IP Library Granted Patent US 10,527,920
Granted Patent B1
US 10,527,920 · App. 16/297,538 · Granted Jan 7, 2020

System, method and device for a high fidelity electro-optical simulator

Inventors: Yei Wo (East Brunswick, NJ); Bruce P. Boczar (Trevose, PA); Richard Gifford (Toms River, NJ); Joseph M. Aletta (Jackson, NJ)
Assignee: DHPC Technologies, Inc.
G03B21/60G02B27/2221G03B21/56G03B21/58G03B21/62
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Quick Facts
Patent No.
US 10,527,920
App. No.
16/297,538
Granted
Jan 7, 2020
Kind
B1
Abstract

A system, method, and device for simulating an emission signature, which contains representative intensity, temporal, and spectral emission profiles of a weapon system or weapon platform for the purpose of testing an optical detection device. A projection system optically projects the emission signature. A projection screen is provided that has a concave curvature. The concave curvature possesses a first focal point and a second focal point. Any light emanating from the second focal toward the projection screen is reflected by the projection screen toward the first focal point. The projection system is positioned at the second focal point and the optical detection system is positioned at the first focal point. In this manner, the emission signature projected by the projector system is redirected to the optical detection system.

Claims (21)

1. A system for simulating an emission signature for the purpose of testing an optical detection device, said system comprising:

a projection system that optically projects said emission signature;

a projection screen having a concave curvature that produces a first focal point and a second focal point that are equidistant from a common midplane and are equidistant from said projection screen, wherein any light emanating from said second focal point toward said projection screen is reflected by said projection screen toward said first focal point with reflectivity losses caused by said projection screen;

wherein said projection system is positioned at said second focal point and said optical detection device is positioned at said first focal point.

2. The system according to claim 1 , wherein said emission signature contains a representative intensity profile, temporal profile, and spectral profile, and wherein said projection system compensates for said reflectivity losses and optically projects said emission signature with said representative intensity profile, temporal profile, and spectral profile.

3. The system according to claim 1 , wherein said emission signature includes light selected from a spectral range that includes ultraviolet, visible, and infrared.

4. The system according to claim 1 , wherein said emission signature is selected from a database of emission signatures specifying representative signature characteristics.

5. A system for simulating an emission signature for the purpose of testing an optical detection device, said system comprising:

a projection system that optically projects said emission signature;

a projection screen having a curvature with a midplane, a first focal point and a second focal point, wherein said first focal point and said second focal point are equidistant from both said projection screen and said midplane,

wherein said optical detection device is positioned at said first focal point, and

wherein any of said emission signature emanating from said second focal point toward said projection screen is reflected by said projection screen toward said first focal point.

6. The system according to claim 5 , wherein said projection screen has reflectivity losses and said emission signature is adjusted to compensate for said reflectivity losses.

7. The system according to claim 5 , wherein said emission signature is selected from a database of emission signatures specifying representative signature characteristics.

8. A method for simulating an emission signature for the purpose of testing an optical detection device, said method comprising the steps of:

providing a curved projection screen that directs light emanating from a first focal point to a second focal point that is separate and distinct from said first focal point, wherein said first focal point and said second focal point are equidistant from said curved projection screen;

positioning a projection system at said first focal point that optically projects said emission signature toward said curved projection screen;

positioning said optical detection device at said second focal point, wherein said curved projection screen directs said emission signature projected from said projection system toward said optical detection device.

9. The method according to claim 8 , wherein providing a curved projection screen includes providing said curved projection screen with a midplane, wherein said first focal point and said second focal point are equidistant from said midplane.

10. The method according to claim 8 , wherein said emission signature includes light selected from ultraviolet, visible and infrared spectrums.

11. The method according to claim 8 , wherein said curved projection screen has reflectivity losses and said method includes adjusting said emission signature to compensate for said reflectivity losses.

Assignments (3)
FIRST LIEN SECURITY AGREEMENT Recorded May 6, 2021
From: PERSPECTA LABS INC.; PERSPECTA ENGINEERING INC.; PERSPECTA SERVICES & SOLUTIONS INC.; KNIGHT POINT SYSTEMS, LLC; DHPC TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 056168/0001 →
SECOND LIEN SECURITY AGREEMENT Recorded May 6, 2021
From: PERSPECTA LABS INC.; PERSPECTA ENGINEERING INC.; PERSPECTA SERVICES & SOLUTIONS INC.; KNIGHT POINT SYSTEMS, LLC; DHPC TECHNOLOGIES, INC.
To: ALTER DOMUS (US) LLC
Reel/Frame 056168/0378 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 8, 2019
From: WO, YEI; BOCZAR, BRUCE P.; GIFFORD, RICHARD; ALETTA, JOSEPH M.
To: DHPC TECHNOLOGIES, INC.
Reel/Frame 048553/0083 →
Continuity (1)
Provisional Application 62685117 · Jun 14, 2018
Cited By (1)
US 12,596,862