IP Library Granted Patent US 10,811,391
Granted Patent B2
US 10,811,391 · App. 16/271,946 · Granted Oct 20, 2020

Semiconductor device and method for manufacturing semiconductor device

Inventors: Akira Tojo (Naka, JP); Kazuo Shimokawa (Yokohama, JP); Masayuki Uchida (Yokohama, JP); Takashi Ito (Yokohama, JP); Masatoshi Tanabe (Yokohama, JP)
Assignees: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEMORY CORPORATION
H01L25/0657H01L25/50H01L2225/0651H01L2225/06506H01L2225/06562
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Quick Facts
Patent No.
US 10,811,391
App. No.
16/271,946
Granted
Oct 20, 2020
Kind
B2
Abstract

A semiconductor device includes a base, a first semiconductor chip mounted on the base, and a second semiconductor chip provided above the first semiconductor chip. The second semiconductor chip includes a first portion, a second portion including a region directly above a center of the first semiconductor chip, and a third portion including part of a portion of the second semiconductor chip other than a region directly above the first semiconductor chip. The second portion is thicker than the first portion. The third portion is thicker than the second portion and is disposed at a position sandwiching the first semiconductor chip.

Claims (44)

1. A semiconductor device, comprising:

a base;

a first semiconductor chip mounted on the base; and

a second semiconductor chip provided above the first semiconductor chip,

the second semiconductor chip including

a first portion,

a second portion including a region directly above a center of the first semiconductor chip, the second portion being thicker than the first portion, notches being provided on a bottom surface of the second portion, and

a third portion including part of a portion of the second semiconductor chip other than a region directly above the first semiconductor chip, the third portion being thicker than the second portion and being disposed at a position sandwiching the first semiconductor chip.

2. The device according to claim 1 , wherein a curvature radius of an upper end portion of a side surface of the third portion facing the second portion is larger than a curvature radius of a lower end portion of the side surface.

3. The device according to claim 1 , further comprising:

a first wire connecting the first semiconductor chip to the base;

a second wire electrically connecting the second semiconductor chip to the base;

a plurality of third semiconductor chips provided on the second semiconductor chip; and

a plurality of third wires electrically connecting the third semiconductor chip to the base,

the first portion being disposed in a region directly above the first wire,

the third semiconductor chips not being disposed in a region directly above a portion of the second semiconductor chip where the second wire is connected,

for one of the third semiconductor chips, other third semiconductor chips are not disposed in a region directly above a portion of the one of the third semiconductor chips where the third wire is connected.

4. The device according to claim 1 , wherein a configuration of the first portion is two line configurations parallel to each other when viewed from above.

5. The device according to claim 1 , wherein a configuration of the first portion is a lattice configuration when viewed from above.

6. A semiconductor device, comprising:

a base;

a first semiconductor chip mounted on the base; and

a second semiconductor chip provided above the first semiconductor chip,

the second semiconductor chip including

a first portion,

a second portion including a region directly above a center of the first semiconductor chip, the second portion being thicker than the first portion, notches being provided on a bottom surface of the second portion, and

a third portion including part of a portion of the second semiconductor chip other than a region directly above the first semiconductor chip, the third portion being thicker than the second portion and being disposed at a position sandwiching the first semiconductor chip,

wherein a curvature radius of an upper end portion of a side surface of the third portion facing the second portion is larger than a curvature radius of a lower end portion of the side surface,

wherein an R/D ratio is 0.4 or more, D being a difference between a thickness of the third portion and a thickness of the first portion, R being the curvature radius of the upper end portion of the side surface.

7. The device according to claim 6 , wherein the R/D ratio is 0.8 or more.

8. A semiconductor device, comprising:

a base;

a first semiconductor chip mounted on the base; and

a second semiconductor chip provided above the first semiconductor chip,

the second semiconductor chip including

a first portion,

a second portion including a region directly above a center of the first semiconductor chip, the second portion being thicker than the first portion, notches being provided on a bottom surface of the second portion, and

a third portion including part of a portion of the second semiconductor chip other than a region directly above the first semiconductor chip, the third portion being thicker than the second portion and being disposed at a position sandwiching the first semiconductor chip,

wherein the second semiconductor chip further includes a fourth portion positioned at an end portion of the second semiconductor chip, the fourth portion being thicker than the first portion and thinner than the third portion.

9. A method for manufacturing a semiconductor device, comprising:

mounting a first semiconductor chip on a base;

forming a plurality of first portions having line configurations by grinding a surface of a second semiconductor chip to a first depth;

forming a second portion having a line configuration by grinding the surface to a second depth shallower than the first depth, the forming the second portion including grinding the surface using a blade multiple times; and

mounting the second semiconductor chip at the base to cause the second portion to oppose a center of the first semiconductor chip.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Jan 31, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058905/0582 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2019
From: TOJO, AKIRA; SHIMOKAWA, KAZUO; UCHIDA, MASAYUKI; ITO, TAKASHI; TANABE, MASATOSHI
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEMORY CORPORATION
Reel/Frame 048289/0303 →
Priority Claims (1)
JP 2018-045587 · Mar 13, 2018 · national
Continuity (1)
Related Publication 20190287945A1 · Sep 19, 2019