Current sensor integrated circuit with common mode voltage rejection
A current sensor integrated circuit to sense a current through a resistor includes a substrate, a tub disposed in the substrate, an analog front end disposed in the tub and comprising an amplifier having inputs coupled across the resistor and a charging circuit configured to bias the analog front end and the tub to a bias voltage that is a predetermined offset voltage greater than a common mode voltage associated with the resistor. In embodiments, the analog front end is biased to a first bias voltage and the tub is biased to a second, different bias voltage.
1. A current sensor integrated circuit to sense a current through a resistor, comprising:
a substrate;
a tub disposed in the substrate;
an analog front end disposed in the tub and comprising an amplifier having inputs coupled across the resistor; and
a charging circuit configured to bias the analog front end and the tub to a bias voltage that is a predetermined offset voltage greater than a common mode voltage associated with the resistor.
2. The current sensor integrated circuit of claim 1 , wherein the common mode voltage associated with the resistor is coupled to the analog front end and to the tub as a reference potential.
3. The current sensor integrated circuit of claim 1 , wherein the analog front end further comprises a regulator configured to power the amplifier and coupled to receive the bias voltage as a regulator supply input voltage.
4. The current sensor integrated circuit of claim 3 , further comprising a boot capacitor having a first terminal coupled to the charging circuit and to the regulator to provide the regulator positive supply voltage input and a second terminal coupled to the regulator to provide a negative supply voltage input to the regulator.
5. The current sensor integrated circuit of claim 4 , wherein the charging circuit comprises a plurality of switches configured to selectively couple a fly capacitor to a charge pump voltage during a first clock phase and to decouple the fly capacitor from the charge pump voltage and couple the fly capacitor to the boot capacitor during a second clock phase.
6. The current sensor integrated circuit of claim 1 , wherein the predetermined offset voltage is selected to prevent forward biasing of a junction between the tub and the substrate.
7. The current sensor integrated circuit of claim 1 , wherein the charging circuit comprises:
a first charging circuit portion configured to bias the analog front end to a first bias voltage that is a first predetermined offset voltage greater than the common mode voltage associated with the resistor; and
a second charging circuit portion configured to bias the tub to a second bias voltage that is a second predetermined offset voltage greater than the common mode voltage associated with the resistor, wherein the second predetermined offset voltage is different than the first predetermined offset voltage.
8. The current sensor integrated circuit of claim 7 , wherein the second predetermined offset voltage is selected to prevent forward biasing of a junction between the tub and the substrate.
9. The current sensor integrated circuit of claim 7 , further comprising a tub boot capacitor having a first terminal coupled to the second charging circuit portion and to the tub and a second terminal coupled to a p-well region disposed in the tub.
10. The current sensor integrated circuit of claim 9 , wherein the second charging circuit portion comprises a plurality of switches configured to selectively couple a fly capacitor to a charge pump voltage during a first clock phase and to decouple the fly capacitor from the charge pump voltage and couple the fly capacitor to the tub boot capacitor during a second clock phase.
11. The current sensor integrated circuit of claim 1 , wherein the substrate is a semiconductor substrate comprised of a p-type material and the tub is an epitaxial tub comprised of an n-type material.
12. The current sensor integrated circuit of claim 1 , wherein the analog front end further comprises an analog-to-digital converter coupled to an output of the amplifier to generate a digital signal having a value indicative of the current through the resistor.
13. The current sensor integrated circuit of claim 12 , further comprising an output isolator coupled between the analog-to-digital converter and a digital processor, wherein the digital processor is configured to generate a sensor output signal indicative of the current through the resistor.
14. The current sensor integrated circuit of claim 13 , further comprising an input isolator coupled between the digital processor and the analog front end and configured to transmit a clock signal from the digital processor to the analog front end for synchronization and use by the analog-to-digital converter.
15. A method of sensing a current through a resistor with a current sensor integrated circuit, comprising:
providing a substrate;
forming an analog front end of the current sensor in a tub disposed in the substrate, wherein the analog front end comprises an amplifier;
amplifying, with the amplifier, a differential voltage across the resistor; and
biasing the analog front end and the tub to a bias voltage that is a predetermined offset voltage greater than a common mode voltage associated with the resistor.
16. The method of claim 15 , wherein forming the analog front end comprises providing a regulator coupled to receive the bias voltage as a supply input voltage.
17. The method of claim 15 , wherein biasing the analog front end comprises charging a fly capacitor to a charge pump voltage during a first clock phase and decoupling the fly capacitor from the charge pump voltage and coupling the fly capacitor to a boot capacitor coupled to the analog front end and the tub during a second clock phase.
18. The method of claim 15 , wherein biasing the analog front end and the tub comprises:
biasing the analog front end to a first bias voltage that is a first predetermined offset voltage greater than the common mode voltage associated with the resistor; and
biasing the tub to a second bias voltage that is a second predetermined offset voltage greater than the common mode voltage associated with the resistor, wherein the second predetermined offset voltage is different than the first predetermined offset voltage.
19. The method of claim 18 , wherein the second predetermined offset voltage is selected to prevent forward biasing of a junction between the tub and the substrate.
20. The method of claim 18 , wherein biasing the tub comprises charging a fly capacitor to a charge pump voltage during a first clock phase and decoupling the fly capacitor from the charge pump voltage and coupling the fly capacitor to a tub boot capacitor coupled to the tub during a second clock phase.
21. A current sensor integrated circuit to sense a current through a resistor, comprising:
a substrate;
a tub disposed in the substrate;
an analog front end disposed in the tub and comprising an amplifier having inputs coupled across the resistor; and
means for biasing the analog front end and the tub to a bias voltage that is a predetermined offset voltage greater than a common mode voltage associated with the resistor.
22. The current sensor integrated circuit of claim 21 , wherein the biasing means comprises:
first biasing means for biasing the analog front end to a first bias voltage that is a first predetermined offset voltage greater than the common mode voltage associated with the resistor; and
second biasing means for biasing the tub to a second bias voltage that is a second predetermined offset voltage greater than the common mode voltage associated with the resistor, wherein the second predetermined offset voltage is different than the first predetermined offset voltage.