IP Library Granted Patent US 11,099,682
Granted Patent B2
US 11,099,682 · App. 16/303,636 · Granted Aug 24, 2021

Binding region connection structure, touch screen and display device

Inventors: Qingpu Wang (Beijing, CN); Lei Zhang (Beijing, CN); Tsungchieh Kuo (Beijing, CN); Zhi Zhang (Beijing, CN); Xiaoyue He (Beijing, CN)
Assignees: BOE Technology Group Co., Ltd.; Hefei Xinsheng Optoelectronics Technology Co., ltd.
G06F3/04164G06F3/047G06F3/0412G06F3/0443G06F3/0446G06F2203/04102G06F2203/04103
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Quick Facts
Patent No.
US 11,099,682
App. No.
16/303,636
Granted
Aug 24, 2021
Kind
B2
Abstract

The present disclosure provides a bonding region connection structure, a touch screen, and a display device. The bonding region connection structure for connecting a touch substrate and a flexible printed circuit includes: a plurality of electrode trace pins disposed at the bonding region, wherein the bonding region is between the touch substrate and the flexible printed circuit, each of the plurality of the electrode trace pins being respectively configured to connect to a touch electrode on the touch substrate and an electrode on the flexible printed circuit; and a plurality of dummy pins respectively disposed on both sides of the electrode trace pins, one end of each of the plurality of dummy pins leading to the touch electrode being respectively connected to a corresponding first test point by a lead wire, and configured to measure impedance of the bonding region.

Claims (24)

1. A bonding region connection structure for connecting a touch substrate and a flexible printed circuit, comprising:

a plurality of electrode trace pins disposed at a bonding region, wherein the bonding region is between the touch substrate and the flexible printed circuit, each of the plurality of the electrode trace pins being respectively configured to connect to a touch electrode on the touch substrate and an electrode on the flexible printed circuit; and

a plurality of dummy pins respectively disposed on both sides of the electrode trace pins, one end of each of the plurality of dummy pins leading to the touch electrode being respectively connected to a corresponding first test point by a lead wire, and configured to measure impedance of the bonding region.

2. The bonding region connection structure according to claim 1 , wherein the plurality of electrode trace pins is distributed in a single row array and disposed at an intermediate portion of the bonding region, and the plurality of dummy pins respectively are disposed on both sides of the intermediate portion of the bonding region.

3. The bonding region connection structure according to claim 2 , wherein the plurality of electrode trace pins has same length, and a length of the dummy pin is gradually shortened in a direction away from the intermediate portion of the bonding region.

4. The bonding region connection structure according to claim 3 , wherein at least two of the dummy pins are respectively disposed on both sides of the intermediate portion of the bonding region.

5. The bonding region connection structure according to claim 4 , wherein three dummy pins are respectively disposed on both sides of the intermediate area of the bonding region.

6. The bonding region connection structure according to claim 5 , wherein a ratio of lengths of the electrode trace pins to lengths of the corresponding dummy pins in the direction away from the intermediate portion of the bonding region is 1:1:0.75:0.5.

7. The bonding region connection structure according to claim 6 , wherein a ratio of effective conduction areas of dummy pins corresponding to the first test points is 2:3:4, and the effective conduction areas of dummy pins are gradually shortened in the direction away from the intermediate portion of the bonding region.

8. The bonding region connection structure of claim 1 , wherein one end of each of the plurality of dummy pins leading to the electrode is connected to a corresponding second test point by a connecting finger, and the second test point and the first test point corresponding to the same dummy pin form a test channel.

9. The bonding region connection structure according to claim 8 , wherein the first test point, the second test point and the lead wire are made from material of the same layer.

10. The bonding region connection structure according to claim 9 , wherein the first test point is integrally formed with the lead wire and the dummy pin.

11. A touch screen comprising:

a touch substrate;

a flexible printed circuit; and

a bonding region connection structure for connecting a touch substrate and a flexible printed circuit, comprising:

a plurality of electrode trace pins disposed at the bonding region, wherein the bonding region is between the touch substrate and the flexible printed circuit, each of the plurality of the electrode trace pins being respectively configured to connect to a touch electrode on the touch substrate and an electrode on the flexible printed circuit, and

a plurality of dummy pins respectively disposed on both sides of the electrode trace pins, one end of each of the plurality of dummy pins leading to the touch electrode being respectively connected to a corresponding first test point by a lead wire, and configured to measure impedance of the bonding region.

12. A display device comprising a touch screen which comprises:

a touch substrate,

a flexible printed circuit; and

a bonding region connection structure for connecting a touch substrate and a flexible printed circuit, comprising:

a plurality of electrode trace pins disposed at the bonding region, wherein the bonding region is between the touch substrate and the flexible printed circuit, each of the plurality of the electrode trace pins being respectively configured to connect to a touch electrode on the touch substrate and an electrode on the flexible printed circuit; and

a plurality of dummy pins respectively disposed on both sides of the electrode trace pins, one end of each of the plurality of dummy pins leading to the touch electrode being respectively connected to a corresponding first test point by a lead wire, and configured to measure impedance of the bonding region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2018
From: WANG, QINGPU; ZHANG, LEI; KUO, TSUNGCHIEH; ZHANG, ZHI; HE, XIAOYUE
To: BOE TECHNOLOGY GROUP CO., LTD.; HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 047614/0552 →
Priority Claims (1)
CN 201720667455.8 · Jun 9, 2017 · national
Continuity (1)
Related Publication 20210117066A1 · Apr 22, 2021