Systems and methods for smart thermocouple temperature probe
A system includes a measurement instrument including a first connector and a control module electrically connected to the first connector. A temperature probe including a shaft having a first end and a second end, a second connector being coupled to the first end, a thermocouple junction formed at a tip and configured to measure a change in temperature of a sample, and the second connector being received by the first connector when the temperature probe is attached to the measurement instrument. A storage module housed within the second connector and configured to store one or more parameters of the temperature probe. The control module being configured to: receive the one or more parameters; determine a temperature measurement based on a change in voltage; determine a first correction based on the one or more parameters; and determine an adjusted temperature measurement based on the temperature measurement and the first correction.
1. A system, comprising:
a measurement instrument including a first connector and a control module electrically connected to the first connector;
a temperature probe including a shaft, a tip, and a second connector, the shaft having a first end and a second end, the second connector being coupled to the first end, the tip being coupled to the second end and configured to measure a change in voltage generated by a junction of wires within the tip by inserting the temperature probe into a sample, and the second connector being received by the first connector when the temperature probe is attached to the measurement instrument; and
a storage module housed within the second connector and configured to store one or more parameters of the temperature probe, the one or more parameters including a response time of the temperature probe and an offset value associated with the temperature probe, the offset value being determined based on a difference between an observed temperature measurement generated using the temperature probe and an expected temperature measurement;
the control module being configured to:
receive the one or more parameters, including the response time of the temperature probe and the offset value associated with the temperature probe, from the storage module housed within the second connector;
prompt a user to select a sample type of the sample;
determine a thermal conductivity of the sample based on the selected sample type;
determine a stable time of the sample based on the response time of the temperature probe and the thermal conductivity of the sample;
determine a temperature measurement of the sample based on the change in voltage in response to a time period greater than or equal to the stable time having elapsed after insertion of the temperature probe into the sample; and
determine an adjusted temperature measurement based on the temperature measurement and the offset value.
2. The system of claim 1 , wherein:
the first connector includes a pair of terminals electrically connected to the control module;
the second connector includes a pair of pin connectors electrically connected to the storage module; and
the pair of terminals and the pair of pin connectors are configured to transmit the one or more parameters from the storage module to the control module.
3. The system of claim 1 , further comprising a display housed on the measurement instrument and configured to display the adjusted temperature measurement.
4. The system of claim 1 , wherein the one or more parameters additionally include at least one of an adjusted offset value of the temperature probe, and a unique identifier of the temperature probe.
5. The system of claim 4 , wherein the one or more parameters include the unique identifier of the temperature probe and the control module is further configured to store a record that associates the unique identifier of the temperature probe with the adjusted temperature measurement.
6. A method of determining a temperature, comprising:
storing one or more parameters of a temperature probe with a storage module housed within a connector of the temperature probe, the one or more parameters including a response time of the temperature probe and an offset value associated with the temperature probe, the offset value being determined based on a difference between an observed temperature measurement generated using the temperature probe and an expected temperature measurement;
receiving the one or more parameters, including the response time of the temperature probe and the offset value associated with the temperature probe, from the storage module housed within the connector with a measurement instrument connected to the connector of the temperature probe;
prompting a user to select a sample type of a sample;
determining a thermal conductivity of the sample based on the selected sample type;
determining a stable time of the sample based on the response time of the temperature probe and the thermal conductivity of the sample;
determining a temperature measurement of the sample based on a change in voltage of the temperature probe in response to a time period greater than or equal to the stable time having elapsed after inserting the temperature probe into the sample;
determining an adjusted temperature measurement based on the temperature measurement and the offset value; and
displaying the adjusted temperature measurement on a display.
7. The method of claim 6 , wherein the one or more parameters additionally include at least one of an adjusted offset value of the temperature probe, and a unique identifier of the temperature probe.