Method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer
View Patent ↗The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 10 6 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.
1. A method to operate a secondary-electron multiplier having dynodes in an ion detector of a mass spectrometer in order to prolong the service life, comprising: —supplying the secondary-electron multiplier with an operating voltage in such a way that an amplification of less than 10 5 secondary electrons per impinging ion results, and—amplifying an output current of the secondary-electron multiplier using an electronic pre-amplifier mounted in a vacuum system of the mass spectrometer in which the secondary-electron multiplier is located, or on a housing of said vacuum system, wherein a pre-amplifier amplification is chosen such that a resultant noise level allows current pulses generated by individual ions impinging on the ion detector to be detected above the noise at an input of a digitizing unit.
2. The method according to claim 1 , wherein the amplification of the secondary-electron multiplier is set to a maximum of 2×10 4 secondary electrons per impinging ion.
3. The method according to claim 1 , wherein the preamplifier is flange-mounted on the housing of the vacuum system.
4. The method according to claim 1 , wherein operation of the preamplifier is improved by cooling the preamplifier.
5. The method according to claim 1 , wherein improved amplification is achieved by mounting the preamplifier less than 40 centimeters from the secondary-electron multiplier.
6. The method according to claim 1 , wherein an adjustment of the amplification is implemented via the acquisition of a mass spectrum with individual ion signals at specific times of the operation of the secondary-electron multiplier.
7. The method according to claim 6 , wherein the desired amplification of the secondary-electron multiplier is set via a characteristic curve which reflects the logarithm of the amplification as a function of the operating voltage.
8. The method according to claim 7 , wherein two different operating voltages are used to determine the gradient of the characteristic curve and to adjust the amplification.
9. A time-of-flight mass spectrometer whose control unit is programmed to execute a method according to claim 1 .
10. A method to operate a secondary-electron multiplier having dynodes in an ion detector of a mass spectrometer in order to prolong the service life, during an imaging mass spectrometric analysis of a thin tissue section or a mass spectrometric high-throughput analysis/massive-parallel analysis, comprising: —supplying the secondary-electron multiplier with an operating voltage in such a way that an amplification of less than 10 5 secondary electrons per impinging ion results, and—amplifying an output current of the secondary-electron multiplier using an electronic pre-amplifier mounted in a vacuum system of the mass spectrometer in which the secondary-electron multiplier is located, or on a housing of said vacuum system, wherein a pre-amplifier amplification is chosen such that a resultant noise level allows current pulses generated by individual ions impinging on the ion detector to be detected above the noise at an input of a digitizing unit.