IP Library Granted Patent US 11,532,686
Granted Patent B2
US 11,532,686 · App. 16/330,719 · Granted Dec 20, 2022

Array substrate, display apparatus, and method of fabricating array substrate

Inventors: Xinhong Lu (Beijing, CN); Ke Wang (Beijing, CN); Hehe Hu (Beijing, CN); Ce Ning (Beijing, CN); Wei Yang (Beijing, CN)
Assignee: BOE Technology Group Co., Ltd.
H01L27/3272H01L27/3262H01L27/3265H01L29/78618H01L29/78633H01L29/78645H01L2227/323
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Quick Facts
Patent No.
US 11,532,686
App. No.
16/330,719
Granted
Dec 20, 2022
Kind
B2
Abstract

An array substrate includes a base substrate; a first thin film transistor on the base substrate and including a first active layer, a first gate electrode, a first source electrode and a first drain electrode; a second thin film transistor on the base substrate and including a second active layer, a second gate electrode, a second source electrode and a second drain electrode; a first gate insulating layer between the first active layer and the first gate electrode; and a second gate insulating layer between the second active layer and the second gate electrode, the second gate insulating layer being different from the first gate insulating layer. The first source electrode, the first drain electrode, and the second gate electrode are in a same layer. The first source electrode and the first drain electrode are on a side of the second gate insulating layer distal to the base substrate.

Claims (70)

1. An array substrate, comprising:

a base substrate;

a first thin film transistor on the base substrate and comprising a first active layer, a first gate electrode, a first source electrode and a first drain electrode, the first active layer being a silicon active layer;

a second thin film transistor on the base substrate and comprising a second active layer, a second gate electrode, a second source electrode and a second drain electrode, the second active layer being a metal oxide active layer;

a first gate insulating layer between the first active layer and the first gate electrode;

a second gate insulating layer between the second active layer and the second gate electrode, the second gate insulating layer being different from the first gate insulating layer;

an insulating layer on a side of the first gate electrode distal to the base substrate;

a capacitor electrode on a side of the insulating layer distal to the first gate electrode; and

a buffer layer on a side of the capacitor electrode distal to the base substrate;

wherein the first source electrode, the first drain electrode, and the second gate electrode are in a same layer;

the first source electrode and the first drain electrode are on a side of the second gate insulating layer distal to the base substrate;

the capacitor electrode and the first gate electrode constitute a storage capacitor in the first thin film transistor;

the buffer layer is in direct contact with the second active layer; and

at least a sub-layer of the buffer layer that is in direct contact with the second active layer comprises SiO x , 0<x<2.

2. The array substrate of claim 1 , wherein the second gate insulating layer is in direct contact with the first source electrode and the first drain electrode.

3. The array substrate of claim 1 , wherein the insulating layer is in direct contact with the capacitor electrode and the first gate electrode; and

the insulating layer has a thickness in a range of approximately 100 nm to approximately 250 nm.

4. The array substrate of claim 1 , further comprising a first inter-layer dielectric layer on a side of the capacitor electrode distal to the base substrate; and

a buffer layer on a side of the first inter-layer dielectric layer distal to the base substrate.

5. The array substrate of claim 1 , wherein the sub-layer of the buffer layer comprising SiO x and in direct contact with the second active layer has a thickness greater than approximately 200 nm.

6. An array substrate, comprising:

a base substrate;

a first thin film transistor on the base substrate and comprising a first active layer, a first gate electrode, a first source electrode and a first drain electrode, the first active layer being a silicon active layer;

a second thin film transistor on the base substrate and comprising a second active layer, a second gate electrode, a second source electrode and a second drain electrode, the second active layer being a metal oxide active layer;

a first gate insulating layer between the first active layer and the first gate electrode:

a second gate insulating layer between the second active layer and the second gate electrode, the second gate insulating layer being different from the first gate insulating layer;

an insulating layer on a side of the first gate electrode distal to the base substrate;

a first inter-layer dielectric layer on a side of the insulating layer distal to the base substrate;

a buffer layer on a side of the first inter-layer dielectric layer distal to the base substrate; and

a first via and a second via respectively extending through the second gate insulating layer, the buffer layer, the first inter-layer dielectric layer, and the insulating layer;

wherein the first source electrode, the first drain electrode, and the second gate electrode are in a same layer;

the first source electrode and the first drain electrode are on a side of the second gate insulating layer distal to the base substrate;

the first source electrode is electrically connected to the first active layer through the first via; and

the first drain electrode is electrically connected to the first active layer through the second via.

7. An array substrate, comprising:

a base substrate;

a first thin film transistor on the base substrate and comprising a first active layer, a first gate electrode, a first source electrode and a first drain electrode, the first active layer being a silicon active layer;

a second thin film transistor on the base substrate and comprising a second active layer, a second gate electrode, a second source electrode and a second drain electrode, the second active layer being a metal oxide active layer;

a first gate insulating layer between the first active layer and the first gate electrode:

a second gate insulating layer between the second active layer and the second gate electrode, the second gate insulating layer being different from the first gate insulating layer; and

a second inter-layer dielectric layer on a side of the second gate electrode, the second active layer, the first source electrode, and the first drain electrode distal to the base substrate;

wherein the first source electrode, the first drain electrode, and the second gate electrode are in a same layer;

the first source electrode and the first drain electrode are on a side of the second gate insulating layer distal to the base substrate;

the second inter-layer dielectric layer is in direct contact with a source electrode contact part and a drain electrode contact part of the second active layer; and

at least a sub-layer of the second inter-layer dielectric layer that is in direct contact with the source electrode contact part and the drain electrode contact part of the second active layer comprises SiO x , 0<x<2.

8. The array substrate of claim 7 , wherein the sub-layer of the second inter-layer dielectric layer comprising SiO x and in direct contact with the source electrode contact part and the drain electrode contact part of the second active layer has a thickness greater than approximately 200 nm.

9. The array substrate of claim 7 , further comprising a passivation layer on a side of the second inter-layer dielectric layer distal to the base substrate; and

a third via and a fourth via respectively extending through the passivation layer and the second inter-layer dielectric layer;

wherein the second source electrode is electrically connected to the second active layer through the third via; and

the second drain electrode is electrically connected to the second active layer through the fourth via.

10. The array substrate of claim 9 , further comprising:

a relay electrode electrically connected to the first drain electrode; and

a fifth via extending through the passivation layer and the second inter-layer dielectric layer;

wherein the relay electrode, the second source electrode, and the second drain electrode are in a same layer, and on a side of the passivation layer distal to the base substrate; and

the relay electrode is electrically connected to the first drain electrode through the fifth via.

11. The array substrate of claim 10 , wherein the array substrate has a display area and a peripheral area; and

the first thin film transistor and the second thin film transistor are in the display area;

wherein the array substrate in the peripheral area further comprises:

a signal line layer;

a sixth via extending through at least one layer of the array substrate; and

an organic filler layer filling the sixth via for enhancing flexibility in the peripheral area;

wherein the signal line layer is in a same layer as the relay electrode, the second source electrode, and the second drain electrode; and

the signal line layer is on a side of the organic filler layer distal to the base substrate.

12. The array substrate of claim 1 , further comprising a light shielding layer configured to shield light from irradiating on the second active layer;

wherein the light shielding layer is in a same layer as one of the capacitor electrode and the first gate electrode.

13. The array substrate of claim 12 , wherein the light shielding layer and the second gate electrode constitute a double-gate structure of the second thin film transistor.

14. The array substrate of claim 2 , wherein the second gate insulating layer comprises SiO x , 0<x<2.

15. A display apparatus, comprising the array substrate of claim 1 .

16. A display apparatus, comprising the array substrate of claim 6 .

17. A display apparatus, comprising the array substrate of claim 7 .

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2023
From: BOE TECHNOLOGY GROUP CO., LTD.
To: BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
Reel/Frame 064397/0480 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2019
From: LU, XINHONG
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 048618/0110 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2019
From: NING, CE
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 048618/0125 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2019
From: HU, HEHE
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 048618/0128 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2019
From: WANG, KE
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 048618/0756 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2019
From: YANG, WEI
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 048618/0764 →
Priority Claims (1)
CN 201810194059.7 · Mar 9, 2018 · national
Continuity (1)
Related Publication 20210359063A1 · Nov 18, 2021
Cited By (1)
US 12,652,857