Semiconductor device

1. A semiconductor device, comprising:

a carrier;

a current blocking layer, formed on the carrier;

a function structure, formed on the current blocking layer and comprising a surface opposite to the current blocking layer, wherein the function structure comprises a light-emitting structure emitting a light beam with a first peak wavelength in a first wavelength range of ultraviolet (UV) light;

a protective structure, formed on the function structure and exposing a portion of the surface; and

an electrode, formed on the protective structure, wherein the protective structure reflects the light beam away from the electrode.

2. The semiconductor device of claim 1 , wherein the protective structure functions as a reflector having a high reflectivity in a second wavelength range of ultraviolet (UV) light.

3. The semiconductor device of claim 1 , wherein the protective structure comprises a distributed Bragg reflector (DBR) structure.

4. The semiconductor device of claim 3 , wherein the DBR structure comprises semiconductor pairs, each of the semiconductor pairs comprises a first semiconductor material layer having a first refractive index and a second semiconductor material layer having a second refractive index, the first refractive index being greater than the second refractive index.

5. The semiconductor device of claim 4 , wherein the first semiconductor material layer comprises Al x Ga 1-x N (0.6≤x≤0.8), and the second semiconductor material layer comprises Al y Ga 1-y N (0.9≤y≤1).

6. The semiconductor device of claim 4 , wherein the first refractive index and the second refractive index are between 2.0 and 2.5.

7. The semiconductor device of claim 1 , wherein the electrode comprises a plurality of extending portions, formed respectively on the protective structure between the exposed portion of the surface.

8. The semiconductor device of claim 4 , wherein a number of the semiconductor pairs is between 10 and 40.

9. The semiconductor device of claim 1 , wherein the carrier comprises a conductive material.

10. The semiconductor device of claim 9 , wherein the conductive material is selected from Si, SiC, W, Cu, Mo, and the combination thereof.

11. The semiconductor device of claim 1 , further comprising a bonding layer formed between the carrier and the function structure.

12. The semiconductor device of claim 1 , further comprising a contact layer formed between the carrier and the function structure.

13. The semiconductor device of claim 12 , wherein a material of the contact layer comprises Ag.

14. The semiconductor device of claim 1 , wherein a portion of the current blocking layer is not covered by the function structure.

15. The semiconductor device of claim 1 , wherein a material of the current blocking layer comprises SiO 2 .

16. The semiconductor device of claim 1 , further comprising a passivation layer formed on the function structure and covering the portion of the surface exposed by the protective structure.

17. A semiconductor device, comprising:

a carrier;

a current blocking layer, formed on the carrier;

a function structure, formed on the current blocking layer and comprising a surface opposite to the current blocking layer;

a protective structure, formed on the function structure, and wherein the protective structure covers a portion of the surface; and

an electrode, formed on the protective structure,

wherein a portion of the current blocking layer is not covered by the function structure.

18. The semiconductor device of claim 17 , further comprising a passivation layer formed on the function structure, covering the portion of the surface exposed by the electrode, and contact with the electrode.

19. The semiconductor device of claim 18 , wherein the function structure comprises a light-emitting structure emitting a light beam with a first peak wavelength in a first wavelength range of ultraviolet (UV) light.