IP Library Granted Patent US 12,090,574
Granted Patent B2
US 12,090,574 · App. 16/247,075 · Granted Sep 17, 2024

Laser slicing apparatus and laser slicing method

Inventors: Kazuki Fujiwara (Osaka, JP); Yoshiro Kitamura (Osaka, JP); Katsuji Sumimoto (Nara, JP)
Assignee: PANASONIC HOLDINGS CORPORATION
B23K26/38B23K26/0006B23K26/0619B23K26/0624B23K26/0676B23K26/0861B23K26/53B23K2101/40B23K2103/56
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Quick Facts
Patent No.
US 12,090,574
App. No.
16/247,075
Granted
Sep 17, 2024
Kind
B2
Abstract

A laser slicing apparatus for dividing a workpiece with a laser beam, including: a light shielding area detection section that detects light shielding areas existing on a side of a first surface of the workpiece; and a control section that radiates a first laser beam from the side of the first surface so as to scan across a whole area of the first surface of the workpiece and form a first modified layer in a to-be-sliced plane inside the workpiece, and that radiates a second laser beam to the light shielding areas of the workpiece from a second surface on an opposite side of the first surface and form a second modified layer in such a manner that the second modified layer is continuous with the first modified layer in the to-be-sliced plane.

Claims (21)

1. A laser slicing apparatus configured to divide a workpiece horizontally into an upper layer side and a lower layer side with a laser beam including a first laser beam and a second laser beam, the laser slicing apparatus comprising:

a hardware processor configured to: detect a defective part existing on a side of a first surface of the workpiece;

radiate the first laser beam from the side of the first surface so as to scan across a whole area of the first surface of the workpiece, the first laser beam having a first point of convergence, and form a first modified layer coinciding with the first point of convergence in a to-be-sliced plane inside the workpiece; and

radiate the second laser beam to, in plan view, only an area where the defective part exists in the workpiece from a second surface on an opposite side of the first surface, the second laser beam having a second point of convergence, and form a second modified layer coinciding with the second point of convergence in such a manner that the second modified layer is continuous with the first modified layer in the to-be-sliced plane,

wherein the laser slicing apparatus is configured to slice the workpiece horizontally into the upper layer side and the lower layer side along the to-be-sliced plane in a detaching step, after the first modified layer and the second modified layer are formed.

2. The laser slicing apparatus according to claim 1 , wherein a substrate material is separated from the workpiece.

3. The laser slicing apparatus according to claim 2 , wherein the workpiece is a plate-like body.

4. The laser slicing apparatus according to claim 3 , wherein the workpiece is a plate-like member which has undergone a planarizing process until the first surface and the second surface have a predetermined surface roughness or less.

5. The laser slicing apparatus according to claim 1 , wherein the workpiece is a plate-like semiconductor material having a first plate surface and a second plate surface, and the first surface is a surface of a side where more of the defective part are exposed among the first plate surface and the second plate surface of the workpiece.

6. The laser slicing apparatus according to claim 1 , wherein the workpiece is a semiconductor material, and wherein the side of the first surface is located on the upper layer side, and wherein the upper layer side is used as a semiconductor wafer.

7. The laser slicing apparatus according to claim 1 , wherein the workpiece is gallium nitride, and wherein the side of the first surface is located on the upper layer side, and wherein the upper layer side is used as a semiconductor wafer.

8. The laser slicing apparatus according to claim 1 , wherein the workpiece is a brittle material.

9. The laser slicing apparatus according to claim 1 , wherein the hardware processor sets a focus point of the first laser beam to a height position of the to-be-sliced plane to form the first modified layer and sets a focus point of the second laser beam to the height position of the to-be-sliced plane to form the second modified layer.

10. The laser slicing apparatus according to claim 9 , wherein the hardware processor causes a laser beam path of a laser beam radiated by a laser oscillator to switch to radiate the first laser beam and the second laser beam to the workpiece.

11. The laser slicing apparatus according to claim 1 , wherein the hardware processor detects the defective part on a basis of information from a camera that captures an image of a surface state of the first surface of the workpiece.

12. A laser slicing method for slicing a workpiece horizontally into an upper layer side and a lower layer side with a laser beam including a first laser beam and a second laser beam, the method comprising:

detecting a defective part existing on a side of a first surface of the workpiece;

radiating the first laser beam from the side of the first surface so as to scan across a whole area of the first surface of the workpiece, the first laser beam having a first point of convergence, and forming a first modified layer coinciding with the first point of convergence in a to-be-sliced plane inside the workpiece; and

radiating the second laser beam to, in plan view, only an area where the defective part exists in the workpiece from a second surface on an opposite side of the first surface, the second laser beam having a second point of convergence, and forming a second modified layer coinciding with the second point of convergence in such a manner that the second modified layer is continuous with the first modified layer in the to-be-sliced plane,

slicing the workpiece horizontally into the upper layer side and the lower layer side along the to-be-sliced plane in a detaching step, after the first modified layer and the second modified layer are formed.

13. The laser slicing apparatus according to claim 1 , wherein a width of a radiation region of the second laser is a width corresponding to a width of the defective part on the first surface of the workpiece in cross-sectional view of the workpiece.

Assignments (2)
CHANGE OF NAME Recorded May 9, 2022
From: PANASONIC CORPORATION
To: PANASONIC HOLDINGS CORPORATION
Reel/Frame 059909/0607 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 19, 2019
From: FUJIWARA, KAZUKI; KITAMURA, YOSHIRO; SUMIMOTO, KATSUJI
To: PANASONIC CORPORATION
Reel/Frame 048933/0716 →
Priority Claims (2)
JP 2018-007511 · Jan 19, 2018 · national
JP 2018-212024 · Nov 12, 2018 · national
Continuity (1)
Related Publication 20190224784A1 · Jul 25, 2019