive layer on the substrate; and

placing a capping layer between the transparent conductive layer and the first semiconductor layer.

3. The method of claim 1 , wherein the step of depositing the metal layer over the second semiconductor layer in the presence of nitrogen further comprises: sputtering in a nitrogen gas mixture comprising 2% to 50% nitrogen.

4. The method of claim 1 , wherein the step of depositing the metal layer over the second semiconductor layer in the presence of nitrogen further comprises: sputtering in a nitrogen argon gas mixture composed of 13% nitrogen and 87% argon.

5. The method of claim 2 , wherein the nitrogen-containing metal layer comprises an atomic percent nitrogen in a range between 1 percent and 50 percent.

6. The method of claim 1 , further comprising:

transporting the substrate into a series of one or more deposition stations on a conveyor, wherein at least one deposition station comprises a deposition chamber heated to a processing temperature in a range from about 450° C. to about 700° C., and

depositing a semiconductor material over the substrate, thereby forming at least one of the first semiconductor layer or the second semiconductor layer.

7. The method of claim 1 , wherein the step of forming the first semiconductor layer comprises transport of vapor from a source to the substrate.

8. A method of manufacturing a photovoltaic cell comprising:

transporting a substrate into a series of one or more deposition stations on a conveyor, wherein at least one deposition station comprises a deposition chamber heated to a processing temperature in a range from about 450° C. to about 700° C.;

depositing a transparent conductive oxide layer over the substrate;

depositing a first semiconductor layer over the transparent conductive oxide layer by transport of vapor from a source to the substrate;

depositing a nitrogen-containing metal layer over the first semiconductor layer by sputtering a first metal in the presence of nitrogen to form the nitrogen-containing metal layer,

wherein the first metal is selected from the group consisting of: aluminum, molybdenum, nickel, titanium, tungsten, selenium, tantalum, vanadium, and combinations thereof;

whereby the nitrogen-containing metal layer comprises one or more of: aluminum nitride, molybdenum nitride, nickel nitride, titanium nitride, tungsten nitride, selenium nitride, tantalum nitride, or vanadium nitride;

depositing a second metal layer over and in contact with the nitrogen-containing metal layer,

wherein the second metal is selected from the group consisting of: aluminum, copper, nickel, tungsten, lead, molybdenum, and combinations thereof; and

wherein depositing the second metal layer comprises sputtering using argon as a sputtering gas; and

depositing a chromium layer over and in contact with the second metal layer.

Assignments (2)
RELEASE OF SECURITY INTEREST Recorded Feb 13, 2026
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 074858/0364 →
SECURITY INTEREST Recorded Jul 10, 2023
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 064237/0462 →