Microlithographic fabrication of structures

1. A method of fabricating a variable depth pattern, the method comprising:

dispensing, on a surface of a substrate, an imprint fluid according to a predetermined pattern;

contacting the imprint fluid with a surface of an imprint lithography template such that the imprint fluid fills features in the surface of the imprint lithography template; and

solidifying the imprint fluid into a patterned layer, thereby forming, in the patterned layer:

structures that correspond to the features of the imprint lithography template, and

a residual layer having a residual layer thickness (RLT) that extends from the surface of the substrate to a base of a structure, wherein a first RLT of a first portion of the patterned layer is different from a second RLT of a second portion of the patterned layer,

wherein differences between the first RLT and the second RLT compensate for inefficiencies in a diffraction pattern produced from a uniform RLT diffracting pattern.

2. The method of claim 1 , wherein an RLT in a region between the first portion and the second portion varies gradually from the first RLT to the second RLT.

3. The method of claim 1 , wherein a change in RLT from the first RLT to the second RLT is a step change in a region between the first portion and the second portion.

4. The method of claim 1 , wherein dispensing the imprint fluid comprises dispensing the imprint fluid in a pattern of drops, wherein a volume of drops dispensed across the surface of the substrate varies according to the predetermined pattern.

5. The method of claim 4 , wherein the pattern of drops corresponds to a fixed drop density in a predetermined region.

6. The method of claim 4 , wherein the pattern of drops corresponds to a varying drop density in a predefined region.

7. The method of claim 1 , wherein dispensing the imprint fluid comprises dispensing the imprint fluid with a jetting dispense system.

8. The method of claim 1 , further comprising etching the patterned layer and the substrate, wherein a depth of features etched into the substrate varies according to variation in the RLT.

9. The method of claim 1 , wherein the features in the imprint lithography template have a uniform feature depth.

10. The method of claim 9 , wherein the imprint lithography template is a master template and, after etching, the substrate is a sub-master lithography template, and,

wherein the method further comprises:

dispensing, on a surface of a second substrate, a second imprint fluid a volume of which is substantially uniform across the surface of the substrate; and

contacting the second imprint fluid with a surface of the sub-master template such that the imprint fluid fills features in the surface of the imprint lithography template, thereby forming, in the second imprint fluid, structures and a residual layer having a RLT that varies in accordance with variations in a dimension of features etched into the sub-master template.

11. The method of claim 1 , wherein the features in the imprint lithography template have a varying feature depth.

12. The method of claim 1 , wherein the predetermined pattern is generated from an imprint lithography diffraction pattern having a uniform RLT.

13. The method of claim 1 , wherein the structures are nano-structures, micro-structures, or a combination thereof.

14. The method of claim 1 , wherein a difference between the first RLT and the second RLT is between 5 nm and 500 nm.

15. A method of patterning an imprint fluid, the method comprising:

dispensing, on a surface of a substrate, the imprint fluid a volume of which varies across the surface of the substrate according to a predetermined pattern;

contacting the imprint fluid with a surface of an imprint lithography template such that the imprint fluid fills features in the surface of the imprint lithography template, thereby forming, in the imprint fluid, structures and a residual layer having a residual layer thickness (RLT) that extends from the surface of the substrate to a base of a structure, wherein the RLT varies across the surface of the substrate according to the volume per unit area of the imprint fluid, and the RLT variations are produced from corresponding imprint fluid dispense patterns that compensate for non-uniformities in color distribution, brightness distribution, or both of uniform RLT diffraction patterns.

16. The method of claim 15 , wherein dispensing the imprint fluid comprises dispensing the imprint fluid in a predefined pattern that corresponds to a volume needed to fill the features in the imprint lithography template.

17. An optical device comprising:

a substrate; and

a polymer imprint resist on a surface of the substrate, the polymer imprint resist comprising:

a plurality of structures forming a diffraction pattern; and

a residual layer having a residual layer thickness (RLT) that extends from the surface of the substrate to a base of a structure, wherein the RLT varies across the surface of the substrate according to a predefined pattern, and the RLT variations are produced from corresponding imprint fluid dispense patterns that compensate for non-uniformities in color distribution, brightness distribution, or both of uniform RLT diffraction patterns.

18. The device of claim 17 , wherein variations in the RLT are generated from an imprint lithography diffraction pattern having a uniform RLT.

19. The method of claim 1 , wherein the differences between the first RLT and the second RLT are produced from corresponding imprint fluid dispense patterns that compensate for non-uniformities in color distribution, brightness distribution, or both of uniform RLT diffraction patterns.

20. The method of claim 1 , wherein the predetermined pattern is generated from an imprint lithography diffraction pattern having a uniform RLT.