IP Library Granted Patent US 10,847,448
Granted Patent B2
US 10,847,448 · App. 16/247,998 · Granted Nov 24, 2020

Semiconductor device and method of manufacturing the same

Inventors: Keita Hatasa (Toyota, JP); Hiroyuki Takeda (Toyota, JP); Satoshi Takahagi (Nagakute, JP)
Assignee: DENSO CORPORATION
H01L23/492H01L23/42H01L23/49541H01L23/49548H01L23/49562H01L23/49568H01L24/32H01L24/33H01L24/83H01L24/48H01L24/73H01L24/92H01L2224/05624H01L2224/26175H01L2224/29101H01L2224/32245H01L2224/33181H01L2224/48091H01L2224/48247H01L2224/73265H01L2224/83101H01L2224/83385H01L2224/83447H01L2224/83801H01L2224/92247H01L2924/00014H01L2924/1033H01L2924/10253H01L2924/10272H01L2924/13055H01L2924/13091
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Quick Facts
Patent No.
US 10,847,448
App. No.
16/247,998
Granted
Nov 24, 2020
Kind
B2
Abstract

A semiconductor device includes a semiconductor element, a first conductor bonded to an upper surface of the semiconductor element via a first solder layer, and a second conductor bonded to an upper surface of the first conductor via a second solder layer. The first conductor includes at least one groove formed in a stacking direction of the semiconductor element, the first conductor, and the second conductor on a side surface adjacent to the upper surface of the first conductor.

Claims (18)

1. A semiconductor device comprising:

a semiconductor element;

a first conductor bonded to an upper surface of the semiconductor element via a first solder layer; and

a second conductor bonded to an upper surface of the first conductor via a second solder layer,

wherein the first conductor includes at least one groove provided in a stacking direction of the semiconductor element, the first conductor, and the second conductor on a side surface adjacent to the upper surface of the first conductor, and

wherein the at least one groove of the first conductor extends to the upper surface of the first conductor and does not extend to a lower surface of the first conductor.

2. The semiconductor device according to claim 1 , wherein the first conductor includes the at least one groove in a range corresponding to a corner portion of the semiconductor element on the side surface of the first conductor.

3. The semiconductor device according to claim 2 , wherein the first conductor includes the at least one groove in at least one corner portion among four corner portions of the side surface.

4. The semiconductor device according to claim 3 , wherein the corner portion is chamfered.

5. The semiconductor device according to claim 3 , wherein the corner portion is cut or pressed to have a cross shape when the first conductor is viewed in a plan view.

6. The semiconductor device according to claim 1 , wherein the first conductor includes a plurality of grooves.

7. The semiconductor device according to claim 1 , wherein an angle formed by a fillet shape of a solder located between the first conductor and the semiconductor element is smaller than 90°.

8. A method of manufacturing a semiconductor device, the method comprising:

solder-bonding a first conductor to an upper surface of a semiconductor element to form a laminate; and

solder-bonding a second conductor to an upper surface of the first conductor in the laminate, wherein:

the first conductor includes at least one groove provided in a stacking direction of the laminate on a side surface adjacent to the upper surface of the first conductor;

the at least one groove extends to the upper surface of the first conductor and does not extend to a lower surface of the first conductor; and

when the second conductor is solder-bonded to the upper surface of the first conductor, the second conductor is disposed on the lower side of the laminate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: TOYOTA JIDOSHA KABUSHIKI KAISHA
To: DENSO CORPORATION
Reel/Frame 052285/0419 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2019
From: HATASA, KEITA; TAKEDA, HIROYUKI; TAKAHAGI, SATOSHI
To: TOYOTA JIDOSHA KABUSHIKI KAISHA
Reel/Frame 048076/0674 →