Non volatile memory controller device and method for adjustment
View Patent ↗There is provided a method of providing adjusted LLR values of a plurality of bits in a codeword to an LDPC decoder, the plurality of bits representing a plurality of charge states of a plurality of memory cells of a non-volatile memory. The method comprises storing in a non-volatile memory controller associated with the non-volatile memory LLR values of the plurality of bits. The controller then determines a plurality of levels of the charge states represented by the plurality of bits. The controller then generates, by a distribution processor, distributions of a population of the plurality of bits in the codeword at each of the plurality of levels at a first and a second time after the first time. The controller then generates the adjusted LLR values based on a comparison between the first and second distributions, and then decodes the codeword according to the adjusted LLR values.
1. A method of providing one or more adjusted log likelihood ratio (LLR) values of a plurality of bits in a codeword to a low-density parity check (LDPC) decoder, the plurality of bits representing a plurality of charge states of a plurality of memory cells of a non-volatile memory, the method comprising:
storing in a non-volatile memory controller communicatively coupled to the non-volatile memory one or more LLR values associated with the plurality of bits;
determining, by translation circuitry, a plurality of levels of the plurality of charge states represented by the plurality of bits;
generating, by a distribution processor,
a first distribution of a population of the plurality of levels at a first time, and
a second distribution of the population of the plurality of levels at a second time after the first time;
generating, by an LLR generator, the one or more adjusted LLR values of the plurality of bits based on a comparison between the first and second distributions; and
decoding, by the LDPC decoder, the codeword according to the one or more adjusted LLR values.
2. The method of claim 1 , wherein the comparison comprises:
determining a minimum population in each of the first and second distributions, and the associated level at each minimum population;
determining a difference between the associated levels for the first and second distributions; and
determining a corrected LLR value for each bit in the codeword that minimizes the difference.
3. The method of claim 1 , wherein the one or more LLR values are stored in a first look up table (LUT), and wherein the one or more adjusted LLR values are stored in a second LUT.
4. The method of claim 1 , wherein the first and second distributions comprise cumulative population distributions.
5. The method of claim 1 , wherein the level is a threshold voltage level associated with a charge state of a cell of the non-volatile memory.
6. The method of claim 2 , wherein the difference between the associated levels for the first and second distributions corresponds to a change in read threshold voltage of the cells of the non-volatile memory.
7. The method of claim 1 , wherein determining the cell charge state of a cell comprises performing multiple reads on each cell at varying threshold voltages.
8. The method of claim 1 , wherein the plurality of cell charge states and their associated numerical levels are stored in the non-volatile memory controller.
9. The method of claim 1 , wherein the level of a cell varies according to the cell charge state of plurality of cells.
10. The method of claim 1 , wherein the level of a cell varies according to a length of time since the cell was programmed with charge.
11. The method of claim 1 , wherein the level of a cell varies according to a total number of read cycles or program and erase cycles the target cell has been subjected to.
12. The method of claim 3 , wherein the LLR values stored in the first and second LUTs are predetermined.
13. The method of claim 1 , wherein the non-volatile memory comprises any one of: single level cells (SLCs), multi-level cells (MLCs), triple level cells (TLCs) and quadruple level cells (QLCs).
14. The method of claim 1 , wherein the plurality of cells of the non-volatile memory is capable of being in any one of two, four, eight or sixteen cell charge states.
15. A non-volatile memory controller for adjusting one or more log likelihood ratio (LLR) values of a plurality of bits in a codeword for low-density parity check (LDPC) decoding, the plurality of bits representing a plurality of charge states of a plurality of memory cells of a non-volatile memory, the controller comprising:
storing circuitry configured to store one or more LLR values of the at least one bit;
translation circuitry configured to determine a plurality of levels of the plurality of charge states represented by the plurality of bits;
a distribution processor configured to:
generate a first distribution of a population of the plurality of levels at a first time; and
generate a second distribution of the population of the plurality levels at a second time after the first time;
an LLR generator configured to generate the one or more adjusted LLR values of the plurality of bits based on a comparison between the first and second distributions; and
an LDPC decoder configured to decode the codeword using the one or more adjusted LLR values.
16. The controller of claim 15 , wherein the distribution processor is also configured to:
determine a minimum population in each of the first and second distributions, and the associated level at each minimum population; and
determine a difference between the associated levels for the first and second distributions, and
wherein the LLR generator is configured to determine a corrected LLR value for each bit in the codeword that minimizes the difference.
17. The controller of claim 15 , wherein the LLR generator is configured to store the one or more LLR values in a first look up table (LUT), and wherein the LLR generator is also configured to store the one or more adjusted LLR values in a second LUT.
18. The controller of claim 15 , wherein the first and second distributions comprise cumulative population distributions.
19. The controller of claim 15 , wherein the level is a threshold voltage level associated with a charge state of a cell of the non-volatile memory.
20. The controller of claim 16 , wherein the difference between the associated levels for the first and second distributions corresponds to a change in threshold voltage of the cells of the non-volatile memory.
21. The controller of claim 15 , wherein determining the cell charge state of a cell comprises performing multiple reads on each cell at varying threshold voltages.
22. The controller of claim 15 , wherein the plurality of cell charge states and their associated numerical levels are stored in the non-volatile memory controller.
23. The controller of claim 15 , wherein the level of a cell varies according to the cell charge state of plurality of cells.
24. The controller of claim 15 , wherein the level of a cell varies according to a length of time since the cell was programmed with charge.
25. The controller of claim 15 , wherein the level of a cell varies according to a total number of program and erase cycles the target cell has been subjected to.
26. The controller of claim 17 , wherein the LLR values stored in the first and second LUTs are predetermined.
27. The controller of claim 15 , wherein the non-volatile memory comprises any one of: single level cells (SLCs), multi-level cells (MLCs), triple level cells (TLCs) and quadruple level cells (QLCs).
28. The controller of claim 15 , wherein the plurality of cells of the non-volatile memory is capable of being in any one of two, four, eight or sixteen cell charge states.